KR100271104B1 - Tester of semiconductor logic circuit substrate - Google Patents

Abstract

PURPOSE: An apparatus for testing a solid state interposing logic circuit substrate is provided to reduce manufacturing time and cost, by automatically testing the logic circuit substrate. CONSTITUTION: A main control unit(1) determines whether substrate to test is good, and informs an operator of a test state. The main control unit drives a test apparatus. A power unit receives power from a supply voltage, and converts the received power to direct current and alternating current power necessary for the test of the substrate while being controlled by the main control unit. An input condition predetermined regarding a buffer substrate is applied to a buffer substrate control unit(3) according to a control command of the main control unit, and the buffer substrate control unit transfers its output value to the main control unit. A logic substrate control unit(4) controls a logic substrate according to the control command of the main control unit, and receives a response signal from the logic substrate to transfer the response signal to the main control unit so that the logic substrate control unit compares the response signal with a reference voltage. A specific substrate control unit(5) receives a control signal from the main control unit, and controls a specific function substrate. The specific substrate control unit receives a response signal from the specific function substrate and transfers the response signal to the main control unit. A substrate connection unit connects the substrate to test with the substrate control unit, and automatically insert and remove the substrate.

Description

Semiconductor logic circuit board inspection device

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an inspection apparatus for a semiconductor logic circuit board, and more particularly, to various electronic circuit boards (hereinafter, referred to as substrates) constituting a solid state interposing logic system (SSILS), which is used as a remote control facility of a nuclear power plant. The present invention relates to an inspection apparatus for inspecting the abnormality of the function.

Since various electronic circuit boards of semiconductor logic circuits are composed of numerous semiconductor devices, the ripple effect caused by malfunction of each component is very threatening to safety and safety in nuclear power plants that ensure reliability and safety. It is becoming.

1 is a test implementation diagram using a conventional manual inspection apparatus.

As shown in FIG. 1, a conventional tester supplied by a manufacturer that manufactures the SSILS is to test the performance of a substrate constituting a semiconductor logic circuit.

However, this has been used only for inspecting a very limited range of substrates, such as substrates that have already been found to be faulty.

In addition, such manual testing of the substrate has resulted in enormous manpower and time wastage, making the work extremely uneconomical and inefficient.

In addition, since the inspection is performed by hand, the results of the inspection are different according to the skill and function of each inspector, so there is a problem that the results of the inspection are not reliable.

Accordingly, an object of the present invention is to provide a semiconductor logic circuit board inspection apparatus which automatically inspects a semiconductor logic circuit board which is more efficient and reliable than conventional devices.

1 is a test implementation using a conventional manual inspection device.

Figure 2 is an internal configuration of the inspection apparatus according to the present invention.

3 is an embodiment of a test apparatus according to the present invention.

4 is a block diagram of a board connection according to an embodiment of the present invention.

Explanation of symbols on the main parts of the drawings

1: Main control unit 2: Program controlled power supply

3: buffer board controller 4: logic board controller

5: Special board control unit 6: Buffer board connection

7: Logic board connection part 8: Special board connection part

9: A / D converter 10: Power supply control unit

11 monitor means 12 input device

In order to achieve the above object, the present invention is connected to the main control unit input unit for transmitting a command regarding the control to the main control device or a response to the decision request of the tester; A main control device which drives an inspection apparatus according to a transmission signal of an input unit, and determines a quantity of each inspected substrate and informs the inspector of the progress of the inspection; A power supply device which receives power from a commercial power source and converts several DC and AC powers required for inspection of a substrate by controlling the main controller; A buffer board controller for applying an input condition set to the buffer board according to a control command of the main controller to transfer an output value to the main controller; A logic board controller for controlling the logic board according to a control command of the main controller and comparing and analyzing the logic board with a reference voltage; A special board controller which receives a control signal from the main controller and controls a special function board, receives a response signal from the special function board, and transmits the response signal to the main controller to perform a comparative analysis with a reference signal; A substrate connecting portion which connects the substrate under test to the substrate control unit, and automatically recognizes the substrate type, including a substrate type automatic identification device and a substrate insertion detection device, and automatically inserts and removes the substrate; And an output unit for outputting an inspection result of the substrate determined by the main controller.

Hereinafter, with reference to the accompanying drawings will be described in detail the present invention.

2 is an internal configuration diagram of a test apparatus according to the present invention.

Looking at the configuration of the inspection apparatus with reference to Figure 2 as follows.

First, when the input device 12 is connected to the main control device 1 and the inspector transmits a command regarding the control to the main control device 1 or the inspection device requests the judgment of the inspector while the test device is inspected. The corresponding response is transmitted to the main controller 1. As the input device 12, a general computer keyboard, a touch screen, a mouse, a barcode reader, a scanner, or the like can be used.

