KR100867517B1 - 박막 트랜지스터형 광감지 센서 및 그 제조 방법 - Google Patents
박막 트랜지스터형 광감지 센서 및 그 제조 방법 Download PDFInfo
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- KR100867517B1 KR100867517B1 KR1020020049403A KR20020049403A KR100867517B1 KR 100867517 B1 KR100867517 B1 KR 100867517B1 KR 1020020049403 A KR1020020049403 A KR 1020020049403A KR 20020049403 A KR20020049403 A KR 20020049403A KR 100867517 B1 KR100867517 B1 KR 100867517B1
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- Prior art keywords
- thin film
- film transistor
- sensor
- switch
- light
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- 239000010409 thin film Substances 0.000 title claims abstract description 102
- 238000004519 manufacturing process Methods 0.000 title claims abstract description 11
- 239000010408 film Substances 0.000 claims abstract description 47
- 238000003860 storage Methods 0.000 claims abstract description 34
- 230000000903 blocking effect Effects 0.000 claims abstract description 26
- 239000003990 capacitor Substances 0.000 claims abstract description 21
- 239000000758 substrate Substances 0.000 claims abstract description 13
- 238000002161 passivation Methods 0.000 claims description 17
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 claims description 10
- OAICVXFJPJFONN-UHFFFAOYSA-N Phosphorus Chemical compound [P] OAICVXFJPJFONN-UHFFFAOYSA-N 0.000 claims description 5
- 229910052757 nitrogen Inorganic materials 0.000 claims description 5
- 239000011574 phosphorus Substances 0.000 claims description 5
- 229910052698 phosphorus Inorganic materials 0.000 claims description 5
- 238000000151 deposition Methods 0.000 claims description 4
- 238000001514 detection method Methods 0.000 claims 1
- 239000010410 layer Substances 0.000 claims 1
- 239000011241 protective layer Substances 0.000 claims 1
- 238000000034 method Methods 0.000 abstract description 25
- 230000001681 protective effect Effects 0.000 abstract description 11
- 238000004904 shortening Methods 0.000 abstract 1
- 238000010586 diagram Methods 0.000 description 9
- 239000002184 metal Substances 0.000 description 7
- 239000000463 material Substances 0.000 description 5
- 229910021417 amorphous silicon Inorganic materials 0.000 description 4
- 239000001023 inorganic pigment Substances 0.000 description 4
- 230000003287 optical effect Effects 0.000 description 4
- 239000012860 organic pigment Substances 0.000 description 4
- 238000004043 dyeing Methods 0.000 description 2
- 238000004070 electrodeposition Methods 0.000 description 2
- 239000007789 gas Substances 0.000 description 2
- 238000000206 photolithography Methods 0.000 description 2
- 238000004544 sputter deposition Methods 0.000 description 2
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 1
- 238000009825 accumulation Methods 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 229910052799 carbon Inorganic materials 0.000 description 1
- 230000008021 deposition Effects 0.000 description 1
- 238000005137 deposition process Methods 0.000 description 1
- 229910003460 diamond Inorganic materials 0.000 description 1
- 239000010432 diamond Substances 0.000 description 1
- 230000005684 electric field Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000005530 etching Methods 0.000 description 1
- 238000005755 formation reaction Methods 0.000 description 1
- 239000011810 insulating material Substances 0.000 description 1
- 230000007257 malfunction Effects 0.000 description 1
- 239000007769 metal material Substances 0.000 description 1
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Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
- H01L29/76—Unipolar devices, e.g. field effect transistors
- H01L29/772—Field effect transistors
- H01L29/78—Field effect transistors with field effect produced by an insulated gate
- H01L29/786—Thin film transistors, i.e. transistors with a channel being at least partly a thin film
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B1/00—Optical elements characterised by the material of which they are made; Optical coatings for optical elements
- G02B1/10—Optical coatings produced by application to, or surface treatment of, optical elements
- G02B1/14—Protective coatings, e.g. hard coatings
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/136—Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/136—Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
- G02F1/1362—Active matrix addressed cells
- G02F1/13625—Patterning using multi-mask exposure
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Optics & Photonics (AREA)
- Nonlinear Science (AREA)
- Mathematical Physics (AREA)
- Crystallography & Structural Chemistry (AREA)
- Ceramic Engineering (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Chemical & Material Sciences (AREA)
- Computer Hardware Design (AREA)
- Solid State Image Pick-Up Elements (AREA)
- Thin Film Transistor (AREA)
Abstract
Description
Claims (5)
- 삭제
- 센서 박막 트랜지스터부, 충전 및 투과부 및 스위치 박막 트랜지스터부가 각각 정의된 절연 기판을 제공하는 단계와,상기 기판 상에 상기 센서 박막 트랜지스터와, 스토리지 캐패시터 및 스위칭 박막 트랜지스터를 덮는 보호막을 형성하는 단계와,상기 보호막 전면을 차폐하되, 상기 스위치 트랜지스터부의 채널영역만이 노출되도록 셔도우 마스크를 위치시키는 단계와,상기 노출된 스위치 박막 트랜지스터의 채널영역 위에 DLC, SiC 및 Si 중 어느 하나를 증착하거나, 포스포러스 및 니트로젠 중 어느 하나를 이온 도핑하여 광차단막을 형성하는 단계를 포함한 것을 특징으로 하는 박막 트랜지스터형 광감지 센서의 제조 방법.
