KR100620059B1 - Automatic test device of electronic interlocking device and control method - Google Patents

Abstract

The present invention uses the switch matrix and the test jig to automatically connect the power supply, measuring instrument and load to the input card and output card, and automatically read the response signal to reduce the time and effort for the test, the automatic interlock device An apparatus and a control method thereof, comprising: a switch matrix (12) comprising a plurality of switches; A test jig 13 installed to operate in the same manner as the card under test is installed in the electronic interlocking device; A power supply (14) for supplying power to the port of the card under test through the switch matrix (12) and displaying the strength of the voltage and current supplied thereto; A load 15 connected to the output port of the card under test through the switch matrix 12; The switch matrix 12 is controlled to connect and control each port of the card under test to the power supply 14 and the load 15 so as to change the supply power and react the voltage of each port according to the change of the power. And a control computer 11 which reads and stores the reaction current, changes the power supplied to the load 15 from each output port, and measures and stores the cutoff voltage for measuring the input card and the output card. This will save you time and effort.

Electronic Interlock, Switch Matrix, VME, Input Card, Output Card, Test

Description

Auto-testing device for electronic interlocking system and control method             

1 is a block diagram showing a configuration of a general electronic interlocking apparatus;

2 is a block diagram showing the configuration of an automatic test apparatus for an electronic interlocking apparatus according to the present invention;

3 is a diagram illustrating a method of measuring a current of a load using a switch matrix;

4 is a switch state diagram of a switch matrix for testing an input card with a test apparatus according to the present invention;

5 is a switch state diagram of a switch matrix for testing an output card with a test apparatus according to the present invention;

6A and 6B are flowcharts illustrating a method for testing an input card of an electronic interlocking apparatus according to the present invention;

7 is a flowchart showing a method of testing an output card of the electronic interlocking apparatus according to the present invention.

<Description of Symbols for Main Parts of Drawings>

11: Control computer 12: Switch matrix 13: Test jig

14: Power supply 15: Load 16: Input card

17: output card

The present invention relates to an automatic test apparatus for an electronic interlocking device and a control method thereof, and in particular, by using a switch matrix and a test jig to automatically connect a power supply, a measuring instrument, and a load to an input card and an output card, and automatically read a response signal. The present invention relates to an automatic test apparatus for an electronic interlocking apparatus and a control method thereof, which can reduce the time and effort for testing.

Trains that run on railroads, including electric railways, move on fixed rails, but they do not move by setting directions on the trains themselves, but trains in the ground facilities check their destinations and transit times to set the course.

In the past, when setting the course, the route had to be manually changed in the field. However, with the development of control technology, it is possible to change the course of the train simply and safely by using an electric train and using an electronic interlock device that controls it centrally.

1 is a block diagram showing the configuration of a general electronic interlocking apparatus.

The interlocking logic unit 1 functions to interlock, control buses and input / output modules, communicate with external devices, monitor and switch over the system. The communication unit 2 communicates between the display control unit 3 and the interlocking logic unit 1. The display control unit 3 transmits the driver's control information to the interlocking logic unit 1 and displays the state of the interlocking device. The relay unit 4 is turned on / off under the control of the interlocking logic unit 1 to operate the track circuit unit 5. The distribution panel 6 buffers a plurality of control signals output from the track circuit unit 5 and outputs them to the plurality of field devices 7, respectively. Each of the field devices 7 operates according to the control signal to control the operation of the train.

As shown in FIG. 1, the electronic interlocking device is composed of a plurality of parts, and its configuration is complicated and functions, and thus, the entire test system cannot be established.

In the related art, since a test is prepared by connecting a wire to a test jig to be tested for each part of the interlocking device, it takes a long time to connect the wire to the jig. In addition, since the test point of the jig and the electronic interlocking device should be connected with a line, a lot of manpower for connecting the line had to be invested.

The test of the electronic interlocking device is an input card test having a plurality of signal input points (up to 32). 1) A test for checking the voltage at which the electronic interlocking device responds while varying the voltage of the input signal; Current measurement test to check the power consumption of the circuit (test to check the operation of the circuit for the input of which current magnitude while increasing the current at the rated voltage), and 3) by applying the maximum allowable input voltage for 10 minutes. Perform a safety test to check the card for damage. In addition, there is a protection circuit operation test for the output circuit with an output card test having a plurality (up to 32) signal output points.

