JPWO2024161619A1 - - Google Patents
Info
- Publication number
- JPWO2024161619A1 JPWO2024161619A1 JP2024574204A JP2024574204A JPWO2024161619A1 JP WO2024161619 A1 JPWO2024161619 A1 JP WO2024161619A1 JP 2024574204 A JP2024574204 A JP 2024574204A JP 2024574204 A JP2024574204 A JP 2024574204A JP WO2024161619 A1 JPWO2024161619 A1 JP WO2024161619A1
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
- G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
Landscapes
- Engineering & Computer Science (AREA)
- Textile Engineering (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| PCT/JP2023/003505 WO2024161619A1 (ja) | 2023-02-03 | 2023-02-03 | 疵検出装置、圧延装置、疵検出方法及び圧延方法 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPWO2024161619A1 true JPWO2024161619A1 (https=) | 2024-08-08 |
Family
ID=92145998
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2024574204A Pending JPWO2024161619A1 (https=) | 2023-02-03 | 2023-02-03 |
Country Status (2)
| Country | Link |
|---|---|
| JP (1) | JPWO2024161619A1 (https=) |
| WO (1) | WO2024161619A1 (https=) |
Family Cites Families (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5474792A (en) * | 1977-11-28 | 1979-06-15 | Nippon Steel Corp | Surface defect inspection method of steel plates |
| JPS5930216B2 (ja) * | 1977-12-27 | 1984-07-25 | 新日本製鐵株式会社 | 板材の表面疵検出方法 |
| JPH071237B2 (ja) * | 1989-03-31 | 1995-01-11 | 新日本製鐵株式会社 | 鋼板の欠陥疵識別用表示の検出装置 |
| JPH06324005A (ja) * | 1993-05-13 | 1994-11-25 | Nippon Steel Corp | 鋼板の圧延ロール疵検出方法 |
| JP3491147B2 (ja) * | 2000-03-30 | 2004-01-26 | Ｊｆｅスチール株式会社 | 欠陥検出方法及び欠陥検出装置 |
| DE602006005628D1 (de) * | 2006-06-13 | 2009-04-23 | Abb Oy | Verfahren und Vorrichtung zur Erkennung von sich wiederholenden Mustern |
| KR101774074B1 (ko) * | 2010-03-10 | 2017-09-01 | 쓰리엠 이노베이티브 프로퍼티즈 컴파니 | 웨브 제조 공정에서의 응용-특정된 반복 결함 검출 시스템 |
| WO2021005777A1 (ja) * | 2019-07-11 | 2021-01-14 | Ｐｒｉｍｅｔａｌｓ Ｔｅｃｈｎｏｌｏｇｉｅｓ Ｊａｐａｎ株式会社 | 圧延装置の運転方法並びに圧延装置の制御装置及び圧延設備 |
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2023
- 2023-02-03 JP JP2024574204A patent/JPWO2024161619A1/ja active Pending
- 2023-02-03 WO PCT/JP2023/003505 patent/WO2024161619A1/ja not_active Ceased
Also Published As
| Publication number | Publication date |
|---|---|
| WO2024161619A1 (ja) | 2024-08-08 |
Similar Documents
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20250707 |