Although the main controller 1 connected to the input device 12 is an IBM compatible PC in this embodiment, it can be reconfigured using other effective means such as a portable PC, a VME bus, and the input of the input device 12. The inspection apparatus is driven in accordance with the command and response signals, the quality of each inspection substrate is determined, and the inspector 11 is notified of the progress of the inspection to the inspector.

The power supply device is composed of a power supply control unit 10 and a program controlled power supply device 2. The power supply control unit 10 receives power from commercial power under the control of the main controller 1 to control the output. In addition, the program-controlled power supply 2 which can be remotely controlled by a program is connected to the power supply control unit 10 and receives the power output from the power supply control unit 10 to supply several types of direct current required for inspection of the board. And an apparatus for converting into AC power and supplying the buffer board connecting portion 6, the logic board connecting portion 7, and the special board connecting portion 8 to vary the voltage and type of the power supplied by the control of the main controller 1. can do.

In this embodiment, the program-controlled power supply 2 is made modular so that it can be attached to a 19 ″ standard rack.

In addition, the program-controlled power supply 2 is designed to receive a digital signal from the main controller 1 to supply the power of the specified voltage stably and to reach the specified voltage within 0.5 seconds when the voltage is changed. One terminal for connection with the main controller (1) was installed, and fuses and overload breakers were used for input and output to protect the device from overvoltage or overcurrent.

The A / D converter 9 is connected to the main controller 1 using an analog buffer and a multiplexer, and the buffer board connection part 6, the logic board connection part 7 and the special board connection part 8 are connected. When the value of the test result of the test target board received through the buffer board controller 3, the logic board controller 4, and the special board controller 5 is an analog signal, it is converted into a digital signal and transmitted to the main controller 1. . The A / D converter 9 outputs a 4-bit digital signal to operate the multiplexer, selects a specific analog signal, and performs an A / D conversion function with a resolution of 12 bits.

The buffer board control unit 3 for inspecting the buffer board is designed and manufactured in the form of a PC-embedded board in the present embodiment, and is subjected to inspection by applying an input condition set to the buffer board according to the control command of the main controller 1. It delivers the test result value of the board to the main controller.

In addition, the buffer board control unit 3 measures the degree of deterioration and actual operating point of the device, simulates the noise and leakage resistance of the input / output circuit, the integrity test of the circuit when the output circuit is shorted, the output voltage and current measurement corresponding to the input, Functions such as measuring the logic voltage (+ 12V) inside the logic board (checking regulator health), measuring current consumption of the inspected board, identifying the board type, and alarming can be performed.

The logic board controller 4 for inspecting the versatile logic board is designed and manufactured in the form of a PC-embedded board in this embodiment, and receives a control signal from the main controller 1 to control the logic board and to receive a response signal from the logic board. It is the part that transmits to main controller 1 and compares with reference voltage.

The logic board controller 4 provides clock pulses of up to 2 MHz, transmits outputs to the digital I / O ports of the main controller 1, simulates and outputs input circuits of various logic boards, identifies types of logic boards, and Additional functions such as a false insertion alarm can be performed.

The special board control unit 5 for inspecting a special board, which is one of other test target boards, is designed and manufactured in the form of a PC-embedded board in this embodiment, and receives a control signal from the main controller 1 to control a special function board. It receives a response signal from the substrate and transfers it to the main controller 1 for comparison with the reference signal.

The buffer board connecting portion 6, the logic board connecting portion 7, and the special board connecting portion 8 for connecting the substrate under test to this inspection apparatus are manufactured using an SSILS card dedicated connector, and the board type automatic identification device and the substrate insertion detection are performed. By attaching the device, it is possible to automatically recognize the type of substrate, and it is possible to detect the insertion and removal of the substrate by magnetic diagrams, and it is possible to suppress the damage of the substrate due to incorrect insertion.

In this embodiment, the connector assembly was manufactured using the SSILS card tester before (MFRP / N: KV8900-1).

The connection between the pins was soldered by fabricating a double-sided PCB board.

The connection with the PC used as the main controller 1 used a twisted pair plat cable in which a dedicated connector was mounted on the PCB.

The logic board type identification sensor is attached to the connector assembly, and the FBM (Field Buffer Module) and CBM (Control Buffer Module) test connector assembly plugs the corresponding pins of the card identification pins to automatically identify the type and at the same time the card The damage was suppressed as much as possible.

A monitor, a printer, etc. can be used as an output part which outputs a test result.

That is, as monitor means 11 for monitoring or controlling the detection state, a 14 ″ color monitor is attached to the upper end of the apparatus. The monitor means 11 is connected to the main controller 1 to inform the inspector of the test results of the main controller, and when reconfiguring the apparatus to a portable type, a color LCD display device or the like can be used.

