KR100861788B1 - Integration measuring instrument - Google Patents

Abstract

The present invention is to mount the AWG, DMM, DSO in the form of modules on the HPIO board to be quickly measured by a single integrated measuring instrument when testing the test board for defects in the board test system.

PCI interface means for buffering and outputting the address, data, and control signal output from the main control unit; Sequence performing means for outputting a digital pattern stored in a sequence unit in a sequence table; Data buffer means for buffering the corresponding data; Output memory means for outputting pattern data output to the test target board; Input memory means for outputting data input from the test target board; Control memory means for adjusting a direction of an input / output channel of the input / output memory means; Output channel means for outputting data stored in said output and control memory means; Input channel means for inputting a signal output from the test target board; AWG module for outputting the data stored in the memory means to the test target board by the DAC; It relates to an integrated instrument consisting of a DMM module and a DSO module for inputting an analog signal output from the test board and converting it into a digital signal through an ADC and storing it in a memory means.

Instrument, HPIO, AWG, DMM, DSO, Board Test

Description

Integration measuring instrument

1 is an overall block diagram of an integrated instrument applied to the present invention

Figure 2 is a structural diagram of the AWG module applied to the present invention

Figure 3 is a structural diagram of a DMM module applied to the present invention

4 is a structural diagram of a DSO module applied to the present invention

5 is a configuration diagram of a board test system applied to the present invention

* Description of Signs of Main Parts of Drawings *

1. Integrated Instruments 10. HPIO

11.PCI Interface 12. Sequence Execution Unit

13. Data buffer section 14. Output memory section

15. Input memory section 16. Control memory section

17. Input channel section 18. Output channel section

20.AWG Module 21.Memory

22. DAC 23. Voltage setting part

24. Primary Amplifier 25. Secondary Amplifier

26. Terminator 30. DMM Module

31. Input terminal 32. Impedance matching part                 

33.ADC 34. Voltage Setting Part

35.Memory 40.DSO Module

41. Input terminal 42. Impedance matching section

43. ADC 44. Voltage setting part

45. Memory

The present invention relates to an integrated measuring device, and more particularly, a test object fixed to a fixture in a board test system for detecting an error on a main board of various electronic products, that is, an error on a component and a functional error. When inputting or outputting the digital pattern of the board, the system interface board can be connected to the test head to integrate various functions such as digital multimeter, oscilloscope, frequency generator, logic analyzer, etc. to quickly calculate and output various measurement tasks. The output of the work process is related to the integrated measuring instrument which reduces the cost by using a single instrument when testing the board by applying the graphical user interface method, and improves the work efficiency by the rapid operation. .

Recently, due to the rapid development of electronic and semiconductor technology, as electronic components such as resistors, capacitors, coils, diodes, transistors, and IC circuits become miniaturized and integrated, they are applied to a single board called a motherboard or main board. Each electronic component that can operate electronics is connected to the bus structure and embedded in the electronics.

As the technology of electronic components and board manufacturing develops, the corresponding electronic products are also becoming smaller and more integrated.In the trend of miniaturization and integration of electronic products, component structures on the main board are becoming more and more complicated. In case of occurrence, there are many difficulties in the workplace because it is impossible to detect in which part the failure occurred by general measuring equipment or tester.

In order to detect such errors on the board, we supply a foreign board ATE or BTS Combinational Board Test System or a domestic In-Circuit Tester or MDA board test system to check and repair the board that caused the error.

In the above board test system, a measurement card for displaying or analyzing the size or shape of the signal generated from the test target board, that is, a HPIO (Hybrid Pattern Input / Output) master card, a digital multimeter (DMM) card, and an AWG (Arbitary Waveform) Measurement cards such as generator cards, oscilloscopes, digital input / output (DIO) cards, and user interface cards must be fastened separately to the PC back plane in the slot method, and each card has a separate process, resulting in a complex interface. There is a problem that the overall speed of the system is reduced.

The domestic in-circuit test system does not use a CAD file, and since most of the work is performed by manual work, it takes a lot of work time, and there is a concern about a worker's failure, and the configuration of a graphical user interface method is used. Due to this difficult use of the text editor method does not consider the user's convenience, there is a lot of inconvenience when using, there is a problem to reduce the work efficiency.

