KR100998412B1 - 데이터 레인들로부터 순환 중복 코드 레인들을 오프셋하는것에 의한 대기 시간 개선 - Google Patents
데이터 레인들로부터 순환 중복 코드 레인들을 오프셋하는것에 의한 대기 시간 개선 Download PDFInfo
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- KR100998412B1 KR100998412B1 KR1020080045131A KR20080045131A KR100998412B1 KR 100998412 B1 KR100998412 B1 KR 100998412B1 KR 1020080045131 A KR1020080045131 A KR 1020080045131A KR 20080045131 A KR20080045131 A KR 20080045131A KR 100998412 B1 KR100998412 B1 KR 100998412B1
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
- G06F11/08—Error detection or correction by redundancy in data representation, e.g. by using checking codes
- G06F11/10—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's
- G06F11/1004—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's to protect a block of data words, e.g. CRC or checksum
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F13/00—Interconnection of, or transfer of information or other signals between, memories, input/output devices or central processing units
- G06F13/14—Handling requests for interconnection or transfer
- G06F13/16—Handling requests for interconnection or transfer for access to memory bus
- G06F13/1668—Details of memory controller
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
- G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
- G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
- G11C11/401—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
- G11C11/4063—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing
- G11C11/407—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing for memory cells of the field-effect type
- G11C11/409—Read-write [R-W] circuits
- G11C11/4093—Input/output [I/O] data interface arrangements, e.g. data buffers
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
- G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
- G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
- G11C11/401—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
- G11C11/4063—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing
- G11C11/407—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing for memory cells of the field-effect type
- G11C11/409—Read-write [R-W] circuits
- G11C11/4096—Input/output [I/O] data management or control circuits, e.g. reading or writing circuits, I/O drivers or bit-line switches
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/10—Input/output [I/O] data interface arrangements, e.g. I/O data control circuits, I/O data buffers
- G11C7/1006—Data managing, e.g. manipulating data before writing or reading out, data bus switches or control circuits therefor
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/10—Input/output [I/O] data interface arrangements, e.g. I/O data control circuits, I/O data buffers
- G11C7/1051—Data output circuits, e.g. read-out amplifiers, data output buffers, data output registers, data output level conversion circuits
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- Theoretical Computer Science (AREA)
- General Engineering & Computer Science (AREA)
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- Quality & Reliability (AREA)
- Computer Security & Cryptography (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Computer Hardware Design (AREA)
- Databases & Information Systems (AREA)
- Techniques For Improving Reliability Of Storages (AREA)
- Detection And Prevention Of Errors In Transmission (AREA)
- Detection And Correction Of Errors (AREA)
- Memory System (AREA)
Abstract
Description
Claims (23)
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- 메모리 장치; 및호스트를 포함하고,상기 메모리 장치는,판독 커맨드에 응답하여 판독 데이터 비트들을 제공하는 메모리 어레이,상기 메모리 어레이에 의해 제공되는 상기 판독 데이터 비트들에 대응하는 원격으로 생성되는 CRC(cyclic redundancy code) 비트들을 생성하는 CRC 생성기; 및상기 판독 데이터 비트들 및 상기 원격으로 생성되는 CRC 비트들을 상기 호스트에 전송하는 전송 프레이밍 유닛을 포함하고,상기 전송 프레이밍 유닛은 오프셋 값에 적어도 부분적으로 기초하여 상기 판독 데이터 비트들의 전송의 시작으로부터 상기 원격으로 생성된 CRC 비트들의 전송의 시작을 오프셋하는 로직을 포함하고,상기 호스트는,상기 메모리 장치로부터 상기 판독 데이터 비트들을 수신하는 인터페이스 회로;상기 인터페이스 회로와 연결되어 상기 판독 데이터 비트들에 적어도 부분적으로 기초하여 로컬 CRC 비트들을 생성하는 CRC 생성기;상기 판독 데이터 비트들을 포괄하는 상기 원격으로 생성된 CRC 비트들을 상기 메모리 장치로부터 수신하는 다른 인터페이스 회로; 및상기 로컬 CRC 비트들을 생성하는 CRC 생성기 및 상기 다른 인터페이스 회로와 연결되어 상기 로컬 CRC 비트들과 상기 원격으로 생성된 CRC 비트들을 비교하는 비교기를 포함하고,상기 로컬 CRC 비트들을 생성하는 CRC 생성기는 상기 원격으로 생성된 CRC 비트들을 수신하기 전에 상기 로컬 CRC 비트들을 생성하기 시작하는 시스템.
- 제17항에 있어서,상기 오프셋 값은 고정 오프셋 값인 시스템.
- 제17항에 있어서,상기 오프셋 값은 1/2 프레임 오프셋인 시스템.
- 제17항에 있어서,상기 오프셋 값은 프로그램가능 오프셋 값인 시스템.
- 삭제
- 제17항에 있어서,상기 호스트는,상기 로컬 CRC 비트들을 상기 원격으로 생성된 CRC 비트들과 비교하기 전에 상기 판독 데이터 비트들에 대해 추론적으로 동작하는 로직을 더 포함하는 시스템.
