CN114968883A - Automated testing apparatus, method, device, and computer-readable storage medium - Google Patents
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F13/00—Interconnection of, or transfer of information or other signals between, memories, input/output devices or central processing units
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- G06F13/4063—Device-to-bus coupling
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
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- G06F13/00—Interconnection of, or transfer of information or other signals between, memories, input/output devices or central processing units
- G06F13/38—Information transfer, e.g. on bus
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Abstract
The invention discloses an automatic testing device, method, equipment and a computer readable storage medium, wherein the device comprises a functional testing jig, a tested backboard and a testing target board, wherein the testing point of the tested backboard is correspondingly connected with the testing point of the testing target board through two-way elastic pins, and a universal connector in the tested backboard is electrically connected with a control board in the functional testing jig; the control board is used for receiving a client instruction, communicating with the test target board, simulating a tested signal, executing voltage detection and executing current detection. The invention realizes a universal automatic test scheme, avoids the problems of complex installation and use, lower reliability and higher cost, greatly improves the automation degree and the test efficiency of the test and effectively reduces the test cost.
Description
Technical Field
The present invention relates to the field of functional testing technologies, and in particular, to an automated testing apparatus, method, device, and computer-readable storage medium.
Background
In the prior art, the FCT function Test (Functional Circuit Test) generally refers to a function Test after a PCBA (Printed Circuit Board Assembly, Printed Circuit Board blank, which is subjected to surface mount technology (smt) loading or a whole process of dual in-line package (dip) package) is powered on, and includes: measuring functional parameters such as voltage, current, power factors, frequency, duty ratio, position measurement, LED brightness and color identification, LCD character and color identification, voice identification, temperature measurement and control, pressure measurement and control, precise micro-motion control, FLASH and EEPROM online burning and the like.
The existing functional Test requirement is a Test method for verifying the function of a Test target board by providing simulated operating environments, such as excitation, load and the like, for a UUT (Unit Under Test) to enable the UUT to work in various design states, and thus obtaining parameters of each state.
In order to meet the above test requirements, the currently adopted test scheme is: for common signals, one end of the elastic needle is jacked to a test point of a test target board, and the other end of the elastic needle is connected to an external device through a flying wire; for a power supply, one end of the elastic needle is jacked to a test point of a test target board, and the other end of the elastic needle is connected to a voltmeter in a flying mode; for high speed connectors, such as USB connectors and RJ45 connectors, etc., they are manually inserted and replaced.
Specifically, as shown in fig. 1, in the currently adopted scheme, a single Board DLB (Dongle, Dongle version) is designed in the FCT fixture, and the single Board is responsible for receiving the instruction of the client and communicating with the test target Board. However, the above-described scheme has the following problems: firstly, the elastic needle needs to fly to the peripheral equipment, and the installation is troublesome and unstable; secondly, a voltmeter and an ammeter need to be connected into the FCT jig, so that the cost is increased, and the quality of the materials is unstable and is often damaged; thirdly, the numerical values of an ammeter and a voltmeter need to be read manually, and the automation is not enough; fourthly, all peripheral devices supported by the test target board need to be accessed, and the peripheral devices usually comprise expensive devices such as laser radars and the like, so that the cost is high; fifthly, some plug-in units with high speed interface can not fly, and can only be inserted manually for testing, thus having low efficiency.
In summary, the existing functional test scheme still has a larger lifting space.
Disclosure of Invention
In order to solve the technical defects in the prior art, the invention provides an automatic testing device, which is characterized by comprising: the test device comprises a functional test fixture, a tested back plate and a test target plate, wherein the test point of the tested back plate is connected with the test point of the test target plate in a one-to-one correspondence manner through bidirectional elastic pins, and a universal connector in the tested back plate is electrically connected with a control plate in the functional test fixture; the control board is used for receiving a client instruction, communicating with the test target board, simulating a tested signal, executing voltage detection and executing current detection.
Optionally, the control board includes a power input unit, a field effect transistor unit connected to the power input unit, a microcontroller unit connected to the field effect transistor unit, a port forwarding unit connected to the microcontroller unit, and a signal input unit connected to the port forwarding unit.