In addition, the equipment for displaying or analyzing the magnitude or shape of the signal generated from the electrical, electronic and communication devices as described above may include a digital multimeter, an oscilloscope, a frequency counter, and a frequency generator. Generator and Logic Analyzer, etc. These instruments are configured separately according to their functions, and each function is configured to perform additional functions in addition to one function. There is an economic burden due to the purchase of a plurality of measuring instruments, there is a problem that the space is inefficient use due to the volume of the measuring equipment.

The present invention has been made to solve the above-mentioned conventional problems, HPIO (Hybrid Pattern In / Out), in order to be able to directly control the test for component defects on the test board in the board test system at high speed, By integrating AWG (Arbitrary Wave form Generator), DMM (Digital Multi Meter), DSO (Digital Storage Oscilloscope) module, it is possible to efficiently measure the test board on one board, By outputting the result value through the GUI (Graphical User Interface) method, the mutual interface between the measurement modules is simplified, which can reduce the unit price, improve the performance of the system and the user's convenience, thereby reducing the time lost in the work. It is intended to be.

In order to achieve the above object, in the measuring instrument embedded in the board test system and performing measurement operation on the defect of the test target board, buffering the address, data, and control signal output from the main controller to the HPIO board and the corresponding module. PCI interface means for outputting and activating, interfaced with the test signal output by the module to the main control unit; Sequence performing means for activating a trigger controller, a clock generator, an address generator, and a loop generator by outputting a digital pattern stored in segments in a sequence table; Data buffer means for buffering the data when storing the data in the output memory means or outputting the data of the input memory means to the main controller; Output memory means for storing and outputting pattern data output to the test target board in segments; Input memory means for storing the pattern data input from the test target board in units of segments and outputting the pattern data to the main controller; Control memory means for adjusting a direction of an input / output channel of the input / output memory means; Output channel means for converting and outputting data stored in the output and control memory means into an analog form; An input channel means for inputting the signal output from the test target board to the input memory means; An AWG module for converting data stored in the memory means into digital signals by converting the digital signals into analog signals to the test target board; A DMM module for inputting an analog signal output from the test target board, converting the analog signal into a digital signal through an ADC and storing the analog signal in a memory unit; It is intended to implement an integrated instrument consisting of a DSO module that inputs an analog signal output from the test board and converts it into a digital signal through an ADC and stores it in a memory means.

The present invention, when performing a board test by the "board test system" of the patent application No. 10-2001-2026 filed by the applicant, the outside on the test target board mounting the elements and components of various electronic products In order to measure unknown failures or errors, the main functions of HPIO module, AWG module, DMM module, and DSO module are separated and installed in one measuring device. Various modules for the measurement can be implemented on the measurement system.

The patent application "board test system" filed by the present applicant is an adapter that connects the test plate fixed to the test plate and the test board fixed to the probe plate to the test head unit and the wireless fixture method by fixing the test board; Fixture portion made; A test head part comprising a test head pin connecting the coupling part of the adapter in a wireless fixation manner, an HPIO slave card extending a channel of the HPIO master card, and a switch / matrix card switching the test head pin; PC Back. It is installed in the slot of the board and connected to the test head through the system interface board to perform various measurement tasks on the test board fixed to the fixture. A measurement card unit comprising a user interface card to be manufactured separately; A control unit comprising a main controller, a floppy disk driver, a CD-ROM driver, and a hard disk for controlling various measurement operations on a test target board fixed to a fixture unit using a PC slot card; The PC interface board connecting the measurement card unit and the main controller with the test head unit through a system interface board and the system interface board for interfacing various signals of the system and the signal not passing through the system interface board with the test target board. An interface unit made of a common interface board; A peripheral unit including an output unit consisting of a monitor and a printer and an input unit consisting of a keyboard and a mouse; A system power supply unit supplying power to a device that requires power except a UUT power supply unit and a test target board to supply power to the test target board; It consists of.

The present invention integrates to perform the functions of AWG, DMM, SCOPE on a single HPIO mast card in order to enable high-speed control of all the controls required for measurement of the test board in the board test system, and the mutual interface is simple. It is possible to improve the speed in performing the measurement work on the test target board, and to perform the user's work is to build a GUI environment.

Hereinafter, an integrated measuring instrument constructed according to an embodiment of the present invention will be described in detail with reference to the accompanying drawings.

1 is an overall block diagram of an integrated instrument applied to the present invention, FIG. 2 is a structural diagram of an AWG module applied to the present invention, FIG. 3 is a structural diagram of a DMM module applied to the present invention, and FIG. 5 is a schematic diagram of a board test system applied to the present invention. FIG. 5 is a schematic diagram of a board test system applied to the present invention. 50 is a board test system, 51 is a test target board, 52 is a fixture, and 53 is a test head. .

