CN217766640U - Aging test system - Google Patents
Aging test system Download PDFInfo
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- CN217766640U CN217766640U CN202220286152.2U CN202220286152U CN217766640U CN 217766640 U CN217766640 U CN 217766640U CN 202220286152 U CN202220286152 U CN 202220286152U CN 217766640 U CN217766640 U CN 217766640U
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Abstract
The application discloses an aging test system. The aging test system comprises: the test control platform and the aging test device; the aging test device is internally provided with a placing space, and the placing space is used for placing a product to be tested; the test control platform is coupled with the aging test device; and the test control platform regulates and controls the aging test parameters of the aging test device so as to carry out aging test on the product to be detected in the placing space. Through the scheme, the aging test device can be suitable for aging tests on different types of products to be tested.
Description
Technical Field
The application belongs to the technical field of testing devices of electronic elements, and particularly relates to an aging testing system.
Background
The memory chip can flow into the market after being screened out defective products through an aging test. At present, various aging test machines on the market have abundant functions, but the existing aging test machines cannot generally meet the requirement of aging test for a memory with a controller.
SUMMERY OF THE UTILITY MODEL
The application provides a chemical test system to solve the technical problem that the existing aging test machine cannot detect a memory with a control unit.
In order to solve the technical problem, the application adopts a technical scheme that: providing a burn-in test system, wherein the burn-in test system comprises: the test control platform and the aging test device;
the aging test device is internally provided with a placing space, and the placing space is used for placing a product to be tested; the test control platform is coupled with the aging test device; and the test control platform regulates and controls the aging test parameters of the aging test device so as to perform aging test on the product to be tested in the placing space.
Optionally, the number of the burn-in test apparatuses is at least two, and at least two of the burn-in test apparatuses are coupled to the test control platform.
Optionally, the aging test parameters include at least one of temperature and humidity in the placing space and test time of the product to be tested in the placing space.
Optionally, a test circuit board is further arranged in the placing space, and an element connector is arranged on the test circuit board and used for fixedly mounting the product to be detected and electrically connecting with the product to be detected;
the test circuit board is in communication connection with the test control platform, and the test control platform is used for sending a test operation signal to the test circuit board so that the product to be detected can operate in response to the test operation signal.
Optionally, the test circuit board has a plurality of the component connectors thereon, and each of the component connectors is electrically connected to the test control platform through the test circuit board.
Optionally, the test control platform further has a burning unit electrically connected to the element connectors to perform coded confirmation and storage on the position information of each element connector.
Optionally, the test control platform further has a test control unit, and the test control unit is electrically connected to the test circuit board to regulate and control the operating parameters of the test circuit board.
Optionally, the operating parameters of the test circuit board include an initial test voltage and an initial test current of the test circuit board.
Optionally, the test control platform further includes a memory, and the memory is used for storing the test result of the product to be detected.
Optionally, the test control platform is further in communication connection with an enterprise management platform.
The beneficial effect of this application is: in the scheme of this application, through the test control platform with the aging testing device with be coupled to can regulate and control the aging testing parameter when carrying out aging testing to the aging testing device through test control platform, make this aging testing parameter advance can be applicable to the difference and wait to detect the product, thereby can make being applicable to of this aging testing device wait to detect the product and carry out aging testing to the different grade type.
In addition, the test control unit is arranged, so that the test power supply of the test circuit board can be regulated and controlled, the test control platform can provide different test power supplies for the test circuit board, and the test power supplies can be provided for the test operation of different products to be detected.
The burn unit arranged in the test control platform can set the corresponding codes for each element connector, and when the product to be detected is provided with the control unit, the codes of the element connectors connected with the product to be detected can be directly read when the product to be detected is subjected to aging test operation, so that the aging side of the product to be detected can be conveniently tracked.
