KR100992182B1 - 안과용 양안 파면 측정 시스템 - Google Patents

안과용 양안 파면 측정 시스템 Download PDF

Info

Publication number
KR100992182B1
KR100992182B1 KR1020067011767A KR20067011767A KR100992182B1 KR 100992182 B1 KR100992182 B1 KR 100992182B1 KR 1020067011767 A KR1020067011767 A KR 1020067011767A KR 20067011767 A KR20067011767 A KR 20067011767A KR 100992182 B1 KR100992182 B1 KR 100992182B1
Authority
KR
South Korea
Prior art keywords
eye
light
delete delete
wavefront
optical
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
KR1020067011767A
Other languages
English (en)
Korean (ko)
Other versions
KR20070004550A (ko
Inventor
로렌스 와덴
안드레아스 더블유. 드레허
게리 디. 밀스
슈이 티. 라이
윌리엄 지. 푸트
데이빗 지. 샌들러
Original Assignee
오프소닉스 인코포레이티드
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from US10/971,937 external-priority patent/US20050105044A1/en
Priority claimed from US10/971,769 external-priority patent/US7425067B2/en
Application filed by 오프소닉스 인코포레이티드 filed Critical 오프소닉스 인코포레이티드
Publication of KR20070004550A publication Critical patent/KR20070004550A/ko
Application granted granted Critical
Publication of KR100992182B1 publication Critical patent/KR100992182B1/ko
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Images

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02—Testing optical properties
    • G01M11/0228—Testing optical properties by measuring refractive power
    • G01M11/0235—Testing optical properties by measuring refractive power by measuring multiple properties of lenses, automatic lens meters
    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B3/00—Apparatus for testing the eyes; Instruments for examining the eyes
    • A61B3/10—Objective types, i.e. instruments for examining the eyes independent of the patients' perceptions or reactions
    • A61B3/1015—Objective types, i.e. instruments for examining the eyes independent of the patients' perceptions or reactions for wavefront analysis
    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B3/00—Apparatus for testing the eyes; Instruments for examining the eyes
    • A61B3/10—Objective types, i.e. instruments for examining the eyes independent of the patients' perceptions or reactions
    • A61B3/103—Objective types, i.e. instruments for examining the eyes independent of the patients' perceptions or reactions for determining refraction, e.g. refractometers or skiascopes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J9/00—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02—Testing optical properties
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02—Testing optical properties
    • G01M11/0242—Testing optical properties by measuring geometrical properties or aberrations
    • G01M11/0257—Testing optical properties by measuring geometrical properties or aberrations by analyzing the image formed by the object to be tested
    • G01M11/0264—Testing optical properties by measuring geometrical properties or aberrations by analyzing the image formed by the object to be tested by using targets or reference patterns

Landscapes

  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Engineering & Computer Science (AREA)
  • Public Health (AREA)
  • Chemical & Material Sciences (AREA)
  • Biophysics (AREA)
  • Ophthalmology & Optometry (AREA)
  • Veterinary Medicine (AREA)
  • Biomedical Technology (AREA)
  • Heart & Thoracic Surgery (AREA)
  • Medical Informatics (AREA)
  • Molecular Biology (AREA)
  • Surgery (AREA)
  • Animal Behavior & Ethology (AREA)
  • General Health & Medical Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Geometry (AREA)
  • Eye Examination Apparatus (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
KR1020067011767A 2003-11-14 2004-10-29 안과용 양안 파면 측정 시스템 Expired - Fee Related KR100992182B1 (ko)

Applications Claiming Priority (8)

Application Number Priority Date Filing Date Title
US52029403P 2003-11-14 2003-11-14
US60/520,294 2003-11-14
US58112704P 2004-06-18 2004-06-18
US60/581,127 2004-06-18
US10/971,769 2004-10-22
US10/971,937 US20050105044A1 (en) 2003-11-14 2004-10-22 Lensometers and wavefront sensors and methods of measuring aberration
US10/971,769 US7425067B2 (en) 2003-11-14 2004-10-22 Ophthalmic diagnostic instrument
US10/971,937 2004-10-22

Publications (2)

Publication Number Publication Date
KR20070004550A KR20070004550A (ko) 2007-01-09
KR100992182B1 true KR100992182B1 (ko) 2010-11-05

Family

ID=34623984

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020067011767A Expired - Fee Related KR100992182B1 (ko) 2003-11-14 2004-10-29 안과용 양안 파면 측정 시스템

Country Status (5)

