CN104422898A - Automatic testing device and testing method thereof - Google Patents
Automatic testing device and testing method thereof Download PDFInfo
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- CN104422898A CN104422898A CN201310395542.9A CN201310395542A CN104422898A CN 104422898 A CN104422898 A CN 104422898A CN 201310395542 A CN201310395542 A CN 201310395542A CN 104422898 A CN104422898 A CN 104422898A
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- Testing Electric Properties And Detecting Electric Faults (AREA)
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Abstract
The invention discloses an automatic testing device. The automatic testing device comprises a power supply, a power module, a digital adjustable resistor and a controller, wherein the power supply is electrically connected with a host; the power module is electrically connected with the power supply and is electrically connected with a machine to be tested; the digital adjustable resistor is electrically connected with the power module; the controller is electrically connected with the digital adjustable resistor, is electrically connected with the host, and is electrically connected with the machine to be tested. According to the automatic testing device, the machine to be tested is arranged in a high-low temperature test chamber, a voltage value to be tested and the temperature to be tested are set, the controller sets the voltage value to be tested by changing the resistance of the digital adjustable resistor, the machine to be tested is started, a test is begun, a journal file is generated after the test is finished, the host collects and saves the journal file, the production cost is reduced and the working efficiency is improved.
Description
Technical field
The present invention relates to a kind of automatic testing equipment and method of testing thereof, particularly relate to a kind of automatic testing equipment and method of testing thereof of testing power supply extreme value.
Background technology
Industrial products need the fail-test of carrying out high/low temperature applied environment usually, the parts of the such as Related product such as electron and electrician, automobile motor and material, especially computing machine, when high and low temperature alternative converts, need to check its property indices, but, the high/low temperature method of testing of current computing machine is mainly directly electrically connected with board to be measured by direct voltage source, then with regulating magnitude of voltage to be measured manually, as this increased a large amount of manpowers, in addition, a large amount of time to be wasted when regulation voltage level, make work efficiency drop.
In view of this, be necessary to provide a kind of automatic testing equipment and method of testing thereof in fact, this automatic testing equipment and method of testing thereof can solve the cost height and inefficient problem that exist in above-mentioned technology.
Summary of the invention
Therefore, the object of the present invention is to provide a kind of automatic testing equipment and method of testing thereof, this automatic testing equipment and method of testing thereof can solve above-mentioned cost height and inefficient problem.
To achieve the above object, automatic testing equipment of the present invention, it is for testing power supply extreme value, and this automatic detection device comprises a main frame; One high-low temperature test chamber, this high-low temperature test chamber and described main frame are electrically connected; And some boards to be measured, it is placed in described high-low temperature test chamber, and this board to be measured is connected with described main frame by a transponder, and this automatic detection device comprises:
Power supply unit, this power supply unit and described main frame are electrically connected, and this power supply unit is for generation of a voltage;
Power module, this power module and described power supply unit are electrically connected, and this power module and described board to be measured are electrically connected, and this power module produces an output voltage, and this output voltage is the test voltage of board to be measured;
Solid relay, this solid relay and described power module are electrically connected, and this solid relay is for changing the output voltage of described power module; And
Controller, itself and described solid relay are electrically connected, this controller and described main frame are electrically connected, and this controller and described board to be measured are electrically connected, main frame sends setting voltage value signal to be measured to controller, this controller receives this setting voltage value signal to be measured, then controller is opened board to be measured and is set the resistance of solid relay, a magnitude of voltage to be measured is produced to make power module, this magnitude of voltage to be measured is input to above-mentioned board to be measured, board to be measured runs in the high-low temperature test chamber of design temperature, described host record test result.
A kind of automatic test approach, this method of testing comprises the steps:
S1: main frame is opened a test document and opened a power supply device;
S2: the test voltage setting some boards to be measured, and set the temperature to be tested in high-low temperature test chamber;
S3: controller opens described board to be measured, then board accessing system to be measured;
S4: board to be measured starts test according to the content of test document;
S5: board test to be measured terminates to generate a journal file, and main frame is collected and preserved this journal file;
S6: board to be measured publishes system, then closes board to be measured;
S7: judge whether board to be measured completes content measurements all in described test document, if do not complete all content measurements, then change magnitude of voltage to be measured, and the temperature changed in high-low temperature test chamber, then turn back to step S3 to perform in turn, if complete all content measurements, then terminate test.