Optionally, the control board further includes a power output interface connected to the field effect transistor unit, a signal output unit connected to the port forwarding unit, a burning unit connected to the signal output unit, and a download interface connected to the burning unit; the power output interface is used for providing power for the test target board, and the download interface is used for providing burning data for the test target board.
Optionally, the control board further includes 14 general input/output interfaces connected to the micro control unit and configured to transmit a signal to be tested to the test target board, 8 universal asynchronous transceiver interfaces, 2 serial peripheral interfaces, 1 bus interface, 8 pulse width modulation interfaces, 14 digital-to-analog conversion interfaces, and 20 analog-to-digital conversion interfaces.
Optionally, the 8 paths of pulse width modulation interfaces are used for verifying the corresponding interface function of the test target board, the 14 paths of digital-to-analog conversion interfaces are used for verifying the analog-to-digital conversion function of the test target board, the 20 paths of analog-to-digital conversion interfaces are used for detecting the power supply of the test target board, and the 1 path of bus interface is used for burning the electrified erasable programmable read only memory of the test target board.
Optionally, the control board is configured to burn the microcontroller unit of the test target board, monitor the bus voltage and the bus current of the test target board, and detect the compression state of the test target board.
The invention also provides an automatic test method, which is applied to a functional test fixture, wherein the functional test fixture is connected with a tested back plate, the tested back plate is connected with a test target plate, the test points of the tested back plate and the test points of the test target plate are correspondingly connected one by one through bidirectional elastic pins, and a universal connector in the tested back plate is electrically connected with a control board in the functional test fixture; the method comprises the following steps:
and receiving a test starting instruction of a client, sequentially detecting a bus voltage signal and a compaction state signal of the test target board through the tested backboard, and checking the hardware version number of the test target board.
And when the bus voltage signal and the compaction state signal accord with a detection condition and the hardware version number accords with a verification condition, executing one or more of burning operation, testing operation and writing operation of the test target board.
Optionally, the performing one or more of a burning operation, a testing operation, and a writing operation of the test target board includes:
receiving a burning command sent by the client, pulling up a burning target signal according to the burning command, and transmitting the burning target signal to the test target board through the tested backboard; and sending a burning execution notice to the client, and generating a prompt message of success or failure of current burning.
And receiving a configuration file sent by the client, executing a corresponding test according to the configuration file, and returning a test result to the client so that the client judges whether the test is passed or not.
And waiting for the information which is sent by the client and needs to be written in, and writing the information into the electrified erasable programmable read-only memory of the test target board through the tested backboard.
The invention also proposes an automated testing device comprising a memory, a processor and a computer program stored on said memory and executable on said processor, said computer program, when executed by said processor, implementing the steps of the automated testing method as described above.
The invention also proposes a computer-readable storage medium having stored thereon an automated test program which, when executed by a processor, implements the steps of the automated test method as described above.
The invention relates to an automatic testing device, a method, equipment and a computer readable storage medium, wherein the device comprises a functional testing jig, a tested backboard and a testing target board, wherein the testing point of the tested backboard is correspondingly connected with the testing point of the testing target board through bidirectional elastic pins, and a universal connector in the tested backboard is electrically connected with a control board in the functional testing jig; the control board is used for receiving a client instruction, communicating with the test target board, simulating a tested signal, executing voltage detection and executing current detection. The universal automatic testing scheme is realized, the problems of complex installation and use, lower reliability and higher cost are avoided, the automation degree and the testing efficiency of the test are greatly improved, and the testing cost is effectively reduced.
Drawings
The invention will be further described with reference to the accompanying drawings and examples, in which:
FIG. 1 is a block diagram of a conventional automated test apparatus;
FIG. 2 is a block diagram of a first embodiment of the automated test equipment of the present invention;
FIG. 3 is another block diagram of the automated test equipment according to the first embodiment of the present invention;
FIG. 4 is a block diagram of a second embodiment of the automated test equipment of the present invention;
FIG. 5 is a flow chart of a third embodiment of the automated testing method of the present invention.
Detailed Description
It should be understood that the specific embodiments described herein are merely illustrative of the invention and are not intended to limit the invention.
In the following description, suffixes such as "module", "component", or "unit" used to denote elements are used only for facilitating the explanation of the present invention, and have no specific meaning in itself. Thus, "module", "component" or "unit" may be used mixedly.
