KR100663159B1 - Tester of power module - Google Patents

Abstract

The present invention relates to a test apparatus for a power module, and when testing a large frequency device of low frequency, such as a power module that optimizes the utilization efficiency of power energy, it is possible to avoid the manual test through expensive high-precision equipment or instruments. As a result, the high voltage, high current, and switching characteristics of the large power device can be tested to reduce the cost and time for the test, thereby reducing the manufacturing cost and improving the yield.

Power Module, High Power Device, Test Device, ATE, High Voltage, High Current

Description

Test module of power module {TESTER OF POWER MODULE}             

1 is a block diagram showing a test apparatus of a power module according to the present invention.

Figure 2 is an embodiment implementing the test device of the power module according to the present invention made as described above.

   -Explanation of symbols for the main parts of the drawings-

10: computer station 20: test module unit

21: power supply module 22: arbitrary waveform generation module

23: low frequency digitizer module 24: sampling module

25: high voltage module 26: high current module

27: calibration module 30: station multiplexer

40: test head 45: device socket

50: device

The present invention relates to a test apparatus for a power module, and more particularly, when testing a large frequency device of low frequency, such as a power module that optimizes the efficiency of using power energy, a manual test using expensive high-precision equipment or a measuring instrument. The present invention relates to a test apparatus for a power module that can automatically test high voltage, high current, switching characteristics, and the like of a large power device.

The power module is a complex semiconductor that connects several semiconductor chips according to purpose and purpose, and is housed in one package. According to the type of the main chip, a diode module, a MOSFET module, and an intelligent power module ; IPM).

These power modules are large power devices that can optimize the use efficiency of power energy. Industrial fields such as inverters, UPS, welding machines, and plasma display panels are used in all fields where power is used; It is used in digital media products such as PDP).

In order to test the power module, such a large power device, high voltage, high current characteristics, and switching characteristics are tested. The switching characteristics generally have low frequency characteristics.

By the way. Automatic Test Equipment (ATE), which is a test device for testing semiconductor devices, automatically outputs high-speed data speeds of 1 GHz such as RF devices and video devices that require high technology. It is a mixed tester with many channels and high precision and resolution. It is an expensive device that can test not only logic IC and analog IC but also mixed IC with logic and analog. There is a problem that is too expensive to do.

Meanwhile, an analog IC tester is a device for testing devices having low frequency switching characteristics without requiring a relatively high technology such as TR, LED, DIODE, MOSFET, and thyristor for industrial or consumer use.

These analog IC testers consist of basic DC sources, matrices, muxes, and interface boards, which are applied to extremely limited components to test devices with relatively low switching characteristics.

However, in the case of such an analog IC tester, since the DC source is 60V and 200mA, it cannot provide a high voltage of 1,200V or a high current of 100A for testing a large power device and cannot test it. There is a problem that the productivity is lowered by manually testing the module.

SUMMARY OF THE INVENTION The present invention was created to solve the above problems, and an object of the present invention is to provide an expensive high-precision device or an instrument when testing low frequency large power devices such as power modules that optimize power efficiency. It is to provide a test module of power module that can test high voltage, high current, switching characteristics of large power device automatically by avoiding manual test.

The present invention for realizing the above object is provided with a computer, a keyboard, a display device, a user interface and a storage device for setting and controlling the test process, and for storing and displaying the test results; A test head providing a device socket into which the test device can be mounted and providing an interface to be connected with each pin of the mounted test device; A power supply module for supplying voltage and current to the test module, an arbitrary waveform generation module for generating low frequency arbitrary waveforms, a low frequency digitizer module for sampling and digitizing at low frequency, and an operation waveform of the test device It consists of a sampling module for generating, a high voltage module for generating and measuring a high voltage, and a high current module for generating and measuring a high current. The module is operated under the control of a computer station, and the power supply module outputs voltage and current to the test head. The arbitrary waveform generator module outputs an arbitrary waveform, the high voltage module outputs a high voltage, and the high current module outputs a high current to transfer the test device data to the computer station from the low frequency digitizer module, the sampling module, and the high voltage module and the high current module. Passing test module Wealth; Characterized in that the station multiplexer for setting the input and output path of the signal between the test head and the test module unit.

In the present invention, the test module unit is characterized in that it further comprises a calibration module for measuring the output voltage and current to automatically correct the power supply module when an error occurs in the voltage and current.

Each module of the test module unit in the present invention is characterized in that the removable selectively.

In the present invention, the power supply module is characterized by supplying 60V / 200mA and 60V / 10A.

In the present invention, the waveform generation range of the arbitrary waveform generation module is characterized in that 1Hz ~ 255 KHz.

In the present invention, the sampling clock of the low frequency digitizer module is characterized in that the maximum 20MHz.

In the present invention, the sampling module is characterized in that two channels having a resolution of 0.1ns.

In the present invention, the high voltage module is characterized by being capable of generating and measuring high voltage up to 1,000V / 100mA by Kelvin connection.

In the present invention, the high current module is capable of generating and measuring a high current up to 100 A / 30 V by Kelvin connection.

In the present invention, the station multiplexer is configured by a maximum of 48 relays and a 12-pin matrix controlled by a computer station.

In the present invention, the station multiplexer provides a plurality of stations for connecting with a plurality of test heads.

The present invention made as described above is equipped with a power module operating at a low frequency in the test head and having characteristics of high voltage and high current, and after setting through a station multiplexer to measure input and output signals of the test signal on each pin of the power module, Set a sequence of tests for the station to operate the various modules of the test module to output signals, output the input signals from the computer station through the sampling module, convert them digitally through the low-frequency digitizer module, store them, and The high voltage, high current, and switching characteristics of a large power device can be easily tested by generating, applying, and measuring a high current.

