KR100764273B1 - 박막트랜지스터 제조방법 - Google Patents
박막트랜지스터 제조방법 Download PDFInfo
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- KR100764273B1 KR100764273B1 KR1020010030564A KR20010030564A KR100764273B1 KR 100764273 B1 KR100764273 B1 KR 100764273B1 KR 1020010030564 A KR1020010030564 A KR 1020010030564A KR 20010030564 A KR20010030564 A KR 20010030564A KR 100764273 B1 KR100764273 B1 KR 100764273B1
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- gate
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- 239000010409 thin film Substances 0.000 title claims abstract description 26
- 238000000034 method Methods 0.000 title claims abstract description 10
- 239000010408 film Substances 0.000 claims abstract description 53
- 239000000758 substrate Substances 0.000 claims abstract description 27
- 229910021417 amorphous silicon Inorganic materials 0.000 claims abstract description 17
- 239000002184 metal Substances 0.000 claims abstract description 17
- 238000004519 manufacturing process Methods 0.000 claims abstract description 11
- 238000000151 deposition Methods 0.000 claims abstract description 10
- 230000001681 protective effect Effects 0.000 claims abstract description 9
- 238000005530 etching Methods 0.000 claims abstract description 5
- 238000000059 patterning Methods 0.000 claims abstract description 5
- 238000002161 passivation Methods 0.000 claims description 3
- 229920002120 photoresistant polymer Polymers 0.000 claims 2
- 239000004973 liquid crystal related substance Substances 0.000 abstract description 10
- 239000010410 layer Substances 0.000 description 32
- 229910021420 polycrystalline silicon Inorganic materials 0.000 description 2
- 229920005591 polysilicon Polymers 0.000 description 2
- 230000008021 deposition Effects 0.000 description 1
- 238000005137 deposition process Methods 0.000 description 1
- 230000001788 irregular Effects 0.000 description 1
- 239000011159 matrix material Substances 0.000 description 1
- 239000011241 protective layer Substances 0.000 description 1
- 238000002834 transmittance Methods 0.000 description 1
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices adapted for rectifying, amplifying, oscillating or switching, or capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. PN junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/40—Electrodes ; Multistep manufacturing processes therefor
- H01L29/41—Electrodes ; Multistep manufacturing processes therefor characterised by their shape, relative sizes or dispositions
- H01L29/423—Electrodes ; Multistep manufacturing processes therefor characterised by their shape, relative sizes or dispositions not carrying the current to be rectified, amplified or switched
- H01L29/42312—Gate electrodes for field effect devices
- H01L29/42316—Gate electrodes for field effect devices for field-effect transistors
- H01L29/4232—Gate electrodes for field effect devices for field-effect transistors with insulated gate
- H01L29/42384—Gate electrodes for field effect devices for field-effect transistors with insulated gate for thin film field effect transistors, e.g. characterised by the thickness or the shape of the insulator or the dimensions, the shape or the lay-out of the conductor
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/136—Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
- G02F1/1362—Active matrix addressed cells
- G02F1/136286—Wiring, e.g. gate line, drain line
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier
- H01L27/12—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier the substrate being other than a semiconductor body, e.g. an insulating body
- H01L27/1214—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier the substrate being other than a semiconductor body, e.g. an insulating body comprising a plurality of TFTs formed on a non-semiconducting substrate, e.g. driving circuits for AMLCDs
- H01L27/124—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier the substrate being other than a semiconductor body, e.g. an insulating body comprising a plurality of TFTs formed on a non-semiconducting substrate, e.g. driving circuits for AMLCDs with a particular composition, shape or layout of the wiring layers specially adapted to the circuit arrangement, e.g. scanning lines in LCD pixel circuits
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier
- H01L27/12—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier the substrate being other than a semiconductor body, e.g. an insulating body
- H01L27/1214—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier the substrate being other than a semiconductor body, e.g. an insulating body comprising a plurality of TFTs formed on a non-semiconducting substrate, e.g. driving circuits for AMLCDs
- H01L27/1259—Multistep manufacturing methods
- H01L27/1288—Multistep manufacturing methods employing particular masking sequences or specially adapted masks, e.g. half-tone mask
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices adapted for rectifying, amplifying, oscillating or switching, or capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. PN junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
- H01L29/76—Unipolar devices, e.g. field effect transistors
- H01L29/772—Field effect transistors
- H01L29/78—Field effect transistors with field effect produced by an insulated gate
- H01L29/786—Thin film transistors, i.e. transistors with a channel being at least partly a thin film
- H01L29/78696—Thin film transistors, i.e. transistors with a channel being at least partly a thin film characterised by the structure of the channel, e.g. multichannel, transverse or longitudinal shape, length or width, doping structure, or the overlap or alignment between the channel and the gate, the source or the drain, or the contacting structure of the channel
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/136—Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
- G02F1/1362—Active matrix addressed cells
- G02F1/136231—Active matrix addressed cells for reducing the number of lithographic steps
- G02F1/136236—Active matrix addressed cells for reducing the number of lithographic steps using a grey or half tone lithographic process
Abstract
Description
Claims (3)
- 게이트 금속막이 증착된 투명성 절연 기판 상에 감광막을 도포하고, 제 1마스크를 사용하여 상기 감광막을 게이트 전극이 형성될 영역 상에 하프 톤형 감광막패턴을 형성하는 단계;상기 하프 톤형 감광막패턴을 사용하여 상기 게이트금속막을 노광 및 현상한후 이를 선택적으로 식각하여 요철형 게이트 전극을 형성하는 단계;상기 요철형 게이트 전극이 형성된 기판 상에 게이트 이중 절연막, 비정질 실리콘막, 도핑된 비정질 실리콘막을 차례로 증착하고, 이들을 제 2마스크를 사용하여 선택적으로 패터닝하여 엑티브 영역을 한정하는 단계;상기 결과물 상에 소오스/드레인 금속막을 증착하고 제 3마스크를 사용하여 소오스/드레인 전극 및 채널층을 형성하는 단계;상기 소오스/드레인 전극이 형성된 기판 상에 보호막을 도포하고, 제 4마스크를 사용하여 콘택홀을 형성하는 단계;상기 보호막이 형성된 기판 상에 ITO 금속막을 증착하고, 제 5마스크를 사용하여 화소 전극을 형성하는 단계를 포함하는 것을 특징으로 하는 박막 트랜지스터 제조방법.