Example one
FIG. 2 is a block diagram of the automated test equipment according to the first embodiment of the present invention. This embodiment provides an automatic change testing arrangement, and the device includes: the testing device comprises a functional testing jig 100, a tested backboard 200 and a testing target board 300, wherein a testing point of the tested backboard 200 is connected with a testing point of the testing target board 300 in a one-to-one correspondence manner through a bidirectional pogo pin, and a universal connector 210 in the tested backboard 200 is electrically connected with a control board 110 in the functional testing jig 100; the control board 110 is used to receive a client instruction, communicate with the test target board 300, simulate a signal under test, perform voltage detection, and perform current detection.
Fig. 3 is another block diagram of the automated testing apparatus according to the first embodiment of the present invention, in this embodiment, a single board is designed for the FCT fixture, that is, the control board 110 of this embodiment is responsible for receiving the instructions of the client and communicating with the testing target board 300.
In this embodiment, for each Test target Board 300, a corresponding tested backplane (TBB) is designed, the designed tested backplane (TBB) corresponds to the Test target Board Test points one by one, and the Test points corresponding to one by one are connected through a bidirectional pogo pin, so that the signal is connected to the control Board 110 in the FCT fixture through the universal connector 210.
In the embodiment, both the normal signal and the power are transmitted through the bidirectional pogo pin connection, one end of the bidirectional pogo pin is pushed to the test point of the test target board 300, and the other end of the bidirectional pogo pin is pushed to the test point of the tested backplane 200.
In the embodiment, for the plug-in standard connectors, such as USB connector and RJ45 connector, a plum blossom spring pin is used, one end of which is pushed to the pin of the USB connector or RJ45 connector, and the other end is pushed to the test point of the tested backplane 200.
In this embodiment, the control board 110 designed in the FCT fixture is responsible for receiving the instructions of the client and communicating with the test target board 300, and is also used for simulating the functions of the signal to be tested, voltage detection, current detection, and the like.
The present embodiment has the beneficial effects that, by providing an automatic testing device, the device includes a functional testing fixture 100, a tested backplane 200 and a testing target board 300, wherein the testing point of the tested backplane 200 is connected with the testing point of the testing target board 300 in a one-to-one correspondence manner through a bidirectional pogo pin, and the universal connector 210 in the tested backplane 200 is electrically connected with the control board 110 in the functional testing fixture 100; the control board 110 is used to receive a client instruction, communicate with the test target board 300, simulate a signal under test, perform voltage detection, and perform current detection. The universal automatic testing scheme is realized, the problems of complex installation and use, lower reliability and higher cost are avoided, the automation degree and the testing efficiency of the test are greatly improved, and the testing cost is effectively reduced.
Example two
FIG. 4 is a block diagram of a second embodiment of the automated testing apparatus of the present invention. In this embodiment, the control board 110 includes a power input unit 111, a fet unit 112 connected to the power input unit 111, a microcontroller unit 113 connected to the fet unit 112, a port relay unit 114 connected to the microcontroller unit 113, and a signal input unit 115 connected to the port relay unit 114.
In this embodiment, the control board 110 further includes a power output interface connected to the fet unit 112, a signal output unit 116 connected to the port forwarding unit 114, a recording unit 117 connected to the signal output unit 116, and a download interface connected to the recording unit 117; the power output interface is configured to provide power to the test target board 300, and the download interface is configured to provide burning data to the test target board 300.
In this embodiment, the control board 110 further includes 14 general-purpose input/output interfaces connected to the micro controller unit 113 and used for transmitting a signal to be tested to the test target board 300, 8 asynchronous transceiving transmission interfaces, 2 serial peripheral interfaces, 1 bus interface, 8 pulse width modulation interfaces, 14 digital-to-analog conversion interfaces, and 20 analog-to-digital conversion interfaces.
In this embodiment, the 8 paths of pulse width modulation interfaces are used to verify the interface functions corresponding to the test target board 300, the 14 paths of digital-to-analog conversion interfaces are used to verify the analog-to-digital conversion functions of the test target board 300, the 20 paths of analog-to-digital conversion interfaces are used to detect the power supply of the test target board 300, and the 1 path of bus interface is used to burn the charged erasable programmable read only memory of the test target board 300.