Hereinafter, exemplary embodiments of the present invention will be described with reference to the accompanying drawings. In addition, this embodiment is not intended to limit the scope of the present invention, but is presented by way of example only.

1 is a block diagram showing a test apparatus for a power module according to the present invention, and FIG. 2 is an embodiment for implementing a test apparatus for a power module according to the present invention.

A computer station 10 having a computer 11, a keyboard 12, a display device 13, a user interface (not shown), a storage device 15, and the like, as shown here; A test head 40 providing a device socket 45 to which the test device 50 can be mounted and providing an interface to be connected to each pin of the mounted test device 50; A test module unit 20 operating under the control of the computer station 10 to output a signal to the test head 40 and to transmit measured data to the computer station 10; Characterized in that the station multiplexer 30 for setting the input and output path of the signal between the test head 40 and the test module unit 20.

At this time, the test module unit 20 is a power supply module 21 for supplying 60V / 200mA and 60V / 10A voltage and current to the test module unit, and random for generating an arbitrary waveform with a low frequency of 1Hz ~ 255KHz Sampling waveform generation module 22, low frequency digitizer module 23, which master clock is 62.5 MHz and sampling clock is digitized at a low frequency of up to 20 MHz, and operating waveforms of test device 50 at a resolution of 0.1 ns. 2 channels of sampling module 24 for generating, high voltage module 25 for generating and measuring high voltage up to 1,000 V / 100 mA by Kelvin connection, and high current for measuring and generating high current up to 100 A / 30 V by Kelvin connection It consists of high current modules 26 for the purpose of.

In this case, each module constituting the test module unit 20 may be configured to be selectively detachable and may be inserted or removed according to the test characteristics of the power module.

That is, by configuring each module of the test module unit 20 as a separate board as shown in Figure 2 to be detachable as a slot in the rack 15 it is possible to selectively add and remove test modules. .

In addition, the test module unit 20 further includes a calibration module 27 for automatically calibrating by adjusting the power supply module when an error occurs in the voltage and current by measuring the output voltage and current. It can be measured by overcurrent value.

In addition, the station multiplexer 30 is configured by up to 48 relays and 12-pin matrix controlled by the computer station 10 and consists of two stations ST1 and ST2 for connecting to the plurality of test heads 40. do.

Looking at the operation of the test device of such a power module one by one as follows.

First, in the case of the sampling module 24, the sampling resolution of the two channels is 0.1 ns, and the voltage is sampled at a trigger range of 4095 of 12 bits to measure the waveform through the computer station 10.

The high voltage module 25 adjusts the voltage of 0V to 1000V in the range of 100V or 1000V and adjusts the current in the range of 1V, 10V, 100V, 1V, 10V to output high voltage and measure the high voltage. By the low-frequency digitizer module 23 to be stored and displayed in the computer station (10).

In addition, the high current module 26 adjusts the current of 0A to 100A in the range of 10A or 100A, adjusts the voltage in the range of 3V and 30V, outputs a high current, measures the high current, and digitizes it by the low frequency digitizer module 23. To the computer station 10 for display and display.

As described above, the present invention provides a method of automatically testing a large power device by avoiding manual tests through expensive high-precision equipment or instruments when testing a low frequency large power device such as a power module that optimizes the utilization efficiency of power energy. The benefits include testing high voltages, high currents, and switching characteristics.

In addition, by not using expensive high-precision equipment can reduce the cost for testing has the advantage of lowering the manufacturing cost.                     

In addition, by eliminating manual testing and automatically testing, test time can be shortened, yield can be improved, and mass production is possible.

Claims (11)

A computer station equipped with a computer, a keyboard, a display device, a user interface, a storage device, etc. for setting and controlling a test process and for storing and displaying a test result; A test head providing a device socket to which a test device can be mounted and providing an interface to be connected with each pin of the test device mounted; A power supply module for supplying voltage and current to the test module, an arbitrary waveform generation module for generating low frequency arbitrary waveforms, a low frequency digitizer module for sampling and digitizing at low frequency, and an operation waveform of the test device And a high voltage module for generating and measuring a high voltage, and a high current module for generating and measuring a high current, operating under the control of the computer station. And the arbitrary waveform generation module outputs an arbitrary waveform, the high voltage module outputs a high voltage, and the high current module outputs a high current to supply the test device to the low frequency digitizer module, the sampling module, the high voltage module, and the Side by high current module A test module unit for transmitting predetermined data to the computer station; Station multiplexer for setting the input and output path of the signal between the test head and the test module unit Test module of the power module, characterized in that consisting of. The power module of claim 1, wherein the test module unit further includes a calibration module for measuring the output voltage and current and automatically calibrating the power supply module when an abnormality occurs in the voltage and current. Test equipment. The test apparatus of claim 1, wherein each module of the test module unit is selectively detachable. The apparatus of claim 1, wherein the power supply module supplies 60V / 200mA and 60V / 10A. The test module of claim 1, wherein the waveform generation range of the arbitrary waveform generation module is 1 Hz to 255 KHz. 2. The apparatus of claim 1, wherein a sampling clock of the low frequency digitizer module is at most 20 MHz. The test module of claim 1, wherein the sampling module is two channels having a resolution of 0.1 ns. The test apparatus of claim 1, wherein the high voltage module is capable of generating and measuring a high voltage up to 1,000 V / 100 mA by Kelvin connection. The apparatus of claim 1, wherein the high current module is capable of generating and measuring a high current up to 100 A / 30 V by Kelvin connection. The apparatus of claim 1, wherein the station multiplexer is configured by a maximum of 48 relays and a 12-pin matrix controlled by the computer station. The apparatus of claim 1, wherein the station multiplexer provides a plurality of stations for connecting with the plurality of test heads.

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