KR101001185B1 - 수발광 일체형 소자 - Google Patents
수발광 일체형 소자 Download PDFInfo
- Publication number
- KR101001185B1 KR101001185B1 KR20080094241A KR20080094241A KR101001185B1 KR 101001185 B1 KR101001185 B1 KR 101001185B1 KR 20080094241 A KR20080094241 A KR 20080094241A KR 20080094241 A KR20080094241 A KR 20080094241A KR 101001185 B1 KR101001185 B1 KR 101001185B1
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- KR
- South Korea
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- type semiconductor
- semiconductor layer
- light
- electrode layer
- layer
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- 239000004065 semiconductor Substances 0.000 claims abstract description 86
- 239000002184 metal Substances 0.000 claims abstract description 23
- 229910052751 metal Inorganic materials 0.000 claims abstract description 23
- 239000000758 substrate Substances 0.000 claims abstract description 22
- 230000003287 optical effect Effects 0.000 claims abstract description 15
- 238000000034 method Methods 0.000 claims description 15
- 238000000926 separation method Methods 0.000 claims description 10
- 229910045601 alloy Inorganic materials 0.000 claims description 6
- 239000000956 alloy Substances 0.000 claims description 6
- 229910052782 aluminium Inorganic materials 0.000 claims description 5
- 229910052709 silver Inorganic materials 0.000 claims description 5
- 229910052802 copper Inorganic materials 0.000 claims description 4
- 229910052737 gold Inorganic materials 0.000 claims description 4
- 229910052750 molybdenum Inorganic materials 0.000 claims description 4
- 229910052759 nickel Inorganic materials 0.000 claims description 4
- 229910052763 palladium Inorganic materials 0.000 claims description 4
- 229910052697 platinum Inorganic materials 0.000 claims description 4
- 229910052721 tungsten Inorganic materials 0.000 claims description 4
- 239000000463 material Substances 0.000 abstract description 6
- 238000002955 isolation Methods 0.000 abstract description 2
- 230000008569 process Effects 0.000 description 6
- 238000005516 engineering process Methods 0.000 description 4
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 3
- 238000004891 communication Methods 0.000 description 3
- 150000001875 compounds Chemical class 0.000 description 3
- 238000011161 development Methods 0.000 description 3
- 229910052710 silicon Inorganic materials 0.000 description 3
- 239000010703 silicon Substances 0.000 description 3
- 229910052719 titanium Inorganic materials 0.000 description 3
- 229910000980 Aluminium gallium arsenide Inorganic materials 0.000 description 2
- 229910001218 Gallium arsenide Inorganic materials 0.000 description 2
- 239000012620 biological material Substances 0.000 description 2
- 235000012489 doughnuts Nutrition 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 238000001499 laser induced fluorescence spectroscopy Methods 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 229910002704 AlGaN Inorganic materials 0.000 description 1
- 229910000530 Gallium indium arsenide Inorganic materials 0.000 description 1
- JMASRVWKEDWRBT-UHFFFAOYSA-N Gallium nitride Chemical compound [Ga]#N JMASRVWKEDWRBT-UHFFFAOYSA-N 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 238000005229 chemical vapour deposition Methods 0.000 description 1
- 239000008358 core component Substances 0.000 description 1
- 230000001066 destructive effect Effects 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 230000005684 electric field Effects 0.000 description 1
- 239000007772 electrode material Substances 0.000 description 1
- 230000007613 environmental effect Effects 0.000 description 1
- 239000005447 environmental material Substances 0.000 description 1
- 238000005530 etching Methods 0.000 description 1
- 239000010408 film Substances 0.000 description 1
- 230000010354 integration Effects 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 239000007769 metal material Substances 0.000 description 1
- 238000001451 molecular beam epitaxy Methods 0.000 description 1
- 238000012544 monitoring process Methods 0.000 description 1
- 230000006855 networking Effects 0.000 description 1
- 230000005693 optoelectronics Effects 0.000 description 1
- 230000000704 physical effect Effects 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 230000009467 reduction Effects 0.000 description 1
- 229910052594 sapphire Inorganic materials 0.000 description 1
- 239000010980 sapphire Substances 0.000 description 1
- 239000002210 silicon-based material Substances 0.000 description 1
- 238000004544 sputter deposition Methods 0.000 description 1
- 239000010409 thin film Substances 0.000 description 1
- 230000007704 transition Effects 0.000 description 1
- 238000001771 vacuum deposition Methods 0.000 description 1
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- Light Receiving Elements (AREA)
Abstract
Description
Claims (8)
- 삭제
- 기판;상기 기판 하부에 형성되는 제1전극층;상기 기판 상부에 형성되는 제1N형반도체층;상기 제1N형반도체층 상부에 형성되는 제1P형반도체층;상기 제1P형반도체층 상부에 형성되며 발광영역을 정의해주는 제2전극층;상기 발광영역과 제2전극층이 존재하지 않는 영역에 존재하며 제1P형반도체층 상부에 형성되고 요부와 철부를 갖는 제2N형반도체층;상기 제2N형반도체층의 철부에 형성되는 제2P형반도체층;상기 제2N형반도체층의 요부에 형성되는 제3전극층; 및상기 제2P형반도체층 상부에 제3전극층과 이격되어 존재하여 수광영역을 정의해주는 제4전극층을 포함하되,상기 제1P형반도체층과 제2N형반도체층 사이에 에치스탑층을 더 포함하는 수발광 일체형 소자.