It provides a high speed page printer that can use more than general purpose A4 paper as a means for printing the test results.

The program mounted on the main controller 1 and driving the inspection apparatus is composed of a main program and an inspection result management program.

The main program inspects the boards in the order of inspection to determine whether or not there is a possibility of a failure or transition to failure, and informs the inspector.

In the detailed configuration of the main program, the user identification unit, the board type automatic identification unit, the procedure document automatic selection and driving unit, the inspection mode selection unit, the inspection information input unit, the digital inspection device driver, the analog inspection device driver, and the dip (DIP) It consists of a switch inspecting unit, a manual switch inspecting unit, a resistance ratio measuring unit, and a power supply controller.

Each part operates organically during the inspection of the inspected board, and if you look at the sequence of the operation, start the inspection device, and when the main program is started, user confirmation is required. do.

In the test standby state, the board is monitored for insertion, and when the board is inserted, the automatic sensing device automatically determines the type of the board, selects and starts the test procedure of the board, and enters the test standby state.

Information about the substrate to be inspected to be inspected for data management is input through the input device 12, and when the inspection mode is selected, each inspection apparatus is prepared to be driven and waits for the user to instruct the inspection start.

When the user instructs the start of the test through the input device, the digital test device driver, the analog test device driver, the dip switch tester, the manual switch tester, the resistance ratio measurer, and the power supply controller operate organically according to the procedure. The board is inspected and the results are informed to the user.

According to the test result, when the user selects a result process such as printing a result or storing it in a database, the test is terminated, and the test apparatus is in a waiting state for a new test. The user may instruct the retest as many times as necessary.

This main program is driven by the inspection apparatus of the present embodiment, and in addition to the basic functions of determining the quality of each inspected substrate and notifying the inspector of the progress of the inspection through a monitor device, the substrate is automatically detected whether the substrate is inserted. It detects a wrong insertion and generates an alarm. It has a function to automatically identify the type of board inserted. It automatically measures and records the current consumption and clock frequency of the board under test, automatically stores the test results, Various functions can be embedded, including the ability to print inquiry, inspection result reports and analysis contents, and a repair mode function that provides the information necessary to precisely analyze and repair a faulty board.

On the other hand, the inspection result management program stores the results of the inspection by the main program and makes a database so that the inspection results can be inquired after printing and analyzed. Such a test result management program may include various functions such as inquiry of test result, test result report and printing of analysis contents.

Looking at the inspection result management program described above in detail.

In other words, the inspection result management program stores and manages various inspection result data in a database, provides a function to search inspection results, and generates various reports. The history management database unit, inspection results and inspection history search unit It consists of a test result data backup unit, an inspection procedure database management unit, and various report generation units.

In the above, the history management database unit is a part for storing the various information and the inspection result about the inspected substrate, the inspection result and inspection history search unit through the various monitor means 11 for the various results obtained in accordance with the various search conditions required by the user Provides a user interface for viewing or printing the report.

The test result data backup unit separately stores test result data using various auxiliary storage devices such as a CD-ROM or a tape to provide a recovery means in case of damage to the main database.

The inspection procedure database manager is a part that stores inspection procedures of various boards and provides an inquiry and correction function.

The various report generation units provide forms such as inspection history, inspection result table, and various search result reports, and generate the results according to the user's request.

According to the above description, an embodiment of the inspection apparatus using the buffer substrate as the inspection target board is as follows.

First, the inspector uses the input device 12 to send a driving command to the main controller 1 to drive the inspecting device. Accordingly, the above-described main program is operated to request the inspector to confirm, and when the inspector is confirmed, the inspection program is in the test standby state.

In the test standby state, the board to be inspected is monitored. When the board is inserted, the automatic sensing device of each board connection unit (6, 7, 8) automatically determines the type of board and selects the test procedure of the board. After starting, it enters the test standby state.

At this time, information about the substrate to be inspected is input through the input device 12 for data management, and when the inspection mode is selected, each inspection apparatus is prepared to be driven and waits for the inspector to instruct the inspection start. When the inspector instructs the start of the test through the input device, the digital test device driver, analog test device driver, dip switch tester, manual switch tester, resistance ratio measurer, and power supply control unit operate organically to the test procedure. Accordingly, the control signal is transmitted to the program-controlled power supply 2 through the buffer board controller 3 and the power supply controller 10, and the buffer board controller 3 transmits the simulated signal through the buffer board connection unit 6. And the result is received from the substrate under test and transferred to the main controller 1. In this case, when the test result value is an analog signal, a signal is provided to the A / D converter 9 and converted into a digital value, and then transferred to the main controller 1.

The program-controlled power supply 2 supplies or stops the specified power to the substrate under test through the buffer board connection 6 in accordance with a control signal through the power supply controller 10.