Compared to prior art, automatic testing equipment of the present invention, by arranging controller, itself and solid relay are electrically connected, solid relay and power module are electrically connected, power module and power supply unit are electrically connected, board to be measured is placed in high-low temperature test chamber, and board to be measured is electrically connected by a transponder and main frame, this main frame and power supply unit are electrically connected, main frame opens test document and power-on supply power supply, testing temperature is treated in high-low temperature test chamber setting, controller arranges magnitude of voltage to be measured by the resistance changing solid relay, then board to be measured is opened, board to be measured brings into operation according to the content in test document, by generation one journal file after test terminates, main frame is collected and is preserved this journal file, last powered-down supply, automatic testing equipment of the present invention not only reduces production cost, and improve work efficiency.
[accompanying drawing explanation]
Fig. 1 illustrates the structural representation of automatic testing equipment of the present invention.
Fig. 2 illustrates the process flow diagram of automatic test approach of the present invention.[embodiment]
Refer to Fig. 1 and Fig. 2, be respectively the structural representation of automatic testing equipment of the present invention and the process flow diagram of automatic test approach of the present invention.
Automatic testing equipment of the present invention, it, for testing power supply extreme value, refers to Fig. 1, and this automatic detection device comprises a main frame 10; One high-low temperature test chamber 20, this high-low temperature test chamber 20 is electrically connected with described main frame 10; And some boards to be measured 201, it is placed in described high-low temperature test chamber 20, and this board 201 to be measured is connected with described main frame 10 by a transponder 30, and this automatic detection device also comprises:
Power supply unit 40, this power supply unit 40 is electrically connected with described main frame 10, and this power supply unit 40 is for generation of a voltage, and in the present embodiment, this power supply unit 40 is 48V DC power supply;
Power module 50, this power module 50 is electrically connected with described power supply unit 40, and this power module 50 is electrically connected with described board 201 to be measured, and this power module 50 produces an output voltage, and this output voltage is the test voltage of board 201 to be measured;
Solid relay 60, this solid relay 60 is electrically connected with described power module 50, and this solid relay 60 is for changing the output voltage of described power module 50; And
Controller 70, itself and described solid relay 60 are electrically connected, this controller 70 is electrically connected with described main frame 10, and this controller 70 is electrically connected with described board 201 to be measured, in the present embodiment, described controller 70 comprises a single-chip microcomputer, main frame 10 sends setting voltage value signal to be measured to controller 70, this controller 70 receives this setting voltage value signal to be measured, then controller 70 is opened board 201 to be measured and is set the resistance of solid relay 60, a magnitude of voltage to be measured is produced to make power module 50, this magnitude of voltage to be measured is input to above-mentioned board to be measured 201, board 201 to be measured runs in the high-low temperature test chamber 20 of design temperature, described main frame 10 logging test results.
A kind of automatic test approach, refer to Fig. 2, this method of testing comprises the steps:
S1: main frame 10 is opened a test document and opened a power supply device;
S2: the test voltage setting some boards to be measured 201, and set the temperature to be tested in high-low temperature test chamber 20;
S3: described board to be measured 201 opened by controller 70, then board 201 accessing system to be measured;
S4: board 201 to be measured starts test according to the content of test document;
S5: board 201 test to be measured terminates to generate a journal file, and main frame 10 is collected and preserved this journal file;
S6: board 201 to be measured publishes system, then closes board 201 to be measured;
S7: judge whether board 201 to be measured completes content measurements all in test document, if do not complete all content measurements, then change magnitude of voltage to be measured, and the temperature changed in high-low temperature test chamber 20, then step S3 is turned back to, if complete all content measurements, then terminate test.
In the present embodiment, comprise before described step S1: the test request option setting board 201 to be measured.
In the present embodiment, described step S1 specifically comprises step:
Described test document opened by main frame 10;
Whether main frame 10 detects power supply device normal, and whether the state detecting high-low temperature test chamber 20 is normal;
If the working state abnormal of power supply device or high-low temperature test chamber 20, stop test, check power supply device and high-low temperature test chamber 20, if the duty of power supply device and high-low temperature test chamber 20 is all normal, then power-on charger.
In the present embodiment, described step S2 specifically comprises step:
Main frame 10 sends setting voltage value signal to be measured to controller 70;
Controller 70 receives described setting voltage value signal to be measured, and then controller 70 changes the resistance of solid relay 60, to make the output voltage of power module 50 identical with magnitude of voltage to be measured;
Main frame 10 sends the signal of design temperature to high-low temperature test chamber 20;
High-low temperature test chamber 20 receives the signal of described design temperature, then the temperature in high-low temperature test chamber 20 is adjusted to temperature to be tested.
