KR100744639B1 - 실리콘 단일재질의 플라즈마 챔버 캐소드 및 아웃링 - Google Patents
실리콘 단일재질의 플라즈마 챔버 캐소드 및 아웃링 Download PDFInfo
- Publication number
- KR100744639B1 KR100744639B1 KR1020060072177A KR20060072177A KR100744639B1 KR 100744639 B1 KR100744639 B1 KR 100744639B1 KR 1020060072177 A KR1020060072177 A KR 1020060072177A KR 20060072177 A KR20060072177 A KR 20060072177A KR 100744639 B1 KR100744639 B1 KR 100744639B1
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- South Korea
- Prior art keywords
- cathode
- silicon
- groove
- ring
- anode
- Prior art date
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32431—Constructional details of the reactor
- H01J37/32532—Electrodes
- H01J37/32541—Shape
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P50/00—Etching of wafers, substrates or parts of devices
- H10P50/20—Dry etching; Plasma etching; Reactive-ion etching
- H10P50/24—Dry etching; Plasma etching; Reactive-ion etching of semiconductor materials
- H10P50/242—Dry etching; Plasma etching; Reactive-ion etching of semiconductor materials of Group IV materials
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32009—Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32431—Constructional details of the reactor
- H01J37/32532—Electrodes
- H01J37/3255—Material
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32431—Constructional details of the reactor
- H01J37/32532—Electrodes
- H01J37/32568—Relative arrangement or disposition of electrodes; moving means
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- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Plasma & Fusion (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Drying Of Semiconductors (AREA)
- Plasma Technology (AREA)
Abstract
Description
Claims (6)
- 반도체 에칭공정에 사용되며 일정간격을 두고 관통구멍(40)이 조밀하게 구성되고 캐소드에 있어서,씽글크리스탈 재질의 실리콘으로 단일 구성하고, 애노드와 결착되는 부분으로 원형의 홈선(20) 및 홈(30)으로 구성되는 것을 포함하는 실리콘 단일재질의 캐소드.
- 제 1항에 있어서,상기 링 홈선(20) 및 플레이트 홈(30)에 삽입, 안착되고 표면에 관통구멍(40)이 조밀하게 구성되고 링 홈선(20) 및 플레이트 홈(30)의 넓이와 두께보다 작게 구성하고 재질은 실리콘 일체형으로 구성되는 플레이트(60) 및 링(70)으로 구성되는 것을 포함하는 실리콘 단일재질의 캐소드.
- 반도체 에칭공정에 사용되며 일정간격을 두고 관통구멍(40)이 조밀하게 구성되고 캐소드의 아웃링에 있어서,일정 직경의 링의 형태를 가지며 재질은 상부로 하나의 씽글크리스탈재질의 실리콘 원판에 분할된 폴리크리스탈재질의 실리콘을 결착시켜 구성하고 표면에 일정간격을 두고 관통구멍(40)이 조밀하게 구성되고 상기 상부에 아웃링 플레이트 홈(90)이 구성되는 것을 포함하는 실리콘 단일재질의 아웃링.
- 제 3항에 있어서,상기 아웃링 플레이트 홈(90)에 삽입, 안착되고 아웃링 플레이트 홈(90)의 넓이와 두께보다 작게 구성하고 재질은 싱클크리스탈 실리콘 또는 폴리크리스탈 실리콘으로 구성되는 아웃링 플레이트(100)로 구성되는 것을 포함하는 실리콘 단일재질의 아웃링
- 반도체 에칭공정에 사용되는 캐소드의 아웃링에 있어서,일정 직경의 링의 형태를 가지며 재질은 상부로 하나의 씽글크리스탈재질의 실리콘 원판에 분할된 폴리크리스탈재질의 실리콘을 결착시켜 구성하고 표면에 일정간격을 두고 관통구멍(40)이 조밀하게 구성되고,애노드와 결착되는 상부 면 전체에 걸쳐 원형의 작은 홈(130)이 다수개 연속적으로 구성된 띠를 동일 간격으로 연속 구성한 것을 포함하는 실리콘 단일재질의 아웃링
- 제 5항에 있어서,원형의 작은 홈(130)은 넓은면을 가지는 파여진 홈이 아니라 선형으로 구성되는 것을 포함하는 실리콘 단일재질의 아웃링
Priority Applications (7)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR1020060072177A KR100744639B1 (ko) | 2006-07-31 | 2006-07-31 | 실리콘 단일재질의 플라즈마 챔버 캐소드 및 아웃링 |
| PCT/KR2006/003472 WO2008016200A1 (en) | 2006-07-31 | 2006-09-01 | Plasma chamber cathode and outer ring made of silicon material |
| CN2006800381793A CN101288160B (zh) | 2006-07-31 | 2006-09-01 | 由硅材料制成的等离子室阴极和外环 |
| US12/089,010 US20080265737A1 (en) | 2006-07-31 | 2006-09-01 | Plasma Chamber Cathode and Outer Ring Made of Silicon Material |
| EP06798618A EP2047503A4 (en) | 2006-07-31 | 2006-09-01 | PLASMA CHAMBER MATERIAL MANUFACTURED FROM SILICON MATERIAL AND SUCH OUTER RING |
| JP2009522696A JP2009545874A (ja) | 2006-07-31 | 2006-09-01 | シリコン単一材質のプラズマチャンバーカソード及びアウトリング |
| TW096127906A TW200830404A (en) | 2006-07-31 | 2007-07-30 | Plasma chamber cathode and outer ring of silicon material |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR1020060072177A KR100744639B1 (ko) | 2006-07-31 | 2006-07-31 | 실리콘 단일재질의 플라즈마 챔버 캐소드 및 아웃링 |
Related Child Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR2020060020627U Division KR200429095Y1 (ko) | 2006-08-01 | 2006-08-01 | 실리콘 단일재질의 플라즈마 챔버 캐소드 및 아웃링 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| KR100744639B1 true KR100744639B1 (ko) | 2007-08-07 |