As shown, the present invention mounts the AWG, DMM and DSO in a modular form within the HPIO board 10 mounted on the board test system 50 to output a digital pattern to the test target board 51 or the test target board 51. The digital pattern is outputted, and the output of the digital pattern outputs all the patterns to be output from the main controller (not shown) in the output memory 14 and then outputs the recorded digital patterns. The digital pattern is sent to the channel unit 18, and the digital pattern is stored in the input memory 15 through the input channel unit 17, and then read from the main controller so as to be analyzed.

The HPIO board 10 includes a PCI interface unit 11, a sequence execution unit 12, a data buffer unit 13, an output memory unit 14, an input memory unit 15, a control memory unit 16, and an input. The channel unit 17, the output channel unit 18, AWG module 20, DMM module 30, DSO module 40, the PCI interface 11 is the address, data output from the main control unit After buffering all signals such as a control signal, and outputting the AWG 20, the DMM 30, and the DSO module 40 mounted in the module form on the HPIO board 10 and the board, The test result signal value of the test target board 51 by the module is interfaced and transmitted to the main control unit so that the test result board 51 can be analyzed.

The sequence execution unit 12 subdivides and stores the digital pattern of the HPIO 10 in units of segments, and then is used to input or output the pattern in an arbitrary order. In this case, the sequence table is formed in a predetermined memory form. The table structure of the sequence table is implemented as shown in Table 1 below.

Offset Contents 0 to 3   Setting start address of pattern memory 4 to 7   Set length of pattern memory 8 to 9   Loop counter setting A to B   Pattern output mode setting C to F   Trigger pattern state setting 10 to 13   Trigger mask settings 14-17   Vector cycle set 18-1B   Receive delay setting 1C ~ 1D   External trigger state setting 1E ~ 1F   External trigger mask setting

When a control signal is transmitted from the main controller to the sequence execution unit 12, the corresponding pattern is outputted and activated by a trigger controller, a clock generator, an address generator, a loop generator, and the like by the settings stored in the sequence table.

The data buffer unit 13 buffers predetermined data transmitted from the main control unit through the PCI interface unit 11, stores the data in the output memory unit 14, and inputs the input memory unit through the input channel unit 17. After buffering the predetermined data stored in (15), the main control unit can read and analyze the data.

The output memory unit 14 stores the pattern data output from the HPIO 10 to the test target board 51 in segments, and then outputs the corresponding data during the test of the test target board 51. In this case, the output memory unit 14 uses a high speed SRAM, the length of the pattern memory is 256k, and may be set up to 512k.

The input memory unit 15 stores the pattern data input from the test target board 51 to the HPIO 10 in units of segments and reads them from the main control unit so that the defects of the test target board 51 can be analyzed. However, the high speed SRAM is used as the input memory unit 15, the length of the pattern memory can be 256k, and can be set up to 512k.

The control memory unit 16 is a memory for adjusting the direction of the pattern input / output channel of the HPIO 10. The control memory unit 16 properly adjusts an input / output interval between the input memory unit 15 and the output memory unit 14. It is possible to test whether or not the test target board 51 is defective. The control memory unit 16 uses high speed SRAM, and the same length as that of the pattern memory can be 256k or 512k.

The input channel unit 17 is a means for receiving a signal output from the test target board 51 and storing the input signal into the input memory unit 15, and the test target board in the input memory unit 15. In order to store the input signal output from the 51, the input signal and the reference signal are compared with each other in the input channel comparator, and the input signal divided according to the reference signal is buffered and then transmitted to the input memory unit 15 for storage. Be sure to

The output channel unit 18 transmits the data signals stored in the output memory unit 14 and the control memory unit 16 to the test target board 51. The signal value corresponding to the test target board 51. It receives the driver reference level from the main control unit so that it can be transmitted, converts it into analog form, and transmits it.

The waveform that can be output by the AWG module 20 to an arbitrary waveform generator is a sine wave, a square wave, a pulse wave, and is stored in the memory unit 21. The data is converted into an analog signal by a digital to analog converter (DAC) 22, and then the analog signal is output to the test target board 51.

