KR100646552B1 - 파라데이컵을 이용한 선량 변화 측정장치 - Google Patents
파라데이컵을 이용한 선량 변화 측정장치 Download PDFInfo
- Publication number
- KR100646552B1 KR100646552B1 KR1020050132546A KR20050132546A KR100646552B1 KR 100646552 B1 KR100646552 B1 KR 100646552B1 KR 1020050132546 A KR1020050132546 A KR 1020050132546A KR 20050132546 A KR20050132546 A KR 20050132546A KR 100646552 B1 KR100646552 B1 KR 100646552B1
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- KR
- South Korea
- Prior art keywords
- faraday cup
- ion beam
- generating member
- electromagnetic field
- field generating
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
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Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/30—Electron-beam or ion-beam tubes for localised treatment of objects
- H01J37/304—Controlling tubes by information coming from the objects or from the beam, e.g. correction signals
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/244—Detectors; Associated components or circuits therefor
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/244—Detection characterized by the detecting means
- H01J2237/24405—Faraday cages
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/30—Electron or ion beam tubes for processing objects
- H01J2237/317—Processing objects on a microscale
- H01J2237/31701—Ion implantation
- H01J2237/31703—Dosimetry
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- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Measurement Of Radiation (AREA)
- Electron Sources, Ion Sources (AREA)
Abstract
Description
Claims (5)
- 이온 빔의 흐름을 측정함으로써 선량 변화를 제어하기 위한 파라데이컵을 이용한 선량 변화 측정장치에 있어서,유동하는 이온 빔(1)을 굴절시키는 전자계 발생부재(10);상기 전자계 발생부재(10)에 의해 굴절되는 이온 빔(1)을 포집하는 파라데이컵(20);상기 파라데이컵(20)에 포집된 이온 빔(1)을 판독하는 판독기(30); 및중성의 불순물(2)을 포집하여 측정하기 위한 불순물 측정기(40);를 포함하는 것을 특징으로 하는 파라데이컵을 이용한 선량 변화 측정장치.
- 제1항에 있어서, 상기 전자계 발생부재(10)는 전기장인 것을 특징으로 하는 파라데이컵을 이용한 선량 변화 측정장치.
- 제1항에 있어서, 상기 전자계 발생부재(10)는 자기장인 것을 특징으로 하는 파라데이컵을 이용한 선량 변화 측정장치.
- 제1항에 있어서, 상기 불순물 측정기(40)에 의한 불순물(2)의 측정은 적외선의 발광 및 수광의 변화를 검출하여 이루어지는 것을 특징으로 하는 파라데이컵을 이용한 선량 변화 측정장치.
- 제1항에 있어서, 상기 불순물 측정기(40)에 의한 불순물(2)의 측정은 아노드 또는 캐소드의 전하량 변화를 검출하여 이루어지는 것을 특징으로 하는 파라데이컵을 이용한 선량 변화 측정장치.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR1020050132546A KR100646552B1 (ko) | 2005-12-28 | 2005-12-28 | 파라데이컵을 이용한 선량 변화 측정장치 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR1020050132546A KR100646552B1 (ko) | 2005-12-28 | 2005-12-28 | 파라데이컵을 이용한 선량 변화 측정장치 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| KR100646552B1 true KR100646552B1 (ko) | 2006-11-15 |
Family
ID=37654705
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020050132546A Expired - Fee Related KR100646552B1 (ko) | 2005-12-28 | 2005-12-28 | 파라데이컵을 이용한 선량 변화 측정장치 |
Country Status (1)
| Country | Link |
|---|---|
| KR (1) | KR100646552B1 (ko) |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2000311867A (ja) | 1999-04-27 | 2000-11-07 | Nissin Electric Co Ltd | ビーム量測定方法および測定装置 |
| KR100397028B1 (ko) | 1997-07-12 | 2003-11-28 | 액셀리스 테크놀로지스, 인크. | 이온주입시스템에서이온빔의중성입자를검출하는방법및장치 |
| KR100402183B1 (ko) | 1997-01-17 | 2004-03-20 | 액셀리스 테크놀로지스, 인크. | 이온주입기에서사용하는주입량제어장치및방법 |
-
2005
- 2005-12-28 KR KR1020050132546A patent/KR100646552B1/ko not_active Expired - Fee Related
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR100402183B1 (ko) | 1997-01-17 | 2004-03-20 | 액셀리스 테크놀로지스, 인크. | 이온주입기에서사용하는주입량제어장치및방법 |
| KR100397028B1 (ko) | 1997-07-12 | 2003-11-28 | 액셀리스 테크놀로지스, 인크. | 이온주입시스템에서이온빔의중성입자를검출하는방법및장치 |
| JP2000311867A (ja) | 1999-04-27 | 2000-11-07 | Nissin Electric Co Ltd | ビーム量測定方法および測定装置 |
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