Family
ID=38601472
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020060072177A Active KR100744639B1 (ko) | 2006-07-31 | 2006-07-31 | 실리콘 단일재질의 플라즈마 챔버 캐소드 및 아웃링 |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US20080265737A1 (ko) |
| EP (1) | EP2047503A4 (ko) |
| JP (1) | JP2009545874A (ko) |
| KR (1) | KR100744639B1 (ko) |
| CN (1) | CN101288160B (ko) |
| TW (1) | TW200830404A (ko) |
| WO (1) | WO2008016200A1 (ko) |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0379026A (ja) * | 1989-08-23 | 1991-04-04 | Hitachi Ltd | ドライエッチング装置 |
| KR20000021283A (ko) * | 1998-09-28 | 2000-04-25 | 윤종용 | 세라믹 배플을 갖춘 반도체 제조 장치 |
| US6506254B1 (en) * | 2000-06-30 | 2003-01-14 | Lam Research Corporation | Semiconductor processing equipment having improved particle performance |
| KR20030012828A (ko) * | 2002-11-18 | 2003-02-12 | 코리아세미텍 주식회사 | 웨이퍼 에칭용 전극 및 그 제조방법 |
Family Cites Families (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4401689A (en) * | 1980-01-31 | 1983-08-30 | Rca Corporation | Radiation heated reactor process for chemical vapor deposition on substrates |
| US4761134B1 (en) * | 1987-03-30 | 1993-11-16 | Silicon carbide diffusion furnace components with an impervious coating thereon | |
| DE4002327A1 (de) * | 1990-01-26 | 1991-08-01 | Wacker Chemitronic | Verfahren zur nasschemischen behandlung von halbleiteroberflaechen und loesung zu seiner durchfuehrung |
| US5074456A (en) * | 1990-09-18 | 1991-12-24 | Lam Research Corporation | Composite electrode for plasma processes |
| JPH07335635A (ja) * | 1994-06-10 | 1995-12-22 | Souzou Kagaku:Kk | 平行平板形ドライエッチング装置 |
| WO1996009899A1 (en) * | 1994-09-26 | 1996-04-04 | E.R. Squibb & Sons, Inc. | Stainless steel acid treatment |
| JPH08186094A (ja) * | 1994-12-28 | 1996-07-16 | Sumitomo Metal Ind Ltd | プラズマ処理装置 |
| US6159297A (en) * | 1996-04-25 | 2000-12-12 | Applied Materials, Inc. | Semiconductor process chamber and processing method |
| JP3676680B2 (ja) * | 2001-01-18 | 2005-07-27 | 東京エレクトロン株式会社 | プラズマ装置及びプラズマ生成方法 |
| JP2003224113A (ja) * | 2002-01-31 | 2003-08-08 | Ibiden Co Ltd | プラズマエッチング装置のガス吹き出し板 |
| US6821347B2 (en) * | 2002-07-08 | 2004-11-23 | Micron Technology, Inc. | Apparatus and method for depositing materials onto microelectronic workpieces |
| US7581511B2 (en) * | 2003-10-10 | 2009-09-01 | Micron Technology, Inc. | Apparatus and methods for manufacturing microfeatures on workpieces using plasma vapor processes |
| US7645341B2 (en) * | 2003-12-23 | 2010-01-12 | Lam Research Corporation | Showerhead electrode assembly for plasma processing apparatuses |
-
2006
- 2006-07-31 KR KR1020060072177A patent/KR100744639B1/ko active Active
- 2006-09-01 JP JP2009522696A patent/JP2009545874A/ja active Pending
- 2006-09-01 US US12/089,010 patent/US20080265737A1/en not_active Abandoned
- 2006-09-01 WO PCT/KR2006/003472 patent/WO2008016200A1/en not_active Ceased
- 2006-09-01 CN CN2006800381793A patent/CN101288160B/zh not_active Expired - Fee Related
- 2006-09-01 EP EP06798618A patent/EP2047503A4/en not_active Withdrawn
-
2007
- 2007-07-30 TW TW096127906A patent/TW200830404A/zh unknown
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0379026A (ja) * | 1989-08-23 | 1991-04-04 | Hitachi Ltd | ドライエッチング装置 |
| KR20000021283A (ko) * | 1998-09-28 | 2000-04-25 | 윤종용 | 세라믹 배플을 갖춘 반도체 제조 장치 |
| US6506254B1 (en) * | 2000-06-30 | 2003-01-14 | Lam Research Corporation | Semiconductor processing equipment having improved particle performance |
| KR20030012828A (ko) * | 2002-11-18 | 2003-02-12 | 코리아세미텍 주식회사 | 웨이퍼 에칭용 전극 및 그 제조방법 |
Also Published As
| Publication number | Publication date |
|---|---|
| WO2008016200A1 (en) | 2008-02-07 |
| US20080265737A1 (en) | 2008-10-30 |
| JP2009545874A (ja) | 2009-12-24 |
| CN101288160A (zh) | 2008-10-15 |
| EP2047503A4 (en) | 2009-12-23 |
| CN101288160B (zh) | 2011-02-23 |
| EP2047503A1 (en) | 2009-04-15 |
| TW200830404A (en) | 2008-07-16 |
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