The main control unit 1 determines whether or not the provided inspection result is determined according to a pre-programmed inspection procedure, and displays it on the monitor means 11, and selects a result processing such as printing the inspection result or storing it in a database according to the instruction of the inspector. When the test is finished, the test device initializes the buffer board controller 3, the logic board controller 4, the special board controller 5, the program-controlled power supply 2, the main program, and waits for a new test. Becomes

As with the embodiment of the buffer board, the operation of the test apparatus according to the test embodiment of the logic board is inspected through the above procedure through the logic board control unit 4 and the logic board connection unit 7, and the special board is performed. The operation of the inspection apparatus according to the embodiment of the inspection is different from that made only through the special substrate control unit 5 and the special substrate connection unit 8, and the other operations are the same.

3 is an embodiment of an inspection apparatus according to the present invention.

The enclosure shown in Figure 3 is equipped with a fixing wheel for preventing the flow of the main wheel and the transport wheel at the bottom to facilitate the transport and storage of each component to the lower part and the eye bolt at the top It is an installed structure.

The main controller 1 is fixed by using a slide rail (slide rail) for ease of inspection or maintenance, and in the normal use to fix the bolt in the front to prevent the flow.

An air filter is installed at the bottom of the 19 ″ rack rear door to facilitate the inflow of cooling air and to prevent the inflow of dust.

The main power supply of this apparatus was supplied to each of the above parts through a noise filter having an appropriate capacity.

4 is a configuration diagram of a board connection according to an embodiment of the present invention.

The DMM or scope meter is provided in the form of an external type or an internal type to provide convenience of maintenance in case of failure of a test target board using this apparatus. In this embodiment, an external DMM is mounted.

According to the present invention as described above it can be obtained the following effects.

First, since the inspection of the semiconductor logic circuit board can be automatically performed by the inspection apparatus, it saves manpower and time, which is very economical and efficient.

Secondly, the result of the test is always the same without depending on the ability of the tester can result in the test results.

Third, by using the automatic inspection device according to the present invention, the inspection and maintenance ability is improved from 15 times to 60 times, which enables rapid and accurate fault diagnosis and maintenance, thereby ensuring the integrity of the semiconductor logic circuit board through regular test inspection. It is possible.

Fourth, it is possible to immediately check the suitability of the maintenance result of the board proved to be a failure, thereby increasing the convenience of maintenance.

Fifth, since the test results are stored in a high speed mass storage medium as a database, scientific and systematic management is possible and the ease of management is increased.

Claims (7)

It operates the inspection device, determines the quality of each inspection board, and A main control device that informs the inspector of sulfur; A power supply device receiving power from a commercial power source and converting the same into DC and AC powers required for inspection of a substrate by controlling the main controller; A buffer board controller for applying an input condition set to the buffer board according to a control command of the main controller and transferring an output value to the main controller; A logic board controller controlling the logic board according to a control command of the main controller, receiving a response signal from the logic board, and transferring the response signal to the main controller to perform a comparative analysis with a reference voltage; A special board controller configured to control a special function board by receiving a control signal from the main controller and receive a response signal from the special function board; A substrate connecting portion which connects the substrate under test to the substrate control unit, automatically recognizes the substrate type including a substrate type automatic identification device and a substrate insertion detection device, and automatically inserts and removes the substrate; And A semiconductor logic circuit board inspection apparatus, comprising: an output unit for outputting an inspection result. The method of claim 1, And a function of storing the result of the substrate inspection in a main controller and making a database so that the inspection result can be queried and printed or analyzed afterwards. The method of claim 1, The buffer board control unit measures the degree of deterioration and the actual operating point of the device, simulates the noise and leakage resistance of the input circuit, the integrity test of the circuit when the output circuit is shorted, the output voltage and current measurement corresponding to the input, the frequency of the logic substrate A semiconductor logic circuit board inspection apparatus, which performs the functions of measurement, logic voltage measurement in a logic substrate, current consumption of a substrate under test, substrate type identification, and an alarm. The method of claim 1, And the logic board controller performs functions of input circuit simulation and output inspection of various logic boards, identification of types of logic boards, and misinsertion alarms. The method of claim 1, And the board connection fixing unit performs a clock pulse, input circuit simulation and output inspection of various logic boards, identification of types of logic boards, and a misinsertion alarm. The method of claim 1, A device for inspecting a semiconductor logic circuit board, comprising adding a DMM or a scope meter to provide convenience of maintenance in case of failure of a substrate under test. The method of claim 1, It is installed at the bottom of the wheel for transport and easy to transport and fixing bolt for preventing the flow during the inspection, the eye bolt is installed on the top, And an enclosure for accommodating and installing the component parts.

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