- 제 1항에 있어서,상기 제 1마스크는 노광량이 100%와 50%로 구분되는 그레이톤 마스크인 것을 특징으로 하는 박막 트랜지스터 제조방법.
- 제 1항에 있어서,상기 게이트 이중 절연막, 상기 비정질 실리콘막, 상기 도핑된 비정질 실리콘막, 상기 소오스/드레인 전극, 및 상기 보호막은 요철 형태인 것을 특징으로 하는 박막 트랜지스터 제조방법.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
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KR1020010030564A KR100764273B1 (ko) | 2001-05-31 | 2001-05-31 | 박막트랜지스터 제조방법 |
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KR1020010030564A KR100764273B1 (ko) | 2001-05-31 | 2001-05-31 | 박막트랜지스터 제조방법 |
Publications (2)
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KR20020091695A KR20020091695A (ko) | 2002-12-06 |
KR100764273B1 true KR100764273B1 (ko) | 2007-10-05 |
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KR1020010030564A KR100764273B1 (ko) | 2001-05-31 | 2001-05-31 | 박막트랜지스터 제조방법 |
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Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN104576761A (zh) * | 2015-02-06 | 2015-04-29 | 合肥京东方光电科技有限公司 | 薄膜晶体管及其制造方法、显示基板和显示装置 |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101272488B1 (ko) * | 2005-10-18 | 2013-06-07 | 삼성디스플레이 주식회사 | 박막트랜지스터 기판, 이의 제조방법 및 이를 가지는 액정표시 패널과 이 액정 표시 패널의 제조방법 |
KR101602252B1 (ko) * | 2008-06-27 | 2016-03-10 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 박막 트랜지스터, 반도체장치 및 전자기기 |
TWI570899B (zh) * | 2014-09-10 | 2017-02-11 | 群創光電股份有限公司 | 薄膜電晶體基板 |
CN106898617B (zh) | 2017-03-20 | 2020-06-30 | 合肥京东方光电科技有限公司 | 基板及其制备方法、显示面板和显示装置 |
CN110729359A (zh) * | 2019-10-25 | 2020-01-24 | 深圳市华星光电半导体显示技术有限公司 | 一种薄膜晶体管、显示面板及薄膜晶体管的制作方法 |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR19990030268A (ko) * | 1997-09-30 | 1999-04-26 | 다카노 야스아키 | 박막 트랜지스터 및 박막 트랜지스터의 제조 방법 |
KR19990045423A (ko) * | 1997-11-19 | 1999-06-25 | 가네꼬 히사시 | 반도체 장치 및 그 제조방법 |
KR20000001169A (ko) * | 1998-06-09 | 2000-01-15 | 구본준, 론 위라하디락사 | 박막트랜지스터 제조방법 |
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Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
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KR19990030268A (ko) * | 1997-09-30 | 1999-04-26 | 다카노 야스아키 | 박막 트랜지스터 및 박막 트랜지스터의 제조 방법 |
KR19990045423A (ko) * | 1997-11-19 | 1999-06-25 | 가네꼬 히사시 | 반도체 장치 및 그 제조방법 |
KR20000001169A (ko) * | 1998-06-09 | 2000-01-15 | 구본준, 론 위라하디락사 | 박막트랜지스터 제조방법 |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN104576761A (zh) * | 2015-02-06 | 2015-04-29 | 合肥京东方光电科技有限公司 | 薄膜晶体管及其制造方法、显示基板和显示装置 |
EP3076437A4 (en) * | 2015-02-06 | 2017-08-16 | Boe Technology Group Co. Ltd. | Thin film transistor and manufacturing method thereof, display substrate and display device |
US10043916B2 (en) | 2015-02-06 | 2018-08-07 | Boe Technology Group Co., Ltd. | Thin-film transistor having channel structure with increased width-length ratio |
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KR20020091695A (ko) | 2002-12-06 |
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