Drawings
In order to more clearly illustrate the technical solutions in the embodiments of the present application, the drawings needed to be used in the description of the embodiments are briefly introduced below, it is obvious that the drawings in the following description are only some embodiments of the present application, and other drawings can be obtained by those skilled in the art without inventive efforts, wherein:
FIG. 1 is a schematic diagram of an embodiment of a burn-in test system provided herein;
FIG. 2 is a schematic diagram of another embodiment of the burn-in test system of FIG. 1;
FIG. 3 is a diagram of an embodiment of a display page of a test control platform corresponding to a device connector on a test circuit board.
Detailed Description
The technical solutions in the embodiments of the present application will be described clearly and completely with reference to the drawings in the embodiments of the present application, and it is obvious that the described embodiments are only some embodiments of the present application, and not all embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present application.
It should be noted that if directional indications (such as up, down, left, right, front, back, 8230; \8230;) are referred to in the embodiments of the present application, the directional indications are only used to explain the relative positional relationship between the components, the motion situation, etc. in a specific posture (as shown in the attached drawings), and if the specific posture is changed, the directional indications are correspondingly changed.
In addition, if there is a description of "first", "second", etc. in the embodiments of the present application, the description of "first", "second", etc. is for descriptive purposes only and is not to be construed as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include at least one of the feature. In addition, technical solutions between the embodiments may be combined with each other, but must be based on the realization of the technical solutions by a person skilled in the art, and when the technical solutions are contradictory to each other or cannot be realized, such a combination should not be considered to exist, and is not within the protection scope claimed in the present application.
Please refer to fig. 1. Fig. 1 is a schematic structural diagram of an embodiment of a burn-in test system provided in the present application.
The burn-in test system 10 includes: a test control platform 110 and a burn-in tester 120.
The aging test device 120 is provided with a placing space therein, and the placing space is used for placing a product to be tested; the test control platform 110 is coupled to the burn-in apparatus 120; the test control platform 110 regulates and controls parameters of the aging test device 120 during aging test, so as to perform aging test on the product to be tested in the placing space.
Therefore, in the solution of the present application, by coupling the aging testing apparatus 120 with the testing control platform 110, the aging testing parameters during the aging testing of the aging testing apparatus 120 can be regulated and controlled by the testing control platform 110, so that the aging testing parameters can be applicable to different products to be tested, and thus the aging testing apparatus 120 can be applicable to aging testing of different types of products to be tested.
The existing aging test is to set the product in the placing space to normally power on and/or off, and the aging test device 120 can install preset regulation rules to regulate and control the ambient temperature and/or humidity in the placing space in sequence, so as to detect the running state of the product to be detected in different temperature/humidity environment information running preset time, and further to judge whether the aging test of the product to be detected is qualified according to various parameters of the product to be detected running in the placing space of the aging test device 120 for the preset time.
In the solution of the present application, the aging test parameters of the aging test device 120 during the aging test include at least one of the environmental temperature and/or humidity parameters in the placing space and the detection time of the aging test device 120 on the product to be detected.
Therefore, the environmental temperature and/or humidity parameters in the placing space of the aging test device 120 can be directly controlled, and the detection time of the product to be detected in the aging test device 120 can be controlled.
It should be noted that the adjusting and controlling of the parameters of the burn-in apparatus 120 during the burn-in test by the test control platform 110 may include setting initial parameters of the burn-in apparatus 120 during the burn-in test and adjusting and controlling the parameters during the burn-in test in real time during the burn-in test.
The test control platform 110 includes a display device, the display device can display a parameter adjustment and control page corresponding to the aging test device 120, and an operator can set an initial parameter of the aging test device 120 during the aging test from the parameter adjustment and control page, and can adjust and control the parameter during the aging test in real time.
Optionally, the burn-in test system 10 may be coupled to the at least two burn-in test apparatuses 120, respectively, so that the burn-in test parameters of the at least two burn-in test apparatuses 120 may be directly controlled and controlled, respectively.
Each aging test device 120 may correspond to a parameter adjustment and control page, and an operator may set initial parameters of different aging test devices 120 during aging test by switching the parameter adjustment and control pages, and may adjust and control the parameters during the aging test in real time during the aging test.