Country Link
EP (3) EP1691669B1 (cg-RX-API-DMAC7.html)
JP (2) JP4668204B2 (cg-RX-API-DMAC7.html)
KR (1) KR100992182B1 (cg-RX-API-DMAC7.html)
AU (1) AU2004291042B2 (cg-RX-API-DMAC7.html)
WO (2) WO2005052538A2 (cg-RX-API-DMAC7.html)

Families Citing this family (40)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CA2615705C (en) * 2005-07-29 2016-06-28 Alcon Inc. Ophthalmic device positioning system and associated methods
US8506083B2 (en) 2011-06-06 2013-08-13 Clarity Medical Systems, Inc. Compact wavefront sensor module and its attachment to or integration with an ophthalmic instrument
US8820929B2 (en) * 2006-01-20 2014-09-02 Clarity Medical Systems, Inc. Real-time measurement/display/record/playback of wavefront data for use in vision correction procedures
FR2897426B1 (fr) * 2006-02-16 2012-07-27 Onera (Off Nat Aerospatiale) Procede d'analyse de surface d'onde par interferometrie multilaterale a difference de frequences
WO2007106657A2 (en) 2006-03-14 2007-09-20 Amo Manufacturing Usa, Llc Spatial frequency wavefront sensor system and method
JP2008246153A (ja) * 2007-03-30 2008-10-16 Topcon Corp 検眼装置及びその方法
JP5608892B2 (ja) * 2008-07-25 2014-10-22 東海光学株式会社 レンズ評価方法
US7878655B2 (en) * 2008-09-29 2011-02-01 Sifi Diagnostic Spa Systems and methods for implanting and examining intraocular lens
KR100900899B1 (ko) * 2009-03-17 2009-06-03 국방과학연구소 소화기 사격통제용 복합광학계
JP5265425B2 (ja) * 2009-03-19 2013-08-14 オリンパス株式会社 干渉計による2次元位相デ−タのアンラップ方法および装置
JP5237869B2 (ja) * 2009-04-08 2013-07-17 株式会社トプコン 模型眼
JP2010252994A (ja) * 2009-04-24 2010-11-11 Topcon Corp 眼科装置
JP2010286434A (ja) * 2009-06-15 2010-12-24 Brother Ind Ltd 動的面形状測定装置および動的面形状測定方法
JP5394902B2 (ja) * 2009-11-27 2014-01-22 株式会社トプコン 眼科装置
CN101947157B (zh) * 2009-12-18 2012-02-15 中国科学院光电技术研究所 人眼自适应光学视知觉学习训练仪
CN101947158B (zh) * 2009-12-18 2012-07-04 中国科学院光电技术研究所 双眼自适应光学视知觉学习训练仪
JP5641744B2 (ja) * 2010-02-10 2014-12-17 キヤノン株式会社 撮像装置及びその制御方法
GB2484998B (en) * 2010-10-29 2014-08-20 Lg Display Co Ltd Optical measuring apparatus and measuring method of stereoscopic display device
KR101325988B1 (ko) 2010-10-29 2013-11-07 엘지디스플레이 주식회사 입체 디스플레이의 광학 측정 장치 및 방법
EP2596745B1 (en) * 2011-10-07 2019-06-19 Popovic, Zoran Reference calibration for an adaptive optics system
WO2013116846A1 (en) * 2012-02-03 2013-08-08 Digitalvision, Llc A refractometer with a comparative vision correction simulator
FR2992843B1 (fr) * 2012-07-06 2016-05-06 Essilor Int Dispositif et procede de mesure de refraction oculaire objective et d'au moins un parametre geometrico-morphologique d'un individu
JP6000773B2 (ja) * 2012-09-13 2016-10-05 キヤノン株式会社 収差推定方法、プログラムおよび撮像装置
EP2926193A4 (en) * 2012-11-28 2016-06-01 Perfect Vision Technology Ltd METHOD AND SYSTEMS FOR AUTOMATED MEASUREMENT OF EYES AND FOR PRESCRIPTION OF EYES AND SUNGLASSES
KR101995877B1 (ko) 2013-07-02 2019-07-03 메사츄세츠 인스티튜트 어브 테크놀로지 눈 처방을 결정하는 장치 및 방법
US10117574B2 (en) * 2015-01-09 2018-11-06 Smart Vision Labs, Inc. Portable wavefront aberrometer with open field alignment channel
WO2016184571A2 (de) * 2015-05-20 2016-11-24 Carl Zeiss Smt Gmbh Messverfahren und messanordnung für ein abbildendes optisches system
JP6821361B2 (ja) * 2016-09-05 2021-01-27 キヤノン株式会社 計測装置、光学機器の製造方法および光学機器の製造装置
US10595724B2 (en) * 2017-08-04 2020-03-24 Ho Wa LAI Adaptor for an image capture device for fundus photography
FR3082274B1 (fr) 2018-06-06 2021-11-19 Gaztransport Et Technigaz Cuve etanche et thermiquement isolante
KR102082747B1 (ko) * 2019-01-23 2020-02-28 연세대학교 산학협력단 초점거리 조절이 가능한 led 어레이 기반 3차원 이미징 장치 및 방법
WO2020152621A1 (en) * 2019-01-24 2020-07-30 6 Over 6 Vision Ltd. Apparatus, system and method of determining one or more parameters of a refractive error of a tested eye
KR102771619B1 (ko) 2019-03-11 2025-02-25 삼성전자주식회사 영상의 횡이동이 가능한 디스플레이 장치
JP6581325B1 (ja) * 2019-06-12 2019-09-25 株式会社アサヒビジョン レンズ光学特性測定装置、レンズ光学特性測定方法、プログラム、及び、記録媒体。
CN110274696B (zh) * 2019-06-26 2020-11-06 中国科学院长春光学精密机械与物理研究所 大视场主动光学望远镜的波前传感方法、装置、及系统
US11730355B2 (en) 2019-09-30 2023-08-22 Alcon Inc. Ocular aberrometry recovery systems and methods
KR20230146387A (ko) * 2022-04-12 2023-10-19 주식회사 휴비츠 안경 렌즈의 근적외선 투과율을 측정할 수 있는 렌즈미터
JP2025517048A (ja) * 2022-06-29 2025-06-03 レティスペック インコーポレイテッド 網膜スペクトル撮像の較正ファントムのためのシステムおよび方法
CN117357056A (zh) * 2023-11-03 2024-01-09 瑞尔明康(浙江)医疗科技有限公司 人眼测量装置及人眼测量方法
US20260053339A1 (en) * 2024-08-21 2026-02-26 Zenni Optical, Inc. Systems and methods for identifying and categorizing floaters in simulated lighting conditions