The DMM module 30 measures the AC voltage, the DC voltage and various resistors, capacitors, diodes, and coil values of the test target board 51, and additionally calculates and measures an average value measuring function through a calculation of the main controller. The analog waveform output from the test target board 51 is input through the DMM input terminal 31 to be converted into a digital waveform through an analog to digital converter (ADC) 33, and then the memory 35 ) So that it can be read and processed by the main controller.

The DSO module 40 further calculates the functions of multiplication, subtraction, FFT, integration, derivative, etc. by measuring the frequency, pulse ratio, pulse amplitude, etc. of various waveforms with an arbitrary waveform measuring instrument and calculating the main controller. In order to measure, the analog waveform output from the test target board 51 is input through the scope input terminal 41, converted into a digital waveform through the ADC 43, and then stored in the memory 45. Read from the main control unit so that it can be processed.

FIG. 2 is a structural diagram of an AWG module 20 applied to the present invention. The AWG module 20 stores a digital waveform of a waveform to be output to the test board 51 in a memory 21 and stores a DAC (DAC). 22) to convert the waveform stored in the digital form into an analog waveform so that the test board 51 can be recognized, and at this time, the reference voltage is set through the voltage setting unit 23, the primary In order to interface the signal output from the DAC 22 to the secondary amplifier 25 through the amplifier 24, the noise component is removed and filtered.

The first amplified analog signal may be amplified by the second amplification unit 25 with power amplification, that is, 60 V high voltage 3 A high current (180 W high power), and the terminator 26 may be used to output the amplified analog signal. The output impedance of the secondary amplifier 25 can be matched with the impedance of the load. In this case, the resistance of the terminator 26 is 0 ohm, 50 ohm, 120 ohm, 300 ohm, and a relay switch is used. After performing the function of the terminator (26), it is possible to output the analog waveform to the test target board (51).

3 is a structural diagram of a DMM module 30 applied to the present invention, wherein the DMM module 30 is configured to attenuate or amplify an analog signal output from the test target board 51 according to the voltage range of the input terminal 31. By selecting the appropriate ADC input level by selecting the appropriate input level by embedding an input overvoltage protection circuit, activates the ADC 33 by recognizing a specific part of the input analog signal, and generates a trigger signal Allows the entire DMM module 30 to be activated.

In order to interface the input analog signal to the ADC 33, the impedance matching unit 32 matches the impedance, converts the level into the input range of the ADC 33, and sets the impedance of the input terminal 31 to be high. When converting an analog signal into a digital form through the ADC 33, the digital waveform is converted into a digital waveform by receiving a reference voltage set by the voltage setting unit 34. The memory 35 is stored in the memory 35 so that the main controller can read and process the data through the PCI interface 11 when necessary.

4 is a structural diagram of a DSO module 40 applied to the present invention, wherein the DSO module 40 is configured to attenuate or amplify an analog signal output from the test target board 51 according to the voltage range of the input terminal 41. By selecting the appropriate ADC 43 input level by selecting the appropriate input level by embedding an input overvoltage protection circuit, and activates the ADC 43 of the oscilloscope by recognizing a specific part of the input analog signal, Generate a trigger signal to activate all oscilloscope channels simultaneously.

In order to interface the input analog signal to the ADC 43, the impedance matching unit 42 matches the impedance, converts the level into the input range of the ADC 43, and sets the impedance of the input terminal 41 to be high. When converting an analog signal into a digital form through the ADC 43, the digital waveform is converted into a digital waveform after receiving the reference voltage set by the voltage setting unit 44. It is stored in the memory 45 so that the main control unit can be read and processed through the PCI interface 11 as necessary.

Looking at the operation of the integrated measuring instrument (1) implemented by the present invention as described above are as follows.

The fixture 52 corresponding to the test target board 51 is fixed to the test head 53, but the main controller controls the pneumatic / DC motor through the system control circuit to control the fixture 52 to the test head 53. ) To be in contact with the pin, and check the state of the system control circuit to see if the fixture 52 is properly fixed.                     

When the test target board 51 is fixed as described above, a discharge test, a short / open test, a non-power in-circuit test, a power in-circuit test, a function test, etc., are performed on the test target board 51. .

The main controller buffers the address, data, and control signals through the PCI interface 11, and then the AWG 20, the DMM 30, and the DSO module 40 mounted in the module form on the HPIO board 10 and the board. And activates by outputting a predetermined pattern to the trigger controller, the clock generator, and the address generator according to the settings stored in the sequence table by the sequence execution unit 12 in segments.