In this embodiment, the control board 110 is used for burning the micro controller unit 113 of the test target board 300, monitoring the bus voltage and the bus current of the test target board 300, and detecting the compression state of the test target board 300.
The present embodiment has the beneficial effects that, by providing an automatic testing device, the device includes a functional testing fixture 100, a tested backplane 200 and a testing target board 300, wherein the testing point of the tested backplane 200 is connected with the testing point of the testing target board 300 in a one-to-one correspondence manner through a bidirectional pogo pin, and the universal connector 210 in the tested backplane 200 is electrically connected with the control board 110 in the functional testing fixture 100; the control board 110 is used to receive a client instruction, communicate with the test target board 300, simulate a signal under test, perform voltage detection, and perform current detection. The universal automatic testing scheme is realized, the problems of complex installation and use, lower reliability and higher cost are avoided, the automation degree and the testing efficiency of the test are greatly improved, and the testing cost is effectively reduced. Meanwhile, the two-way elastic needle is adopted in the embodiment, two ends are stably connected, and the reliability is high; materials such as an ammeter and a voltmeter do not need to be relied on, so that the cost is saved; the information such as current, voltage and the like is automatically read by the microcontroller unit, manual judgment is not needed, and the efficiency is improved; the mode that the microcontroller unit simulates peripheral signals is adopted, real peripherals do not need to be accessed, and the cost is further saved; and a plug-in high-speed interface is adopted to further realize automatic testing.
EXAMPLE III
FIG. 5 is a flow chart of a third embodiment of the automated testing method of the present invention. The embodiment provides an automatic testing method, which is applied to a functional testing jig, wherein the functional testing jig is connected with a tested back plate, the tested back plate is connected with a testing target plate, the testing points of the tested back plate and the testing points of the testing target plate are correspondingly connected through bidirectional elastic pins one by one, and a universal connector in the tested back plate is electrically connected with a control board in the functional testing jig; the method comprises the following steps:
and S1, receiving a test starting instruction of a client, sequentially detecting a bus voltage signal and a compaction state signal of the test target board through the tested backboard, and verifying the hardware version number of the test target board.
And S2, when the bus voltage signal and the compaction state signal accord with detection conditions and the hardware version number accords with verification conditions, executing one or more of burning operation, testing operation and writing operation of the test target board.
In this embodiment, the performing one or more of the burning operation, the testing operation and the writing operation of the test target board 300 includes:
receiving a burning command sent by the client, pulling up a burning target signal according to the burning command, and transmitting the burning target signal to the test target board through the tested backboard; and sending a burning execution notice to the client, and generating a prompt message of success or failure of current burning.
And receiving a configuration file sent by the client, executing a corresponding test according to the configuration file, and returning a test result to the client so that the client judges whether the test is passed or not.
And waiting for the information needing to be written and sent by the client, and writing the information into the electrified erasable programmable read-only memory of the test target board through the tested backboard.
In this embodiment, the client supports automatic saving of a test log, where the test log at least includes a date and a time, basic information of the motherboard, test items, a reference range of each test item, an actual test value, and a test result.
In the embodiment, the Board ID information scanned from the main Board two-dimensional code of the test target Board is written into the electrified erasable programmable read only memory.
In this embodiment, the configuration of the test items, attributes, and parameters of the test target board is supported, specifically, the configuration includes a voltage-current reference range, each interface channel, and a master-slave relationship of each interface.
In this embodiment, when the test is executed, the test progress and the test passing condition are displayed.
In this embodiment, for the operation flow of the test preparation stage, firstly, the FCT jig is assembled, and the wire is connected; secondly, configuring a test target plate; thirdly, pressing the measured backboard tightly, and turning on a power supply; and fourthly, opening the client to select items and the mainboard model, importing the configuration file, and setting a test log export path.
In this embodiment, for the operation flow at the start stage of the test, firstly, the test target board is compressed, and the burning/testing is started by clicking; secondly, automatically storing a test log when the automatic test is finished; and thirdly, lifting the current test target plate and replacing the next test target plate.
It should be noted that the method embodiment and the apparatus embodiment belong to the same concept, and specific implementation processes thereof are described in detail in the apparatus embodiment, and technical features in the apparatus embodiment are correspondingly applicable in the method embodiment, which is not described herein again.