Further, referring to fig. 2, fig. 2 is a schematic structural diagram of another embodiment of the burn-in test system shown in fig. 1.
In this embodiment, when performing the aging test, it is necessary to keep the product to be tested in an operating state, a test circuit board 121 is disposed in the placing space 1201, an element connector 122 is disposed on the test circuit board 121, and the element connector 122 may be used to fixedly mount the product to be tested and electrically connect with the product to be tested; the test circuit board 121 is in communication connection with the test control platform 110, and the test control platform 110 is configured to send a test operation signal to the test circuit board 121, and further send the test operation signal to the product to be tested through the test circuit board 121 via the element connector 122 so that the product to be tested operates in response to the test operation signal.
The test control platform 110 further includes a test control unit 111, and the test control unit 111 can regulate and control the operating parameters of the test circuit board 121. The operating parameters of the test circuit board 121 include an initial test voltage and an initial test current. The initial test voltage and the initial test current of the test circuit board 121 may be set by the test control unit 111.
Further, in this embodiment, different test power supplies may be required for different products to be detected, that is, the test operating voltage and/or the test operating current required for different products to be detected may be different. Therefore, the test control unit 111 of the test control platform 110 can also regulate and control the test power supply of the test circuit board 121, so that the test control platform 110 can provide different test power supplies for the test circuit board 121, and test power supplies can be provided for test operation of different products to be tested.
Further, a plurality of component connectors 122 may be disposed on the test circuit board 121, and each component connector 122 is electrically connected to the test control platform through the test circuit board. Therefore, the products to be tested to which the plurality of component connectors 122 are respectively connected can be tested by one test circuit board 121.
Optionally, a burning unit 112 is further disposed in the test control platform 110, and the burning unit 112 is electrically connected to each element connector 122 to perform encoding verification and storage on the position information of each element connector 122.
Through, the burning unit 112 in the test control platform 110 can set a corresponding code for each component connector 122, and when the product to be detected has a control unit, the code of the component connector 122 connected to the product to be detected can be directly read when the product to be detected is subjected to aging test operation, so that the aging side of the product to be detected can be conveniently tracked.
For example, when a product to be detected is abnormal, the position information of the component connector 122 may be determined by the code of the corresponding component connector 122 read by the product to be detected, so as to perform abnormality checking on the component connector 122 corresponding to the product to be detected. So that it can be determined whether the abnormality of the product to be detected is related to the component connector 122. If the component connector 122 is associated with the component connector, the component connector is required to be checked for abnormality, and if the component connector is not associated with the component connector, the component connector can be further analyzed for abnormality.
Correspondingly, on the display device of the test control platform 110, the position information and the coding information of each component connector 122 on the test circuit board 121 may be correspondingly displayed, so as to facilitate one-side troubleshooting.
For example, referring to fig. 3, fig. 3 is a schematic diagram of an embodiment of a display page of a display device of a test control platform corresponding to a component connector on a test circuit board according to the present disclosure.
In this embodiment, the plurality of component connectors 122 are arranged in an array on the test circuit board 121, and the corresponding display page also has a plurality of squares arranged in an array, wherein each square may correspond to one component connector 122, and the characters in each square correspond to the codes of the component connector 122. The burning unit 112 can burn and store the codes of each element connector 122.
Wherein each element connector 122 may be marked to display a respective corresponding code for identification purposes.
Optionally, the burning unit 112 may have an automatic burning function and a manual burning function. The automatic recording function of the recording unit 112 can realize the sequential automatic encoding and storage of the plurality of element connectors 122; when the recording unit 112 executes the manual recording function, the operator may perform encoding and marking on each square of the corresponding display page, so as to sequentially and manually encode and store the plurality of element connectors 122.
The number of the test circuit boards 121 may also be multiple, and each test circuit board 121 has a display page of a corresponding element connector 122, and the element connector 122 on each test circuit board 121 can be programmed and saved by switching to the corresponding display page.
Referring to fig. 2, in the present embodiment, the test control platform 110 further includes a memory 113, and the memory 113 is used for storing the test result of the product to be tested.