- 제22항에 있어서,상기 호스트는 메모리 컨트롤러를 포함하는 시스템.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US11/803,734 US7644344B2 (en) | 2007-05-15 | 2007-05-15 | Latency by offsetting cyclic redundancy code lanes from data lanes |
US11/803,734 | 2007-05-15 |
Publications (2)
Publication Number | Publication Date |
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KR20080101741A KR20080101741A (ko) | 2008-11-21 |
KR100998412B1 true KR100998412B1 (ko) | 2010-12-03 |
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KR1020080045131A KR100998412B1 (ko) | 2007-05-15 | 2008-05-15 | 데이터 레인들로부터 순환 중복 코드 레인들을 오프셋하는것에 의한 대기 시간 개선 |
Country Status (5)
Country | Link |
---|---|
US (1) | US7644344B2 (ko) |
KR (1) | KR100998412B1 (ko) |
CN (1) | CN101325090B (ko) |
GB (1) | GB2449348B (ko) |
TW (1) | TWI378467B (ko) |
Families Citing this family (11)
Publication number | Priority date | Publication date | Assignee | Title |
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US7996731B2 (en) | 2005-11-02 | 2011-08-09 | Advanced Micro Devices, Inc. | Error detection in high-speed asymmetric interfaces |
KR101688051B1 (ko) * | 2010-11-08 | 2016-12-20 | 삼성전자 주식회사 | 에러 검출 코드를 이용한 데이터 처리 장치, 데이터 처리 방법, 데이터 스큐 보상 방법 및 데이터 처리 장치를 포함하는 반도체 장치 |
US8738993B2 (en) * | 2010-12-06 | 2014-05-27 | Intel Corporation | Memory device on the fly CRC mode |
US8984488B2 (en) | 2011-01-14 | 2015-03-17 | Honeywell International Inc. | Type and range propagation through data-flow models |
CN104471645B (zh) * | 2012-03-26 | 2017-04-12 | 英特尔公司 | 采用检错编码的事务的存储器设备的定时优化装置和方法 |
US9299400B2 (en) | 2012-09-28 | 2016-03-29 | Intel Corporation | Distributed row hammer tracking |
MY180992A (en) | 2013-03-13 | 2020-12-15 | Intel Corp | Memory latency management |
WO2014158130A1 (en) * | 2013-03-25 | 2014-10-02 | Hewlett-Packard Development Company, L.P. | Memory device having error correction logic |
US10331513B2 (en) * | 2015-07-28 | 2019-06-25 | Microchip Technology Incorporated | Zero overhead code coverage analysis |
US20180357121A1 (en) * | 2017-06-09 | 2018-12-13 | Qualcomm Incorporated | Error correction calculation upon serial bus abort |
US11513893B2 (en) | 2020-12-21 | 2022-11-29 | Intel Corporation | Concurrent compute and ECC for in-memory matrix vector operations |
Citations (2)
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US20050108611A1 (en) * | 2003-11-14 | 2005-05-19 | Intel Corporation | Early CRC delivery for partial frame |
US20070055796A1 (en) * | 2004-02-19 | 2007-03-08 | Micron Technology, Inc. | Memory device having terminals for transferring multiple types of data |
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US5638518A (en) * | 1994-10-24 | 1997-06-10 | Lsi Logic Corporation | Node loop core for implementing transmission protocol in fibre channel |
US5844923A (en) * | 1996-10-24 | 1998-12-01 | At&T Corp | Fast framing of nude ATM by header error check |
KR100605978B1 (ko) * | 1999-05-29 | 2006-07-28 | 삼성전자주식회사 | 부호분할다중접속 이동통신시스템의 불연속 전송모드에서 연속적인 외부순환 전력제어를 위한 송수신 장치 및 방법 |
US6829315B1 (en) * | 2000-01-19 | 2004-12-07 | Mindspeed Technologies, Inc. | Alignment of parallel data channels using header detection signaling |
KR100393460B1 (ko) * | 2001-05-29 | 2003-08-02 | 전자부품연구원 | 전력선 통신을 위한 적응형 수신신호 검출장치 및 검출방법 |
CN100489797C (zh) * | 2001-10-11 | 2009-05-20 | 阿尔特拉公司 | 可编程逻辑设备上的错误检测 |
US8892963B2 (en) * | 2005-11-10 | 2014-11-18 | Advanced Micro Devices, Inc. | Error detection in high-speed asymmetric interfaces utilizing dedicated interface lines |
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2007
- 2007-05-15 US US11/803,734 patent/US7644344B2/en not_active Expired - Fee Related
-
2008
- 2008-05-08 TW TW097117029A patent/TWI378467B/zh not_active IP Right Cessation
- 2008-05-14 GB GB0808759.5A patent/GB2449348B/en not_active Expired - Fee Related
- 2008-05-15 KR KR1020080045131A patent/KR100998412B1/ko active IP Right Grant
- 2008-05-15 CN CN2008100999299A patent/CN101325090B/zh not_active Expired - Fee Related
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
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US20050108611A1 (en) * | 2003-11-14 | 2005-05-19 | Intel Corporation | Early CRC delivery for partial frame |
US20070055796A1 (en) * | 2004-02-19 | 2007-03-08 | Micron Technology, Inc. | Memory device having terminals for transferring multiple types of data |
Also Published As
Publication number | Publication date |
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GB2449348B (en) | 2012-05-23 |
KR20080101741A (ko) | 2008-11-21 |
TWI378467B (en) | 2012-12-01 |
CN101325090B (zh) | 2013-01-02 |
TW200910372A (en) | 2009-03-01 |
GB0808759D0 (en) | 2008-06-18 |
US7644344B2 (en) | 2010-01-05 |
GB2449348A (en) | 2008-11-19 |
CN101325090A (zh) | 2008-12-17 |
US20080288848A1 (en) | 2008-11-20 |
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