The embodiment has the beneficial effects that by providing the automatic testing method, the method comprises the following steps: firstly, receiving a test starting instruction of a client, sequentially detecting a bus voltage signal and a compaction state signal of the test target board through the tested backboard, and checking a hardware version number of the test target board; and then, when the bus voltage signal and the compaction state signal accord with a detection condition and the hardware version number accords with a verification condition, executing one or more of burning operation, testing operation and writing operation of the test target board. The universal automatic testing scheme is realized, the problems of complex installation and use, lower reliability and higher cost are avoided, the automation degree and the testing efficiency of the test are greatly improved, and the testing cost is effectively reduced. Meanwhile, the two-way elastic needle is adopted in the embodiment, the two ends are stably connected, and the reliability is high; materials such as an ammeter and a voltmeter do not need to be relied on, so that the cost is saved; the information such as current, voltage and the like is automatically read by the microcontroller unit, manual judgment is not needed, and the efficiency is improved; the mode that the microcontroller unit simulates peripheral signals is adopted, real peripherals do not need to be accessed, and the cost is further saved; and a plug-in high-speed interface is adopted to further realize automatic testing.
Example four
Based on the above embodiments, the present invention further provides an automated testing device, which includes a memory, a processor, and a computer program stored on the memory and executable on the processor, wherein the computer program, when executed by the processor, implements the steps of the automated testing apparatus according to any one of the above.
It should be noted that the apparatus embodiment and the method embodiment belong to the same concept, and specific implementation processes thereof are detailed in the method embodiment, and technical features in the method embodiment are applicable in the apparatus embodiment, which is not described herein again.
EXAMPLE five
Based on the foregoing embodiment, the present invention further provides a computer-readable storage medium, where an automatic test program is stored, and when the automatic test program is executed by a processor, the steps of the automatic test apparatus are implemented as described in any one of the foregoing embodiments.
It should be noted that the media embodiment and the method embodiment belong to the same concept, and specific implementation processes thereof are detailed in the method embodiment, and technical features in the method embodiment are correspondingly applicable in the media embodiment, which is not described herein again.
It should be noted that, in this document, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising an … …" does not exclude the presence of other like elements in a process, method, article, or apparatus that comprises the element.
The above-mentioned serial numbers of the embodiments of the present invention are only for description, and do not represent the advantages and disadvantages of the embodiments.
Through the above description of the embodiments, those skilled in the art will clearly understand that the method of the above embodiments can be implemented by software plus a necessary general hardware platform, and certainly can also be implemented by hardware, but in many cases, the former is a better implementation manner. Based on such understanding, the technical solutions of the present invention may be embodied in the form of a software product, which is stored in a storage medium (such as ROM/RAM, magnetic disk, optical disk) and includes instructions for enabling a terminal (such as a mobile phone, a computer, a server, an air conditioner, or a network device) to execute the method according to the embodiments of the present invention.
While the present invention has been described with reference to the embodiments shown in the drawings, the present invention is not limited to the embodiments, which are illustrative and not restrictive, and it will be apparent to those skilled in the art that various changes and modifications can be made therein without departing from the spirit and scope of the invention as defined in the appended claims.
Claims (10)
1. An automated testing apparatus, the apparatus comprising: the test device comprises a functional test fixture, a tested back plate and a test target plate, wherein the test point of the tested back plate is connected with the test point of the test target plate in a one-to-one correspondence manner through bidirectional elastic pins, and a universal connector in the tested back plate is electrically connected with a control plate in the functional test fixture; the control board is used for receiving a client instruction, communicating with the test target board, simulating a tested signal, executing voltage detection and executing current detection.
2. The automated testing device of claim 1, wherein the control board comprises a power input unit, a field effect transistor unit connected to the power input unit, a microcontroller unit connected to the field effect transistor unit, a port forwarding unit connected to the microcontroller unit, and a signal input unit connected to the port forwarding unit.
3. The automatic testing device of claim 2, wherein the control board further comprises a power output interface connected to the fet unit, a signal output unit connected to the port forwarding unit, a programming unit connected to the signal output unit, and a download interface connected to the programming unit; the power output interface is used for providing power for the test target board, and the download interface is used for providing burning data for the test target board.
