KR101010781B1 - 비접촉 환경 계측 장치, 방법 및 컴퓨터 프로그램이 기록된기록매체 - Google Patents
비접촉 환경 계측 장치, 방법 및 컴퓨터 프로그램이 기록된기록매체 Download PDFInfo
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
- G01B11/245—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures using a plurality of fixed, simultaneously operating transducers
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
- G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
- G01B11/2518—Projection by scanning of the object
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
- G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
- G01B11/2531—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object using several gratings, projected with variable angle of incidence on the object, and one detection device
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
- G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
- G01B11/2545—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object with one projection direction and several detection directions, e.g. stereo
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- Length Measuring Devices By Optical Means (AREA)
Abstract
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Claims (9)
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- 레이저 슬릿광을 발생시켜 피 측정부재에 수직방향으로 조사하는 레이저 발생기, 상기 레이저 발생기에 의해 상기 레이저 슬릿광이 수직방향으로 조사된 상기 피 측정부재의 영상을 스테레오 비전(stereo vision) 방식으로 획득하는 복수의 카메라를 포함하는 제 1 센서 시스템과,상기 레이저 발생기와 동일한 레이저 발생기 및 상기 카메라와 동일한 복수의 카메라를 포함하는 제 2 센서 시스템과,상기 제 1 센서 시스템 및 제 2 센서 시스템을 지지하면서 회전시켜서 상기 제 1 센서 시스템 및 상기 제 2 센서 시스템에 의한 전방향 스캔이 가능하게 하는 로테이션 스테이지를 포함하며,상기 제 1 센서 시스템과 상기 제 2 센서 시스템은 상기 로테이션 스테이지의 회전축을 중심으로 하여 상호 대향 방향으로 배치된비접촉 환경 계측 장치.
- 제 3 항에 있어서,상기 제 1 센서 시스템과 상기 제 2 센서 시스템은 상기 로테이션 스테이지의 회전축 방향이 더 높고 반대 방향이 더 낮도록 기울게 설치된비접촉 환경 계측 장치.
- 센서 시스템에 의해 발생한 레이저 슬릿광을 피 측정부재에 수직방향으로 조사하여 상기 센서 시스템을 통해 상기 피 측정부재의 영상을 스테레오 비전(stereo vision) 방식으로 획득하는 단계와,상기 센서 시스템을 지지하면서 회전시키는 로테이션 스테이지를 회전 제어하여 상기 획득하는 단계의 반복을 통해 전방향 스캔을 수행하는 단계와,상기 전방향 스캔을 통해 획득한 캡처 이미지를 영상 처리하여 얻은 2차원 점 데이터들을 상기 로테이션 스테이지의 회전각 수치를 이용하여 3차원 점 데이터로 변환하는 단계와,상기 3차원 점 데이터를 이용하여 지역지도를 작성한 후에 상기 지역지도와 CAD 정보를 매칭하여 매칭되지 않는 지역지도 데이터를 장애물 데이터로 인식하는 단계와,상기 장애물 데이터에 의한 장애물 객체를 규격의 이미지로 만들어서 물체를 인식하는 단계를 포함하는 비접촉 환경 계측 방법.
- 제 5 항에 있어서,상기 로테이션 스테이지는, 회전축을 중심으로 하여 상호 대향 방향으로 배치된 복수의 상기 센서 시스템을 지지하면서 회전시키며,상기 전방향 스캔을 수행하는 단계는, 상기 복수의 센서 시스템을 통해 상기 캡처 이미지를 획득하는비접촉 환경 계측 방법.
- 제 5 항에 있어서,상기 3차원 점 데이터로 변환하는 단계는,상기 캡처 이미지에 포함된 노이즈를 필터링한 후에 상기 캡처 이미지에 포함된 물체 이미지의 모서리 부분을 얇게 하여 최적화하는 이미지 교정을 수행하는 단계와,상기 이미지 교정을 수행한 캡처 이미지에서 얻은 2차원 점 데이터들의 깊이를 계산하는 단계와,계산한 상기 깊이와 상기 로테이션 스테이지의 해당하는 상기 회전각 수치를 이용하여 상기 3차원 점 데이터로 변환하는 단계를 포함하는 비접촉 환경 계측 방법.
- 제 5 항에 있어서,상기 물체를 인식하는 단계는, 상기 규격의 이미지를 주성분 분석법(Principal Component Analysis, PCA)을 사용하여 PCA 상수를 구한 후에 학습된 뉴랄 네트워크(neural network) 모델에 상수를 넣어 최종적으로 어떤 물체인지 인식하는비접촉 환경 계측 방법.
- 제 5 항 내지 제 8 항 중에서 어느 한 항의 비접촉 환경 계측 방법을 수행하는 컴퓨터 프로그램이 기록된 기록매체.
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KR102470072B1 (ko) | 2021-11-02 | 2022-11-23 | (주)미래구조엔지니어링 | 프리캐스트 콘크리트의 품질 관리 시스템 및 방법 |
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KR101126626B1 (ko) * | 2010-03-02 | 2012-03-26 | 한국과학기술원 | 광역 3차원 복원을 위한 시스템 및 방법 |
AU2013242821A1 (en) * | 2012-10-29 | 2014-05-15 | J. Ray Mcdermott, S.A. | Adaptive control of arc welding parameters |
Citations (4)
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JP2001145123A (ja) * | 1999-11-10 | 2001-05-25 | Shimane Pref Gov | 三次元表示装置用の画像撮影装置 |
JP2001197521A (ja) * | 2000-01-06 | 2001-07-19 | Toppan Printing Co Ltd | 撮像装置、撮像方法及び撮像条件に係るデータを記録した記録媒体 |
JP2003042730A (ja) * | 2001-07-30 | 2003-02-13 | Topcon Corp | 表面形状測定装置、及びその方法、並びに表面状態図化装置 |
KR100516395B1 (ko) * | 2003-01-09 | 2005-09-23 | 삼성중공업 주식회사 | 자율주행 용접로봇을 위한 센서 시스템 및 환경 모델링 방법 |
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JP2001145123A (ja) * | 1999-11-10 | 2001-05-25 | Shimane Pref Gov | 三次元表示装置用の画像撮影装置 |
JP2001197521A (ja) * | 2000-01-06 | 2001-07-19 | Toppan Printing Co Ltd | 撮像装置、撮像方法及び撮像条件に係るデータを記録した記録媒体 |
JP2003042730A (ja) * | 2001-07-30 | 2003-02-13 | Topcon Corp | 表面形状測定装置、及びその方法、並びに表面状態図化装置 |
KR100516395B1 (ko) * | 2003-01-09 | 2005-09-23 | 삼성중공업 주식회사 | 자율주행 용접로봇을 위한 센서 시스템 및 환경 모델링 방법 |
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KR102470072B1 (ko) | 2021-11-02 | 2022-11-23 | (주)미래구조엔지니어링 | 프리캐스트 콘크리트의 품질 관리 시스템 및 방법 |
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