KR100304649B1 - 집적회로 패키지의 리드핀 납땜 검사방법 및 검사장치 - Google Patents

집적회로 패키지의 리드핀 납땜 검사방법 및 검사장치 Download PDF

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Publication number
KR100304649B1
KR100304649B1 KR1019990003376A KR19990003376A KR100304649B1 KR 100304649 B1 KR100304649 B1 KR 100304649B1 KR 1019990003376 A KR1019990003376 A KR 1019990003376A KR 19990003376 A KR19990003376 A KR 19990003376A KR 100304649 B1 KR100304649 B1 KR 100304649B1
Authority
KR
South Korea
Prior art keywords
image
package
lead pin
input means
image input
Prior art date
Application number
KR1019990003376A
Other languages
English (en)
Korean (ko)
Other versions
KR20000054979A (ko
Inventor
김재선
조용철
Original Assignee
윤종용
삼성전자 주식회사
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 윤종용, 삼성전자 주식회사 filed Critical 윤종용
Priority to KR1019990003376A priority Critical patent/KR100304649B1/ko
Priority to CN00100744A priority patent/CN1264169A/zh
Priority to JP2000025651A priority patent/JP2000228579A/ja
Publication of KR20000054979A publication Critical patent/KR20000054979A/ko
Application granted granted Critical
Publication of KR100304649B1 publication Critical patent/KR100304649B1/ko

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/956—Inspecting patterns on the surface of objects
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/956—Inspecting patterns on the surface of objects
    • G01N2021/95638—Inspecting patterns on the surface of objects for PCB's
    • G01N2021/95646—Soldering

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  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Electric Connection Of Electric Components To Printed Circuits (AREA)
KR1019990003376A 1999-02-02 1999-02-02 집적회로 패키지의 리드핀 납땜 검사방법 및 검사장치 KR100304649B1 (ko)

Priority Applications (3)

Application Number Priority Date Filing Date Title
KR1019990003376A KR100304649B1 (ko) 1999-02-02 1999-02-02 집적회로 패키지의 리드핀 납땜 검사방법 및 검사장치
CN00100744A CN1264169A (zh) 1999-02-02 2000-02-02 用于检测集成电路封装引脚焊接的装置和方法
JP2000025651A JP2000228579A (ja) 1999-02-02 2000-02-02 集積回路パッケ―ジのリ―ドハンダ付け検査方法及び検査装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1019990003376A KR100304649B1 (ko) 1999-02-02 1999-02-02 집적회로 패키지의 리드핀 납땜 검사방법 및 검사장치

Publications (2)

Publication Number Publication Date
KR20000054979A KR20000054979A (ko) 2000-09-05
KR100304649B1 true KR100304649B1 (ko) 2001-09-13

Family

ID=19573065

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1019990003376A KR100304649B1 (ko) 1999-02-02 1999-02-02 집적회로 패키지의 리드핀 납땜 검사방법 및 검사장치

Country Status (3)

Country Link
JP (1) JP2000228579A (zh)
KR (1) KR100304649B1 (zh)
CN (1) CN1264169A (zh)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101497947B1 (ko) * 2013-09-10 2015-03-03 주식회사 고영테크놀러지 솔더 조인트의 검사방법

Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2005003682A1 (en) * 2003-07-08 2005-01-13 Heon Jeong Apparatus for detecting adhered portion or edge of sheet
JP2006214820A (ja) * 2005-02-02 2006-08-17 Yamaha Motor Co Ltd 基板検査装置および基板検査方法
JP2007033048A (ja) 2005-07-22 2007-02-08 Ricoh Co Ltd はんだ接合判定方法，はんだ検査方法，はんだ検査装置およびはんだ検査用プログラムならびに記録媒体
TWI320497B (en) * 2005-12-09 2010-02-11 Taiwan Tft Lcd Ass Multiple-angle imaging machine, multiple-angle inspection system and method for blemish measurement of a flat panel display
JP6396633B2 (ja) * 2012-02-15 2018-09-26 サターン ライセンシング エルエルシーＳａｔｕｒｎ Ｌｉｃｅｎｓｉｎｇ ＬＬＣ 回路基板
TWI470214B (zh) * 2013-10-01 2015-01-21 Utechzone Co Ltd Optical testing equipment and methods
CN104483331A (zh) * 2014-12-03 2015-04-01 东莞市神州视觉科技有限公司 一种连接器插针三维检测方法、装置及系统
CN106604628B (zh) * 2015-10-20 2019-07-12 泰科电子(上海)有限公司 用于确定电连接器的插脚的安装状态的系统
CN106338847A (zh) * 2016-10-27 2017-01-18 深圳市深科达智能装备股份有限公司 显示模组自动点亮检测机
CN106413286B (zh) * 2016-11-25 2023-03-21 深圳市易工自动化有限公司 喇叭引线自动焊接机及其控制方法
CN109490308B (zh) * 2018-09-25 2021-08-06 唐山英莱科技有限公司 一种焊缝检测装置和方法
CN109444157A (zh) * 2018-12-25 2019-03-08 苏州凡目视觉科技有限公司 一种划痕检测装置与方法
WO2021187349A1 (ja) * 2020-03-19 2021-09-23 三洋電機株式会社 密閉電池
CN116060814B (zh) * 2023-02-22 2023-06-16 江苏诺森特电子科技有限公司 一种接线的焊接工艺

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101497947B1 (ko) * 2013-09-10 2015-03-03 주식회사 고영테크놀러지 솔더 조인트의 검사방법

Also Published As

Publication number Publication date
KR20000054979A (ko) 2000-09-05
CN1264169A (zh) 2000-08-23
JP2000228579A (ja) 2000-08-15

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