- 제2항에 있어서,상기 제2P형반도체층 상부에 존재하며 제4전극층에 연결되는 금속 그리드를 더 포함하는 수발광 일체형 소자.
- 제2항에 있어서,상기 제2전극층과 제4전극층 사이의 영역을 덮어 수광영역과 발광영역을 광학적으로 분리해주는 광분리층을 더 포함하는 수발광 일체형 소자.
- 제2항에 있어서,상기 제1P형반도체층의 상부 또는 제1N형반도체층의 하부에 DBR층을 더 포함하는 수발광 일체형 소자.
- 제2항에 있어서,상기 제2P형반도체층의 상부에 DBR층을 더 포함하는 수발광 일체형 소자.
- 제2항 내지 제6항 중 어느 한 항에 있어서,상기 제1전극층, 제2전극층, 제3전극층, 제4전극층 또는 금속 그리드는 Au, Ag, Al, Pt, Cu, Ni, Mo, W, Pd 또는 이들의 합금을 포함하는 수발광 일체형 소자.
- 제4항에 있어서,상기 광분리층은 금속 또는 유전체로 이루어진 수발광 일체형 소자.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR20080094241A KR101001185B1 (ko) | 2008-09-25 | 2008-09-25 | 수발광 일체형 소자 |
Applications Claiming Priority (1)
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KR20080094241A KR101001185B1 (ko) | 2008-09-25 | 2008-09-25 | 수발광 일체형 소자 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR20100034980A KR20100034980A (ko) | 2010-04-02 |
KR101001185B1 true KR101001185B1 (ko) | 2010-12-15 |
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KR20080094241A Active KR101001185B1 (ko) | 2008-09-25 | 2008-09-25 | 수발광 일체형 소자 |
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Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
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WO2023107892A1 (en) * | 2021-12-08 | 2023-06-15 | Lumileds Llc | Vertically stacked monolithic optical transformer |
KR20240117597A (ko) * | 2021-12-08 | 2024-08-01 | 루미레즈 엘엘씨 | 모놀리식 광학 변압기 |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2000114658A (ja) | 1998-10-06 | 2000-04-21 | Agilent Technol Inc | 発光素子及び光検出器のモノリシック集積化構造及びその製造方法 |
US6483862B1 (en) | 1998-12-11 | 2002-11-19 | Agilent Technologies, Inc. | System and method for the monolithic integration of a light emitting device and a photodetector using a native oxide semiconductor layer |
KR100550417B1 (ko) * | 2004-08-18 | 2006-02-10 | 엘지전자 주식회사 | 양방향 광통신용 소자 및 그의 제조 방법 |
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2008
- 2008-09-25 KR KR20080094241A patent/KR101001185B1/ko active Active
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2000114658A (ja) | 1998-10-06 | 2000-04-21 | Agilent Technol Inc | 発光素子及び光検出器のモノリシック集積化構造及びその製造方法 |
US6483862B1 (en) | 1998-12-11 | 2002-11-19 | Agilent Technologies, Inc. | System and method for the monolithic integration of a light emitting device and a photodetector using a native oxide semiconductor layer |
KR100550417B1 (ko) * | 2004-08-18 | 2006-02-10 | 엘지전자 주식회사 | 양방향 광통신용 소자 및 그의 제조 방법 |
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