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2003050472A1 (en) 2001-12-10 2003-06-19 Ophthonix, Inc. Systems and methods for wavefront measurement

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57211504A (en) * 1981-06-24 1982-12-25 Canon Inc Observation member for talbot interferometer
JPH0761312B2 (ja) * 1990-04-27 1995-07-05 キヤノン株式会社 眼屈折計
US5777718A (en) * 1992-12-31 1998-07-07 Canon Kabushiki Kaisha Eye refractometer
EP0663179A1 (en) * 1994-01-12 1995-07-19 Ciba-Geigy Ag Spatial refractometer
US5838424A (en) * 1997-02-26 1998-11-17 Welch Allyn, Inc. View port for eye test apparatus
JP3823266B2 (ja) * 1997-05-13 2006-09-20 株式会社トプコン 光学特性測定装置
US5963300A (en) 1998-02-17 1999-10-05 Amt Technologies, Corp. Ocular biometer
US6002484A (en) * 1999-06-18 1999-12-14 Rozema; Jos J. Phase contrast aberroscope
ATE456325T1 (de) * 1999-07-27 2010-02-15 Wavetec Vision Systems Inc Okulares biometer
US6264328B1 (en) * 1999-10-21 2001-07-24 University Of Rochester Wavefront sensor with off-axis illumination
IL143503A0 (en) * 2001-05-31 2002-04-21 Visionix Ltd Aberration correction spectacle lens
US6964480B2 (en) * 2001-08-31 2005-11-15 Metrologic Instruments, Inc. Ophthalmic instrument having adaptive optic subsystem with multiple stage phase compensator
US6761454B2 (en) * 2002-02-13 2004-07-13 Ophthonix, Inc. Apparatus and method for determining objective refraction using wavefront sensing
US6634752B2 (en) * 2002-03-11 2003-10-21 Alcon, Inc. Dual-path optical system for measurement of ocular aberrations and corneal topometry and associated methods

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2003050472A1 (en) 2001-12-10 2003-06-19 Ophthonix, Inc. Systems and methods for wavefront measurement

Also Published As

Publication number Publication date
WO2005048829A2 (en) 2005-06-02
JP2007511278A (ja) 2007-05-10
EP3001945B1 (en) 2021-01-27
JP4832310B2 (ja) 2011-12-07
AU2004291042A1 (en) 2005-06-02
AU2004291042B2 (en) 2010-10-14
EP1691669A2 (en) 2006-08-23
KR20070004550A (ko) 2007-01-09
EP3001945A3 (en) 2016-10-26
EP3001945A2 (en) 2016-04-06
EP1691669B1 (en) 2018-03-28
JP2007527526A (ja) 2007-09-27
WO2005052538A2 (en) 2005-06-09
JP4668204B2 (ja) 2011-04-13
WO2005048829A3 (en) 2005-08-18
WO2005052538A3 (en) 2005-12-01
EP1690072A2 (en) 2006-08-16