Compared to prior art, automatic testing equipment of the present invention, by arranging controller 70, itself and solid relay 60 are electrically connected, solid relay 60 and power module 50 are electrically connected, power module 50 and power supply unit 40 are electrically connected, board 201 to be measured is placed in high-low temperature test chamber 20, and board 201 to be measured is electrically connected with main frame 10 by a transponder 30, this main frame 10 is electrically connected with power supply unit 40, main frame 10 opens test document and power-on supply 40 power supply, testing temperature is treated in high-low temperature test chamber 20 setting, controller 70 arranges magnitude of voltage to be measured by the resistance changing solid relay 60, then board 201 to be measured is opened, board 201 to be measured brings into operation according to the content in test document, by generation one journal file after test terminates, main frame 10 is collected and is preserved this journal file, last powered-down supply 40, automatic testing equipment of the present invention not only reduces production cost, and improve work efficiency.
Claims (7)
1. an automatic testing equipment, it is for testing power supply extreme value, and this automatic detection device comprises a main frame; One high-low temperature test chamber, this high-low temperature test chamber and described main frame are electrically connected; And some boards to be measured, it is placed in described high-low temperature test chamber, and this board to be measured is connected with described main frame by a transponder, it is characterized in that, this automatic detection device comprises:
Power supply unit, this power supply unit and described main frame are electrically connected, and this power supply unit is for generation of a voltage;
Power module, this power module and described power supply unit are electrically connected, and this power module and described board to be measured are electrically connected, and this power module produces an output voltage, and this output voltage is the test voltage of board to be measured;
Solid relay, this solid relay and described power module are electrically connected, and this solid relay is for changing the output voltage of described power module; And
Controller, itself and described solid relay are electrically connected, this controller and described main frame are electrically connected, and this controller and described board to be measured are electrically connected, main frame sends setting voltage value signal to be measured to controller, this controller receives this setting voltage value signal to be measured, then controller is opened board to be measured and is set the resistance of solid relay, a magnitude of voltage to be measured is produced to make power module, this magnitude of voltage to be measured is input to above-mentioned board to be measured, board to be measured runs in the high-low temperature test chamber of design temperature, described host record test result.
2. automatic testing equipment according to claim 1, is characterized in that, described power supply unit is 48V DC power supply.
3. automatic detection device according to claim 1, is characterized in that, described controller comprises a single-chip microcomputer.
4. an automatic test approach, is characterized in that, this method of testing comprises the steps:
S1: main frame is opened a test document and opened a power supply device;
S2: the test voltage setting some boards to be measured, and set the temperature to be tested in high-low temperature test chamber;
S3: controller opens described board to be measured, then board accessing system to be measured;
S4: board to be measured starts test according to the content of test document;
S5: board test to be measured terminates to generate a journal file, and main frame is collected and preserved this journal file;
S6: board to be measured publishes system, then closes board to be measured;
S7: judge whether board to be measured completes content measurements all in described test document, if do not complete all content measurements, then change magnitude of voltage to be measured, and the temperature changed in high-low temperature test chamber, then turn back to step S3 to perform in turn, if complete all content measurements, then terminate test.
5. automatic test approach according to claim 4, is characterized in that, comprises before described step S1: the test request option setting board to be measured.
6. automatic test approach according to claim 4, is characterized in that, described step S1 specifically comprises step:
Described test document opened by main frame;
Whether Host Detection power supply device is normal, and whether the state detecting high-low temperature test chamber is normal;
If the working state abnormal of power supply device or high-low temperature test chamber, stop test, check power supply device and high-low temperature test chamber, if the duty of power supply device and high-low temperature test chamber is all normal, then power-on charger.
7. automatic testing method according to claim 4, is characterized in that, described step S2 specifically comprises step:
Main frame sends setting voltage value signal to be measured to controller;
Controller receives described setting voltage value signal to be measured, and then controller changes the resistance of solid relay, to make the output voltage of power module identical with magnitude of voltage to be measured;
Main frame sends the signal of design temperature to high-low temperature test chamber;
High-low temperature test chamber receives the signal of described design temperature, then the temperature in high-low temperature test chamber is adjusted to temperature to be tested.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
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| CN201310395542.9A CN104422898A (en) | 2013-09-03 | 2013-09-03 | Automatic testing device and testing method thereof |
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| CN201310395542.9A CN104422898A (en) | 2013-09-03 | 2013-09-03 | Automatic testing device and testing method thereof |
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| CN105260276A (en) * | 2015-10-27 | 2016-01-20 | 浪潮电子信息产业股份有限公司 | Reliability testing method for applying multiple stresses to server |
| CN110031710A (en) * | 2019-05-08 | 2019-07-19 | 长虹美菱股份有限公司 | One kind judging automatically switching on and shutting down point test device and its control method for refrigerator |
| CN111693803A (en) * | 2020-05-26 | 2020-09-22 | 日立楼宇技术（广州）有限公司 | High-low temperature damp-heat test system, test control method and fault protection method |
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Application publication date: 20150318 |