The predetermined data transmitted from the main control unit through the PCI interface unit 11 is buffered in the data buffer unit 13 and then stored in the output memory unit 14, and the pattern data to be output to the test target board 51. Is stored in units of segments and outputs the data required for the test of the test target board 51 according to the settings stored in the control memory unit 16. After receiving the reference level from the main control unit, converting it into an analog form, the output channel The unit 18 is transmitted to the test target board 51.

The signal output from the test target board 51 is stored in the input memory unit 15 through the input channel unit 17. In order to store the input signal in the input memory unit 15, the signal is compared with a reference signal. After buffering by dividing according to the reference signal, it is transmitted to and stored in the input memory unit 15, and the input pattern data is stored in segments and read from the main control unit for defects of the test target board 51. Allow for analysis.                     

The main control unit transmits an address, data, and control signal through the PCI interface unit 11 to activate the AWG 20, the DMM 30, and the DSO module 40 mounted in the HPIO board 10. The digital signal stored in the unit 14 is output to the AWG module 20 to be converted into an analog signal through the DAC 22, and then output to the test target board 51, the test target board ( The analog signal output from 51) is input through DMM and DSO input terminals 31 and 41, converted into a digital signal through ADCs 33 and 43, and then stored in the input memory unit 15 to be read by the main controller. Allow indentation processing.

As described above, a single integrated measuring instrument having an AWG 20, a DMM 30, and a DSO module 40 mounted in the HPIO board 10 can be used to quickly calculate whether a test board has a defect. The present invention described above is capable of various substitutions, modifications, and changes without departing from the technical spirit of the present invention for those skilled in the art to which the present invention pertains. It is not limited to the drawings shown.

The present invention provides a AWG, DMM, DSO module in the HPIO board to collectively adjust the input and output of the analog and digital waveforms to the test board in testing the component defects on the test board of the board test system By integrating it, the measurement work can be done efficiently, and the simplification of the mutual interface between the measurement modules increases the performance speed of the system, thereby improving the work efficiency.

Claims (4)

In the instrument that is built in the board test system to measure the defect of the test board, PCI interface means for buffering the address, data, and control signal output from the main control unit to output and activate the HPIO board and the corresponding module, and interface the test signal output by the module to the main control unit; Sequence performing means for activating a trigger controller, a clock generator, an address generator, and a loop generator by outputting a digital pattern stored in segments in a sequence table; Data buffer means for buffering the data when storing the data in the output memory means or outputting the data of the input memory means to the main controller; Output memory means for storing and outputting pattern data output to the test target board in segments; Input memory means for storing the pattern data input from the test target board in units of segments and outputting the pattern data to the main controller; Control memory means for adjusting a direction of an input / output channel of the input / output memory means; Output channel means for converting and outputting data stored in the output and control memory means into an analog form; An input channel means for inputting the signal output from the test target board to the input memory means; An AWG module for converting data stored in the memory means into digital signals by converting the digital signals into analog signals to the test target board; A DMM module for inputting an analog signal output from the test target board and converting the analog signal into a digital signal through an ADC and storing the analog signal in a memory unit; And a DSO module for inputting an analog signal output from the test target board, converting the analog signal into a digital signal through an ADC, and storing the analog signal in a memory means. The method of claim 1, The AWG module converts a digital waveform stored in a memory into an analog waveform through a DAC means, sets a reference voltage, and first amplifies the noise component to firstly amplify the interface from the primary amplifier to the secondary amplifier. An integrated instrument characterized by filtering, power amplification in the secondary amplifier, matching the output impedance with the impedance of the load through the terminator, and outputting an analog waveform to the test board. The method of claim 1, The DMM module selects an appropriate ADC input level according to the voltage range of the input terminal of the analog signal output from the test target board, matches the impedance by the impedance matching unit, and converts the level into the input range of the ADC. And receiving a reference voltage, converting the analog waveform into a digital waveform, and storing the result in a memory so that the corresponding data can be transmitted to the main control unit through the PCI interface for processing. The method of claim 1, The DSO module selects an appropriate ADC input level according to the voltage range of the input terminal of the analog signal output from the test target board, matches the impedance by the impedance matching unit, and converts the level into the input range of the ADC of the oscilloscope, and sets the voltage. And receiving a reference voltage through the converter, converting the ADC into a digital waveform, and storing the result in a memory so that the corresponding data can be transferred to the main controller through a PCI interface for processing.

Images