Conventionally, for this test, a test switch was randomly selected from the input / output points of each input card and output card using a manual switch box, and the test jig was separately set according to the circuit configuration of each manufacturer's input / output card. Was manufactured separately and the Jig was used to connect the I / O card under test, the instrument, and the switch box to check the operation of the EUT.

In addition, for the selected test point, 1) In the case of the input card, check the operation state through the jig for connecting the EUT and input the variable voltage corresponding to the input signal by adjusting the power supply device. The input voltage and current were measured using a multimeter or an oscilloscope. 2) In the case of an output card, the voltage and current characteristics were measured using a multimeter or an oscilloscope. It was a level.

As a result, it took time, manpower, and materials to prepare for this, and it was impossible to test all the input / output points of the input / output card, and precise measurement was difficult as the test conditions were set and measured manually.

 The present invention has been proposed to solve the above problems, and an object of the present invention is to provide an automatic test apparatus and control method thereof of an electronic interlocking apparatus that can adjust the magnitude of the input voltage, current and output load.

It is another object of the present invention to provide an automatic test apparatus for an electronic interlocking apparatus and a control method thereof, which can confirm and record the operating state of an electronic interlocking apparatus in real time with respect to a change in an external signal during a test.

Still another object of the present invention is to provide an automatic test apparatus for an electronic interlocking apparatus and a control method thereof capable of accurately measuring the magnitude of the current and the magnitude of the operating voltage of the electronic interlocking device by adjusting the load and the power supply.

Another object of the present invention is to connect the different types of cards and measuring equipment used in the electronic interlocking device using a switch matrix to automatically connect using the same test JIG without mechanical changes by the card-specific function of the electronic interlocking device It is to provide an automatic test device of the electronic interlocking device and a control method thereof.

In order to achieve the above object according to the present invention, the automatic test apparatus of the electronic interlocking apparatus according to the present invention comprises a switch matrix consisting of a plurality of switches; A test jig installed to operate in the same manner as the card under test is installed in the electronic interlocking device; A voltage meter / current meter for measuring a voltage / current of a test point connected to a corresponding jig through the switch matrix; A load connected to the test jig via the switch matrix; The switch matrix is controlled to connect and control each port of the test target card to the power supply and the load to change the supply power and read and store the reaction voltage and the reaction current of each port according to the change of the power supply. It is composed of a control computer for measuring and storing the vehicle cut-off voltage by varying the power supplied to the load from each output port.

The test jig according to the present invention comprises a VME rack having a VME (Versa Module Europa) bus for installing a card under test under the same conditions as a control unit of an electronic interlocking device, and connecting a test jig, a power supply, and a load to a switch matrix. Therefore, it is characterized in that the various types of cards used in the electronic interlocking device are configured to be tested in the same jig without mechanical change.

The automatic test apparatus of the electronic interlocking apparatus according to the present invention is characterized in that serial communication is performed between the control computer and the switch matrix, the control computer and the test jig, the control computer and the power supply, and the control computer and the load.

The automatic test method of the input card of the electronic interlocking device according to the present invention,

(A) performing an initialization process at the same time as applying power and controlling a switch matrix to connect the power supply to the test target port of the input card;

Setting a supply voltage of the power supply to V1 and applying it to a port to be tested, and checking whether a response voltage (VLH) is generated from a test jig;

If the response voltage (VLH) does not occur, increasing the voltage of the power supply by 0.1V applied to the port to be tested, and checking whether the response voltage (VLH) has occurred;

Performing an input response test including repeating a process of reading the response voltage VLH and the response current IHL and storing them in a memory to the last port when the response voltage VLH occurs;

(B) conducting a safety test to determine whether damage occurs by applying a maximum allowable voltage for 10 minutes;

(C) The secondary input response test process of checking the response voltage (VHL) and the response current (IHL) for each input port while reducing the set voltage to V2 in the input response test process, and decreasing the set voltage by 0.1V. Characterized in that consists of.

In the automatic test method of the input card of the electronic interlocking apparatus according to the present invention, the safety test procedure is performed after the first input response test on a plurality of input cards, and then a plurality of input cards at the same time the first input response test is completed. It is characterized by performing in the rack.

The automatic test method of the output card of the electronic interlocking device according to the present invention,

Performing an initialization process at the same time as applying power and controlling a switch of a switch matrix to connect a power supply to a test target port of an output card;

Setting the supply current of the power supply to I1 and applying it to the port under test, and checking whether the voltage of the port under test has dropped to "0" from the test jig;

If the voltage does not drop to "0", the supply current of the power supply is increased by 20 mA and applied to the port under test, and the step of returning to the step of applying the supply current to the port under test is repeated. Wow;

When the voltage drops to " 0 ", the process of measuring the breaking current Ioff and reading the value by the communication interface GPIB with the load and storing it in the memory is performed up to the last port.