4. The automatic test device of claim 3, wherein the control board further comprises 14 general purpose input/output interfaces connected to the micro control unit for transmitting the signal to be tested to the test target board, 8 asynchronous transceiving transmission interfaces, 2 serial peripheral interfaces, 1 bus interface, 8 pulse width modulation interfaces, 14 digital-to-analog conversion interfaces, and 20 analog-to-digital conversion interfaces.
5. The automatic testing device of claim 4, wherein the 8-channel PWM interface is used for verifying the corresponding interface function of the target board, the 14-channel DAC interface is used for verifying the ADC function of the target board, the 20-channel DAC interface is used for detecting the power supply of the target board, and the 1-channel bus interface is used for burning the EEPROM of the target board.
6. The automated testing device of claim 1, wherein the control board is used for programming a microcontroller unit of the test target board, monitoring a bus voltage and a bus current of the test target board, and detecting a compression state of the test target board.
7. An automatic testing method is characterized in that the method is applied to a functional testing jig, the functional testing jig is connected with a tested back plate, the tested back plate is connected with a testing target plate, wherein the testing points of the tested back plate are correspondingly connected with the testing points of the testing target plate one by one through bidirectional elastic pins, and a universal connector in the tested back plate is electrically connected with a control board in the functional testing jig; the method comprises the following steps:
receiving a test starting instruction of a client, sequentially detecting a bus voltage signal and a compaction state signal of the test target board through the tested backboard, and checking a hardware version number of the test target board;
and when the bus voltage signal and the compaction state signal accord with a detection condition and the hardware version number accords with a verification condition, executing one or more of burning operation, testing operation and writing operation of the test target board.
8. The automated testing method of claim 7, wherein the performing one or more of a burn operation, a test operation, and a write operation of the test target board comprises:
receiving a burning command sent by the client, pulling up a burning target signal according to the burning command, and transmitting the burning target signal to the test target board through the tested backboard; sending a burning execution notice to the client, and generating a prompt message of success or failure of current burning;
receiving a configuration file sent by the client, executing a corresponding test according to the configuration file, and returning a test result to the client so that the client judges whether the test is passed or not;
and waiting for the information needing to be written and sent by the client, and writing the information into the electrified erasable programmable read-only memory of the test target board through the tested backboard.
9. An automated test equipment, characterized in that the equipment comprises a memory, a processor and a computer program stored on the memory and executable on the processor, which computer program, when executed by the processor, carries out the steps of the automated test method according to claim 7 or 8.
10. A computer-readable storage medium, having an automated test program stored thereon, which when executed by a processor, performs the steps of the automated testing method of claim 7 or 8.
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| CN116520788A (en) * | 2023-07-03 | 2023-08-01 | 深圳市微克科技有限公司 | Automatic production control method and system for wearable equipment and readable storage medium |
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| CN109581192A (en) * | 2018-12-12 | 2019-04-05 | 襄阳蓬达高新科技有限公司 | A kind of PCBA powers on rear test device and system |
| CN109709471A (en) * | 2019-01-16 | 2019-05-03 | 昆山丘钛微电子科技有限公司 | A kind of test fixture, the test method and device of fingerprint mould group |
| CN111679942A (en) * | 2020-06-09 | 2020-09-18 | 深圳酷宅科技有限公司 | Burning test method, system and computer readable storage medium |
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| CN107390110A (en) * | 2017-06-20 | 2017-11-24 | 广东科学技术职业学院 | A kind of method, apparatus and system tested automatically PCBA |
| CN109581192A (en) * | 2018-12-12 | 2019-04-05 | 襄阳蓬达高新科技有限公司 | A kind of PCBA powers on rear test device and system |
| CN109709471A (en) * | 2019-01-16 | 2019-05-03 | 昆山丘钛微电子科技有限公司 | A kind of test fixture, the test method and device of fingerprint mould group |
| CN111679942A (en) * | 2020-06-09 | 2020-09-18 | 深圳酷宅科技有限公司 | Burning test method, system and computer readable storage medium |
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| CN116520788A (en) * | 2023-07-03 | 2023-08-01 | 深圳市微克科技有限公司 | Automatic production control method and system for wearable equipment and readable storage medium |
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