Similar Documents

Publication Publication Date Title
KR20070004550A (ko) 안과용 양안 파면 측정 시스템
US7425067B2 (en) Ophthalmic diagnostic instrument
US7659971B2 (en) Lensometers and wavefront sensors and methods of measuring aberration
JP4199000B2 (ja) 光学システムをマッピングするための断層撮影波面分析システム及び方法
US10575725B2 (en) System and method for characterising eye-related systems
KR100339259B1 (ko) 안구 망막의 3차원 실시간 영상화 장치
JPH08280622A (ja) 目の前の構造物の作像装置及び方法及びスリットランプ組立品
JP2000516500A (ja) 目の特徴を虚像を用いて測定する方法及び装置
CN100463646C (zh) 眼科双目波前测量系统
ES3064655T3 (en) Slo-based laser guidance for treating vitreous floaters
RU2055518C1 (ru) Способ определения рефракции глаза и устройство для его осуществления
Donnelly III Improving imaging in the confocal scanning laser ophthalmoscope
Srinath Optical Devices in Medical Imaging and Industrial Automation
Miller A handheld open-field infant keratometer (an american ophthalmological society thesis)
MXPA06005311A (en) Ophthalmic binocular wafefront measurement system
Mohrman et al. Putting the Knife Edge to the Eye

Legal Events

Date Code Title Description
PA0105 International application

St.27 status event code: A-0-1-A10-A15-nap-PA0105

P11-X000 Amendment of application requested

St.27 status event code: A-2-2-P10-P11-nap-X000

P13-X000 Application amended

St.27 status event code: A-2-2-P10-P13-nap-X000

P11-X000 Amendment of application requested

St.27 status event code: A-2-2-P10-P11-nap-X000

P13-X000 Application amended

St.27 status event code: A-2-2-P10-P13-nap-X000

P11-X000 Amendment of application requested

St.27 status event code: A-2-2-P10-P11-nap-X000

P13-X000 Application amended

St.27 status event code: A-2-2-P10-P13-nap-X000

R15-X000 Change to inventor requested

St.27 status event code: A-3-3-R10-R15-oth-X000

R16-X000 Change to inventor recorded

St.27 status event code: A-3-3-R10-R16-oth-X000

PG1501 Laying open of application

St.27 status event code: A-1-1-Q10-Q12-nap-PG1501

A201 Request for examination
E13-X000 Pre-grant limitation requested

St.27 status event code: A-2-3-E10-E13-lim-X000

P11-X000 Amendment of application requested

St.27 status event code: A-2-2-P10-P11-nap-X000

P13-X000 Application amended

St.27 status event code: A-2-2-P10-P13-nap-X000

PA0201 Request for examination

St.27 status event code: A-1-2-D10-D11-exm-PA0201

E902 Notification of reason for refusal
PE0902 Notice of grounds for rejection

St.27 status event code: A-1-2-D10-D21-exm-PE0902

T11-X000 Administrative time limit extension requested

St.27 status event code: U-3-3-T10-T11-oth-X000

P11-X000 Amendment of application requested

St.27 status event code: A-2-2-P10-P11-nap-X000

P13-X000 Application amended

St.27 status event code: A-2-2-P10-P13-nap-X000

E701 Decision to grant or registration of patent right
PE0701 Decision of registration

St.27 status event code: A-1-2-D10-D22-exm-PE0701

GRNT Written decision to grant
PR0701 Registration of establishment

St.27 status event code: A-2-4-F10-F11-exm-PR0701

PR1002 Payment of registration fee

St.27 status event code: A-2-2-U10-U12-oth-PR1002

Fee payment year number: 1

PG1601 Publication of registration

St.27 status event code: A-4-4-Q10-Q13-nap-PG1601

FPAY Annual fee payment

Payment date: 20131011

Year of fee payment: 4

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 4

FPAY Annual fee payment

Payment date: 20141010

Year of fee payment: 5

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 5

FPAY Annual fee payment

Payment date: 20151008

Year of fee payment: 6

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 6

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 7

LAPS Lapse due to unpaid annual fee
PC1903 Unpaid annual fee

St.27 status event code: A-4-4-U10-U13-oth-PC1903

Not in force date: 20171030

Payment event data comment text: Termination Category : DEFAULT_OF_REGISTRATION_FEE

PC1903 Unpaid annual fee

St.27 status event code: N-4-6-H10-H13-oth-PC1903

Ip right cessation event data comment text: Termination Category : DEFAULT_OF_REGISTRATION_FEE

Not in force date: 20171030