Hereinafter, with reference to the accompanying drawings, preferred embodiments of the present invention will be described in detail.

2 is a block diagram showing the configuration of an automatic test apparatus for an electronic interlocking apparatus according to the present invention.

A switch matrix 12 composed of a plurality of switches; A test jig 13 to which a test target card of the electronic interlocking device is inserted and connects a plurality of ports of the card to the rows of the switch matrix 12; A power supply (14) for supplying power to the port of the card under test through the switch matrix (12) and displaying the strength of the voltage and current supplied thereto; A load 15 connected to the output port of the card under test through the switch matrix 12; It consists of a control computer 11 for controlling the respective devices.

As shown in FIG. 3, the switch matrix 12 having a plurality of switches arranged in rows and columns to form a lattice state has a plurality of horizontal signal lines 21, 22, and 23 and a plurality of vertical signal lines 24, 25, and the like. At the point where 26) meets, the switches rij (i = 1,2,3, ..., j = 1,2,3, ...) are connected to the plurality of horizontal signal lines 21, 22, 23 and a plurality of verticals. It is connected to each of the signal lines 24, 25, and 26.

A plurality of horizontal signal lines 21, 22, and 23 are used as input terminals, and a plurality of vertical signal lines 24, 25, and 26 are used as output terminals. Also, the switches rij (i = 1,2,3, ..., j = 1,2,3, ...) are normally "off", but receive a control signal from the control computer 11 " On state.

For example, when the switch r12 and the switch r21 are in the "on" state, the load 29 connected to the two vertical signal lines 24 and 25 transfers electricity from the power source 27 through the horizontal signal line 21. It is supplied and connected to the current meter 28 through the horizontal signal line 22. Therefore, the current flowing through the load 29 can be measured by reading the scale of the current meter 28.

4 shows a switch state of the switch matrix for testing the input card with the test apparatus according to the present invention.

The test jig 13 is composed of a VME rack having a VME bus, and the test jig 13 and the power supply 14 and the load 15 are connected to the switch matrix 12 to be used for various types of electro-interlocking devices. The card is configured to be tested in the same jig without mechanical modification so that the input and output cards of the cards are inserted into the rack and the input and output ports of the cards are connected to the switch matrix 12 through the test jig 13. As shown in FIG. 4, the Vcc terminal of the power supply 14 is connected to one row of the switch matrix 12, and the ground terminal of the power supply 14 is connected to two rows. In addition, the "+" terminal of the load 15 is connected to three rows of the switch matrix 12, and the "-" terminal of the load 15 is connected to four rows.

The A0 terminal of port 0 of the input card 16 is connected to the first column of the switch matrix 12, the B0 terminal is connected to the second column, and the C0 terminal is connected to the third column. Similarly, port A1 at port 4 is in the 4th row of switch matrix 12, port B1 is at 5th row, port C1 is at 6th row, ... port 31, port A31 is at line 94 in switch matrix 12, and terminal B31 is Is connected to column 95 and terminal C31 is connected to column 96.

The control computer 11 controls the switch matrix 12 using RS485 communication to turn on the two-row, one-column switch in the "on" state, so that the ground terminal of the power supply 14 is connected to the port of the input card 16. Connect to the A0 terminal of 0, and connect the Vcc terminal of the power supply 14 to the C0 terminal of the port 0 of the input card 16 with the 1 row and 3 column switches turned on.

The power supply 14 is connected to the port 0 of the input card 16 with the two-row, one-column switch and the first-row three-column switch of the switch matrix 12 in the "on" state, and the control computer 11 ) Sets the voltage supplied from the power supply 14 to V1 using a communication interface GPIB, and supplies voltage to port 0 of the input card 16 in increments of 0.1V.

While supplying the voltage by increasing the voltage from V1 by 0.1V, a response voltage VLH occurs in which the input card 16 reacts from "low" to "high". The control computer 11 reads the response voltage VLH and the response current IHL from the test jig 13 and stores it in the memory by using RS232 communication, and stores the 2 row 1 column switch and the 1 row 3 column switch. Set it to "off" to complete the input response test for port 0.

