KR100795080B1 - 기판검사용 조명장치 - Google Patents
기판검사용 조명장치 Download PDFInfo
- Publication number
- KR100795080B1 KR100795080B1 KR1020050100125A KR20050100125A KR100795080B1 KR 100795080 B1 KR100795080 B1 KR 100795080B1 KR 1020050100125 A KR1020050100125 A KR 1020050100125A KR 20050100125 A KR20050100125 A KR 20050100125A KR 100795080 B1 KR100795080 B1 KR 100795080B1
- Authority
- KR
- South Korea
- Prior art keywords
- light
- light source
- illumination
- liquid crystal
- substrate
- Prior art date
Links
Images
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/47—Scattering, i.e. diffuse reflection
- G01N21/4738—Diffuse reflection, e.g. also for testing fluids, fibrous materials
- G01N21/474—Details of optical heads therefor, e.g. using optical fibres
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/8422—Investigating thin films, e.g. matrix isolation method
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8806—Specially adapted optical and illumination features
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B3/00—Simple or compound lenses
- G02B3/02—Simple or compound lenses with non-spherical faces
- G02B3/08—Simple or compound lenses with non-spherical faces with discontinuous faces, e.g. Fresnel lens
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01H—ELECTRIC SWITCHES; RELAYS; SELECTORS; EMERGENCY PROTECTIVE DEVICES
- H01H2201/00—Contacts
- H01H2201/022—Material
- H01H2201/026—Material non precious
- H01H2201/028—Indium tin oxide [ITO]
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- General Health & Medical Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- Life Sciences & Earth Sciences (AREA)
- Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Mathematical Physics (AREA)
- Optics & Photonics (AREA)
- Liquid Crystal (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Testing Of Optical Devices Or Fibers (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2005272425A JP3831744B1 (ja) | 2005-09-20 | 2005-09-20 | 基板検査用照明装置 |
JPJP-P-2005-00272425 | 2005-09-20 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR20070032893A KR20070032893A (ko) | 2007-03-23 |
KR100795080B1 true KR100795080B1 (ko) | 2008-01-17 |
Family
ID=37214350
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1020050100125A KR100795080B1 (ko) | 2005-09-20 | 2005-10-24 | 기판검사용 조명장치 |
Country Status (3)
Country | Link |
---|---|
JP (1) | JP3831744B1 (ja) |
KR (1) | KR100795080B1 (ja) |
TW (1) | TWI314642B (ja) |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP5646922B2 (ja) * | 2010-09-03 | 2014-12-24 | 株式会社トプコン | 検査装置 |
JP2013092661A (ja) * | 2011-10-26 | 2013-05-16 | Panasonic Corp | 部品実装装置に用いる撮像用照明ユニット及び部品実装装置 |
JP6353165B2 (ja) * | 2014-11-07 | 2018-07-04 | スリーエム イノベイティブ プロパティズ カンパニー | 切替可能ディフューザを含む光学装置 |
JP2018197830A (ja) | 2017-05-25 | 2018-12-13 | スタンレー電気株式会社 | 発光機能を備えた透明パネル |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2002071571A (ja) | 2000-08-29 | 2002-03-08 | Olympus Optical Co Ltd | 外観検査用投光装置 |
JP2003337106A (ja) | 2002-05-20 | 2003-11-28 | Hitachi Kokusai Electric Inc | マクロ検査装置 |
-
2005
- 2005-09-20 JP JP2005272425A patent/JP3831744B1/ja not_active Expired - Fee Related
- 2005-10-24 KR KR1020050100125A patent/KR100795080B1/ko not_active IP Right Cessation
-
2006
- 2006-09-01 TW TW095132318A patent/TWI314642B/zh not_active IP Right Cessation
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2002071571A (ja) | 2000-08-29 | 2002-03-08 | Olympus Optical Co Ltd | 外観検査用投光装置 |
JP2003337106A (ja) | 2002-05-20 | 2003-11-28 | Hitachi Kokusai Electric Inc | マクロ検査装置 |
Also Published As
Publication number | Publication date |
---|---|
JP2007085781A (ja) | 2007-04-05 |
TWI314642B (en) | 2009-09-11 |
JP3831744B1 (ja) | 2006-10-11 |
KR20070032893A (ko) | 2007-03-23 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
A201 | Request for examination | ||
E902 | Notification of reason for refusal | ||
AMND | Amendment | ||
E601 | Decision to refuse application | ||
AMND | Amendment | ||
J201 | Request for trial against refusal decision | ||
E902 | Notification of reason for refusal | ||
B701 | Decision to grant | ||
GRNT | Written decision to grant | ||
FPAY | Annual fee payment |
Payment date: 20110110 Year of fee payment: 4 |
|
LAPS | Lapse due to unpaid annual fee |