Optionally, the test control platform 110 is also communicatively coupled to the enterprise management platform. The user can control the test control platform 110 through the enterprise management platform, and can also obtain the test result of the product to be tested through the memory 113 of the enterprise management platform self-test control platform 110.
In summary, the person skilled in the art can easily understand that the beneficial effects of the present application are: in the scheme of this application, through the test control platform with the aging testing device with be coupled to can regulate and control the aging testing parameter when carrying out aging testing to the aging testing device through test control platform, make this aging testing parameter advance can be applicable to the different products that wait to detect, thereby can make this aging testing device can be applicable to and wait to detect the product to carry out aging testing to the different grade type.
In addition, through setting up the test control unit, can also regulate and control the test power supply of test circuit board to make test control platform can provide different test power supply to test circuit board, in order to realize providing test power supply to the test operation of the product that awaits measuring of difference.
The burn unit arranged in the test control platform can set the corresponding codes for each element connector, and when the product to be detected is provided with the control unit, the codes of the element connectors connected with the product to be detected can be directly read when the product to be detected is subjected to aging test operation, so that the aging side of the product to be detected can be conveniently tracked.
The above description is only an example of the present application and is not intended to limit the scope of the present application, and all modifications of equivalent structures and equivalent processes, which are made by the contents of the specification and the drawings, or which are directly or indirectly applied to other related technical fields, are intended to be included within the scope of the present application.
Claims (10)
1. A burn-in test system, comprising: the test control platform and the aging test device;
the aging test device is internally provided with a placing space, and the placing space is used for placing a product to be tested; the test control platform is coupled with the aging test device; and the test control platform regulates and controls the aging test parameters of the aging test device so as to perform aging test on the product to be tested in the placing space.
2. The burn-in test system of claim 1,
the number of the aging test devices is at least two, and the at least two aging test devices are coupled with the test control platform.
3. The burn-in test system of claim 1,
the aging test parameters comprise at least one of temperature and humidity in the placing space and test time of the products to be tested in the placing space.
4. The burn-in test system of claim 1,
a test circuit board is further arranged in the placing space, and an element connector is arranged on the test circuit board and used for fixedly mounting the product to be detected and electrically connected with the product to be detected;
the test circuit board is in communication connection with the test control platform, and the test control platform is used for sending a test operation signal to the test circuit board so that the product to be detected can operate in response to the test operation signal.
5. The burn-in test system of claim 4,
the test circuit board is provided with a plurality of element connectors, and each element connector is electrically connected with the test control platform through the test circuit board.
6. The burn-in test system of claim 5,
the test control platform is also provided with a burning unit which is electrically connected with the element connectors so as to carry out coding confirmation and storage on the position information of each element connector.
7. The burn-in test system of claim 5,
the test control platform is also provided with a test control unit which is electrically connected with the test circuit board so as to regulate and control the operating parameters of the test circuit board.
8. The burn-in test system of claim 7,
the operating parameters of the test circuit board include an initial test voltage and an initial test current of the test circuit board.
9. The burn-in test system of claim 7,
the test control platform also comprises a memory, and the memory is used for storing the test result of the product to be tested.
10. The burn-in test system of any one of claims 1-9,
the test control platform is also in communication connection with the enterprise management platform.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202220286152.2U CN217766640U (en) | 2022-02-11 | 2022-02-11 | Aging test system |
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| Application Number | Priority Date | Filing Date | Title |
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| CN202220286152.2U CN217766640U (en) | 2022-02-11 | 2022-02-11 | Aging test system |
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| CN217766640U true CN217766640U (en) | 2022-11-08 |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN116580756A (en) * | 2023-06-01 | 2023-08-11 | 合肥开梦科技有限责任公司 | Memory chip testing device |
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN116580756A (en) * | 2023-06-01 | 2023-08-11 | 合肥开梦科技有限责任公司 | Memory chip testing device |
| CN116580756B (en) * | 2023-06-01 | 2024-03-22 | 合肥开梦科技有限责任公司 | Memory chip testing device |
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