Next, in order to perform an input response test on the port 1, the switch matrix 12 is controlled to turn on the 2-row 4-column switch to "on" so that the ground terminal of the power supply 14 is connected to the input card 16. The Acc terminal of Port 1 is connected, and the Vcc terminal of the power supply 14 is connected to the C1 terminal of Port 1 of the input card 16 with the 1 row 6 column switch turned "on".

In this connection, input response test of port 1 is completed by reading response voltage (VLH) and response current (ILH) of port 1, increasing by 0.1V from V1. After completing the input response test up to port 31 in this manner, perform a safety test to determine whether damage has occurred by applying a maximum allowable voltage (eg 30V) for 10 minutes.

However, if the input response test and the safety test for applying the maximum allowable voltage are applied to one input card for 10 minutes, it is time consuming to wait 10 minutes or more to test another input card.

Therefore, after the input response test is carried out on the 10 input cards, the 10 cards which have been subjected to the input response test are simultaneously inserted into the rack of the test jig 13, and the safety test is performed. If 10 input cards are simultaneously tested for safety, a 10-minute safety test can be performed for 1 minute per card, saving time.

After completing the safety test, perform a secondary input response test to check the response voltage (VHL) and the response current (IHL) for each input port, decreasing by 0.1V from the set voltage V2 (for example, 24V). .

The secondary input response test is identical to the primary input response test except that the response voltage (VHL) and the response current (IHL) are checked for each input port by decreasing 0.1V from the set voltage V2.

Next, in order to test the output card, the output card is inserted into the rack of the test jig 13, and the rated output voltage (e.g., + 24V) and the rated output current (e.g., the power supply 14) are connected to the output card. , 0.5A) in the state of supplying the power output from the output card to the load 15 in the state of increasing the current value by 20 mA to test the protection circuit operation to check the current value to be cut off.

5 shows the switch state of the switch matrix for testing the output card with the test apparatus according to the present invention.

The control computer 11 controls the switch matrix 12 to turn the one-row, one-column switch "on" so that the Vcc terminal of the power supply 14 is connected to the A0 terminal of the port 0 of the output card 17. Connect the 2-row 2-column switch and 4-row 2-column switch to the "on" state, and connect the ground terminal of the power supply 14, the ground terminal of the load 15, and the B0 terminal of the port 0, With the 3-row 3-column switch in the "on" state, the voltage output from the C0 terminal of port 0 of the output card 16 is connected to the Vcc terminal of the load 15.

In this connected state, the control computer 11 controls the power supply 14 by the communication interface GPIB to increase the current supplied from the power supply 14 by 20 mA at I1 by 20 전압 and to apply the voltage to the load 15. The current Ioff falling to "0" is measured and the value is read by the communication interface GPIB with the load 15 and stored in its own memory. Perform this test on the remaining ports to complete the protection circuit operation test on the output card (17).

6A and 6B show a flowchart showing a method for testing an input card of an electronic interlocking apparatus according to the present invention.

Simultaneously with the power on, the monitor, communication interface (GPIB), RS232 and RS485 communication, power supply and instrumentation, test jig, etc. are initialized (step S1), and the switch of the switch matrix 12 is controlled to supply the power supply 14 ) Is connected to port 0 of the input card 16 to set the test target port to port 0 (step S2).

The supply voltage of the power supply 14 is set to V1 and applied to the port 0 determined as the test target port (step S3), and it is checked whether the response voltage VLH is generated from the controller of the test jig 13 (step S4). ).

If the response voltage VLH does not occur, the voltage of the power supply 14 is increased to 0.1V and applied to the port 0 (step S5), and the flow returns to step S4 to check whether the response voltage VLH has occurred.

When the response voltage VLH occurs, the response voltage VLH and the response current IHL are read and stored in the memory (step S6), and it is determined whether it is the last port (step S7). If it is not the last port, return to the test target port setting step S2 and set the next port (port 1) as the test target port and repeat the input response test.

In the case of the last port, a safety test for checking whether damage occurs by applying a maximum allowable voltage (for example, 30 V) for 10 minutes is performed (step S8), and a second input response test is performed (steps S9 to S14). .

The secondary input response test is the same as the primary input response test except that the response voltage (VHL) and the response current (IHL) are checked for each input port by decreasing 0.1V from the set voltage V2.

7 is a flowchart showing a method of testing an output card of the electronic interlocking apparatus according to the present invention.

Perform the initialization process at the same time as the power is applied (step S21), the switch of the switch matrix 12 is controlled to connect the power supply 14 to port 0 of the output card 17 to set the test target port to port 0 (Step S22).

