KR100636864B1 - 다중 출력 프로그래머블 기준 전압원 - Google Patents

다중 출력 프로그래머블 기준 전압원 Download PDF

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Publication number
KR100636864B1
KR100636864B1 KR1020007003316A KR20007003316A KR100636864B1 KR 100636864 B1 KR100636864 B1 KR 100636864B1 KR 1020007003316 A KR1020007003316 A KR 1020007003316A KR 20007003316 A KR20007003316 A KR 20007003316A KR 100636864 B1 KR100636864 B1 KR 100636864B1
Authority
KR
South Korea
Prior art keywords
reference voltage
charging current
sample hold
level
output
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
KR1020007003316A
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English (en)
Korean (ko)
Other versions
KR20010024327A (ko
Inventor
질렛게리시.
Original Assignee
크레던스 시스템스 코포레이션
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 크레던스 시스템스 코포레이션 filed Critical 크레던스 시스템스 코포레이션
Publication of KR20010024327A publication Critical patent/KR20010024327A/ko
Application granted granted Critical
Publication of KR100636864B1 publication Critical patent/KR100636864B1/ko
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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Classifications

    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05F—SYSTEMS FOR REGULATING ELECTRIC OR MAGNETIC VARIABLES
    • G05F1/00—Automatic systems in which deviations of an electric quantity from one or more predetermined values are detected at the output of the system and fed back to a device within the system to restore the detected quantity to its predetermined value or values, i.e. retroactive systems
    • G05F1/10—Regulating voltage or current 
    • G05F1/46—Regulating voltage or current  wherein the variable actually regulated by the final control device is DC
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05F—SYSTEMS FOR REGULATING ELECTRIC OR MAGNETIC VARIABLES
    • G05F1/00—Automatic systems in which deviations of an electric quantity from one or more predetermined values are detected at the output of the system and fed back to a device within the system to restore the detected quantity to its predetermined value or values, i.e. retroactive systems
    • G05F1/10—Regulating voltage or current 
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31924—Voltage or current aspects, e.g. driver, receiver
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2836—Fault-finding or characterising
    • G01R31/2839—Fault-finding or characterising using signal generators, power supplies or circuit analysers
    • G01R31/2841—Signal generators
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
    • G01R31/31908—Tester set-up, e.g. configuring the tester to the device under test [DUT], down loading test patterns

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Radar, Positioning & Navigation (AREA)
  • Automation & Control Theory (AREA)
  • General Engineering & Computer Science (AREA)
  • Analogue/Digital Conversion (AREA)
  • Control Of Voltage And Current In General (AREA)
KR1020007003316A 1997-09-29 1998-09-28 다중 출력 프로그래머블 기준 전압원 Expired - Fee Related KR100636864B1 (ko)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US08/939,572 1997-09-29
US08/939,572 US5905403A (en) 1997-09-29 1997-09-29 Multiple output programmable reference voltage source
PCT/US1998/020378 WO1999017179A1 (en) 1997-09-29 1998-09-28 Multiple output programmable reference voltage source

Publications (2)

Publication Number Publication Date
KR20010024327A KR20010024327A (ko) 2001-03-26
KR100636864B1 true KR100636864B1 (ko) 2006-10-19

Family

ID=25473395

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020007003316A Expired - Fee Related KR100636864B1 (ko) 1997-09-29 1998-09-28 다중 출력 프로그래머블 기준 전압원

Country Status (5)

Country Link
US (1) US5905403A (https=)
EP (1) EP1025476A4 (https=)
JP (1) JP2001518654A (https=)
KR (1) KR100636864B1 (https=)
WO (1) WO1999017179A1 (https=)

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6374379B1 (en) * 1999-02-05 2002-04-16 Teradyne, Inc. Low-cost configuration for monitoring and controlling parametric measurement units in automatic test equipment
US6282682B1 (en) 1999-02-05 2001-08-28 Teradyne, Inc. Automatic test equipment using sigma delta modulation to create reference levels
US6449669B1 (en) * 1999-08-30 2002-09-10 Intel Corporation Method and apparatus for providing bimodal voltage references for differential signaling
US6321282B1 (en) * 1999-10-19 2001-11-20 Rambus Inc. Apparatus and method for topography dependent signaling
US6577179B2 (en) * 1999-11-15 2003-06-10 Intel Corporation Dynamic line termination with self-adjusting impedance
US6766484B2 (en) * 2002-10-15 2004-07-20 Sun Microsystems, Inc. Method and apparatus for fully characterizing propagation delay through an n-input circuit
KR100546327B1 (ko) 2003-06-03 2006-01-26 삼성전자주식회사 피드백 제어 시스템 및 방법
CN101739995B (zh) * 2008-11-06 2012-07-18 瑞昱半导体股份有限公司 脚位共用的模拟前端处理装置及其脚位共用方法
US8990592B2 (en) * 2012-01-25 2015-03-24 Smsc Holdings S.A.R.L. Overcoming limited common-mode range for USB systems
JP6159190B2 (ja) * 2013-08-05 2017-07-05 日置電機株式会社 定電流発生回路、定電流発生装置、および定電流発生方法、並びに、抵抗測定装置、および、抵抗測定方法
KR102430386B1 (ko) * 2015-12-31 2022-08-09 엘지디스플레이 주식회사 유기발광표시장치, 데이터 드라이버 및 샘플 홀드 회로
WO2021092537A1 (en) 2019-11-08 2021-05-14 Fohtung Edwin High-voltage power supply system
CN119597092A (zh) * 2024-12-05 2025-03-11 北京芯算科技有限公司 一种光芯片高精度电压源矩阵自校正方法

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5170158A (en) * 1989-06-30 1992-12-08 Kabushiki Kaisha Toshiba Display apparatus
US5510748A (en) * 1994-01-18 1996-04-23 Vivid Semiconductor, Inc. Integrated circuit having different power supplies for increased output voltage range while retaining small device geometries
US5694063A (en) * 1994-08-11 1997-12-02 Ltx Corporation High speed IDDQ monitor circuit

Also Published As

Publication number Publication date
EP1025476A1 (en) 2000-08-09
WO1999017179A1 (en) 1999-04-08
JP2001518654A (ja) 2001-10-16
KR20010024327A (ko) 2001-03-26
EP1025476A4 (en) 2005-07-13
US5905403A (en) 1999-05-18

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