JPWO2024195229A1 - - Google Patents
Info
- Publication number
- JPWO2024195229A1 JPWO2024195229A1 JP2025508135A JP2025508135A JPWO2024195229A1 JP WO2024195229 A1 JPWO2024195229 A1 JP WO2024195229A1 JP 2025508135 A JP2025508135 A JP 2025508135A JP 2025508135 A JP2025508135 A JP 2025508135A JP WO2024195229 A1 JPWO2024195229 A1 JP WO2024195229A1
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2023047201 | 2023-03-23 | ||
| PCT/JP2023/045315 WO2024195229A1 (ja) | 2023-03-23 | 2023-12-18 | 外観検査装置、外観検査方法及び外観検査プログラム |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPWO2024195229A1 true JPWO2024195229A1 (https=) | 2024-09-26 |
Family
ID=92841690
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2025508135A Pending JPWO2024195229A1 (https=) | 2023-03-23 | 2023-12-18 |
Country Status (2)
| Country | Link |
|---|---|
| JP (1) | JPWO2024195229A1 (https=) |
| WO (1) | WO2024195229A1 (https=) |
Family Cites Families (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2000162133A (ja) * | 1998-09-21 | 2000-06-16 | Olympus Optical Co Ltd | 基板検査装置および該基板検査装置に用いられるパラレルリンク機構 |
| JP6714393B2 (ja) * | 2016-03-02 | 2020-06-24 | キヤノン株式会社 | 計測装置、システム、計測方法、および物品の製造方法 |
| CN106053480A (zh) * | 2016-07-29 | 2016-10-26 | 常州大学 | 用于自动光学检测系统的四转动检测平台 |
| JP6817893B2 (ja) * | 2017-05-18 | 2021-01-20 | Ntn株式会社 | 外観検査装置 |
| JP7186521B2 (ja) * | 2018-06-12 | 2022-12-09 | シチズンファインデバイス株式会社 | 外観検査装置の教師画像生成装置 |
| JP7508206B2 (ja) * | 2019-08-30 | 2024-07-01 | キヤノン株式会社 | 画像処理方法、エッジモデル作成方法、ロボットシステム、および物品の製造方法 |
| JP7458733B2 (ja) * | 2019-09-30 | 2024-04-01 | キヤノン株式会社 | 画像処理方法、画像処理装置、ロボットシステム、ロボットシステムを用いた物品の製造方法、検査方法、制御プログラム及び記録媒体 |
| JP7275059B2 (ja) * | 2020-01-28 | 2023-05-17 | 日本発條株式会社 | 検査システムおよび検査方法 |
| JP7700070B2 (ja) * | 2022-03-17 | 2025-06-30 | 株式会社東芝 | 光学検査方法、光学検査プログラム、処理装置、及び、光学検査装置 |
-
2023
- 2023-12-18 JP JP2025508135A patent/JPWO2024195229A1/ja active Pending
- 2023-12-18 WO PCT/JP2023/045315 patent/WO2024195229A1/ja not_active Ceased
Also Published As
| Publication number | Publication date |
|---|---|
| WO2024195229A1 (ja) | 2024-09-26 |