Set the supply current of the power supply 14 to I1 and apply it to the port 0 determined as the test target port (step S23), and confirm that the voltage of the C0 output port has dropped to "0" from the controller of the test jig 13. (Step S24).

If the voltage does not fall to " 0 ", the supply current of the power supply 14 is increased by 20 mA to be applied to the port 0 (step S25), the process returns to step S24 and the following steps are repeated.

When the voltage drops to " 0 ", the breaking current Ioff is measured and the value is read by the communication interface GPIB with the load 15 and stored in its own memory of the control computer 11 (step S26). It is determined whether it is the last port (step S27).

If it is not the last port, return to the test target port setting step S22, set the next port (port 1) as the test target port, and repeat the output response test. For the last port, this test is terminated.

According to the present invention as described above, in order to test the input card and the output card of the electronic interlocking device by using a switch matrix and a test jig by automating the test process to a plurality of input and output points of the input card and the output card measuring instrument and power supply device It is possible to reduce the time and effort for measuring the input card and the output card by automatically connecting and measuring the response signal automatically.

The above description is only a description of specific embodiments of the present invention, and the present invention is not limited to these specific embodiments, and furthermore, various changes and modifications of the configuration are possible from the above-described specific embodiments of the present invention. Those skilled in the art will readily appreciate.

Claims (6)

A switch matrix 12 composed of a plurality of switches; A test jig 13 installed to operate in the same manner as the card under test is installed in the electronic interlocking device; A power supply (14) for supplying power to the port of the card under test through the switch matrix (12) and displaying the strength of the voltage and current supplied thereto; A load 15 connected to the output port of the card under test through the switch matrix 12; The switch matrix 12 is controlled to connect and control each port of the card under test to the power supply 14 and the load 15 so as to change the supply power and react the voltage of each port according to the change of the power. And a control computer 11 which reads and stores the reaction current, changes the power supplied to the load 15 from each output port, and measures and stores the cutoff voltage of the electronic interlocking device. Test equipment. The test jig (13) according to claim 1, wherein the test jig (13) is composed of a VME rack having a VME bus, and is electrically interlocked by connecting the test jig (13), the power supply (14) and the load (15) to the switch matrix (12). An automatic test device for an electronic interlock device, characterized in that the various types of cards used in the device are tested in the same jig without mechanical changes. The method of claim 1, wherein RS-485 serial communication is performed between the control computer 11 and the switch matrix 12, and RS-232 serial communication is performed between the control computer 11 and the test jig 13, And an GPIB communication between the control computer (11) and the power supply (14) and the control computer (11) and the load (15). (A) performing an initialization process at the same time as applying power and controlling the switch matrix 12 to connect the power supply 14 to the test target port of the input card; Setting a supply voltage of the power supply 14 to V1 and applying it to a test target port, and checking whether a response voltage VLH has occurred from the test jig 13; When the response voltage VLH does not occur, increasing the voltage of the power supply 14 by 0.1V and applying it to the test target port, and checking whether the response voltage VLH has occurred is repeated. Steps; Performing an input response test including repeating a process of reading the response voltage VLH and the response current IHL and storing them in a memory to the last port when the response voltage VLH occurs; (B) conducting a safety test to determine whether damage occurs by applying a maximum allowable voltage for 10 minutes; (C) The secondary input response test process of checking the response voltage (VHL) and the response current (IHL) for each input port while reducing the set voltage to V2 in the input response test process, and decreasing the set voltage by 0.1V. Automatic test apparatus control method for an electronic interlock device, characterized in that consisting of. The method of claim 4, wherein the safety test process is performed by performing a first input response test on a plurality of input cards, and then simultaneously inserting a plurality of input cards after the first input response test into a rack of the test jig 13 at the same time. An automatic test device control method for an electronic interlock device, characterized in that. Performing an initialization process at the same time as applying power and controlling the switch of the switch matrix 12 to connect the power supply 14 to the test target port of the output card 17; Setting the supply current of the power supply 14 to I1 and applying it to the port under test, and checking whether the voltage of the port under test falls from the test jig 13 to " 0 "; If the voltage does not drop to "0", the supply current of the power supply 14 is increased by 20 mA and applied to the port under test, and the process returns to the step of applying the supply current to the port under test. Repeating; When the voltage drops to " 0 ", the electronic interlocking device measures the breaking current Ioff, reads the value by the communication interface GPIB with the load 15, and stores it in the memory to the last port. Control method of automatic test equipment.

Images