- 삭제
- 삭제
- 삭제
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020020049403A KR100867517B1 (ko) | 2002-08-21 | 2002-08-21 | 박막 트랜지스터형 광감지 센서 및 그 제조 방법 |
Applications Claiming Priority (1)
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KR1020020049403A KR100867517B1 (ko) | 2002-08-21 | 2002-08-21 | 박막 트랜지스터형 광감지 센서 및 그 제조 방법 |
Publications (2)
Publication Number | Publication Date |
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KR20040019142A KR20040019142A (ko) | 2004-03-05 |
KR100867517B1 true KR100867517B1 (ko) | 2008-11-07 |
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KR1020020049403A KR100867517B1 (ko) | 2002-08-21 | 2002-08-21 | 박막 트랜지스터형 광감지 센서 및 그 제조 방법 |
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Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101328763B1 (ko) | 2011-07-11 | 2013-11-13 | 삼성전자주식회사 | 터치스크린용 투명 회로 기판 및 그 제조 방법 |
US8704148B2 (en) | 2011-04-25 | 2014-04-22 | Samsung Electronics Co., Ltd. | Light-sensing apparatus having a conductive light-shielding film on a light-incident surface of a switch transistor and method of driving the same |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101158871B1 (ko) * | 2005-06-30 | 2012-06-25 | 엘지디스플레이 주식회사 | 액정 표시 장치 및 그의 구동 방법 |
KR100651163B1 (ko) * | 2005-11-23 | 2006-11-30 | 전자부품연구원 | 박막 트랜지스터형 광 감지 센서 및 그 제조방법 |
KR101266768B1 (ko) * | 2006-06-10 | 2013-05-28 | 엘지디스플레이 주식회사 | 액정표시장치 및 그 제조방법 |
KR100912187B1 (ko) * | 2006-06-30 | 2009-08-14 | 엘지디스플레이 주식회사 | 액정표시장치 및 이의 제조 방법 |
JP4978224B2 (ja) * | 2007-02-08 | 2012-07-18 | カシオ計算機株式会社 | 光電変換装置及びそれを備えた表示パネル |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH06140614A (ja) * | 1992-10-28 | 1994-05-20 | Hitachi Ltd | 光電変換装置及びそれを用いた放射線撮像装置 |
JPH1090655A (ja) * | 1996-09-17 | 1998-04-10 | Toshiba Corp | 表示装置 |
KR20000047398A (ko) * | 1998-12-08 | 2000-07-25 | 구본준 | 박막 트랜지스터형 광 감지소자 및 그 제조방법 |
KR20000050791A (ko) * | 1999-01-14 | 2000-08-05 | 구본준 | 박막 트랜지스터형 광 감지소자 |
-
2002
- 2002-08-21 KR KR1020020049403A patent/KR100867517B1/ko active IP Right Grant
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH06140614A (ja) * | 1992-10-28 | 1994-05-20 | Hitachi Ltd | 光電変換装置及びそれを用いた放射線撮像装置 |
JPH1090655A (ja) * | 1996-09-17 | 1998-04-10 | Toshiba Corp | 表示装置 |
KR20000047398A (ko) * | 1998-12-08 | 2000-07-25 | 구본준 | 박막 트랜지스터형 광 감지소자 및 그 제조방법 |
KR20000050791A (ko) * | 1999-01-14 | 2000-08-05 | 구본준 | 박막 트랜지스터형 광 감지소자 |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8704148B2 (en) | 2011-04-25 | 2014-04-22 | Samsung Electronics Co., Ltd. | Light-sensing apparatus having a conductive light-shielding film on a light-incident surface of a switch transistor and method of driving the same |
KR101328763B1 (ko) | 2011-07-11 | 2013-11-13 | 삼성전자주식회사 | 터치스크린용 투명 회로 기판 및 그 제조 방법 |
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Publication number | Publication date |
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KR20040019142A (ko) | 2004-03-05 |
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