JPWO2024117099A1 - - Google Patents
Info
- Publication number
- JPWO2024117099A1 JPWO2024117099A1 JP2024561486A JP2024561486A JPWO2024117099A1 JP WO2024117099 A1 JPWO2024117099 A1 JP WO2024117099A1 JP 2024561486 A JP2024561486 A JP 2024561486A JP 2024561486 A JP2024561486 A JP 2024561486A JP WO2024117099 A1 JPWO2024117099 A1 JP WO2024117099A1
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
- G01N23/046—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using tomography, e.g. computed tomography [CT]
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
- G01N23/18—Investigating the presence of flaws defects or foreign matter
Landscapes
- Health & Medical Sciences (AREA)
- Immunology (AREA)
- Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Pathology (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Pulmonology (AREA)
- Radiology & Medical Imaging (AREA)
- Theoretical Computer Science (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2022192824 | 2022-12-01 | ||
| PCT/JP2023/042440 WO2024117099A1 (ja) | 2022-12-01 | 2023-11-28 | 検査装置 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPWO2024117099A1 true JPWO2024117099A1 (https=) | 2024-06-06 |
Family
ID=91324147
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2024561486A Pending JPWO2024117099A1 (https=) | 2022-12-01 | 2023-11-28 |
Country Status (2)
| Country | Link |
|---|---|
| JP (1) | JPWO2024117099A1 (https=) |
| WO (1) | WO2024117099A1 (https=) |
Family Cites Families (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6665433B2 (en) * | 2001-07-31 | 2003-12-16 | Agilent Technologies, Inc. | Automatic X-ray determination of solder joint and view Delta Z values from a laser mapped reference surface for circuit board inspection using X-ray laminography |
| JP4580266B2 (ja) * | 2005-04-07 | 2010-11-10 | 名古屋電機工業株式会社 | Ｘ線検査装置、ｘ線検査方法およびｘ線検査プログラム |
| JP5830928B2 (ja) * | 2011-05-13 | 2015-12-09 | オムロン株式会社 | 検査領域設定方法およびｘ線検査システム |
| EP3690428A4 (en) * | 2017-09-28 | 2021-06-09 | Saki Corporation | TEST ITEM SPECIFICATION PROCEDURE, PROCESS FOR GENERATING THREE-DIMENSIONAL IMAGES AND TESTING DEVICE |
| JP7542327B2 (ja) * | 2020-04-02 | 2024-08-30 | 株式会社サキコーポレーション | 検査装置 |
| JP7437222B2 (ja) * | 2020-04-22 | 2024-02-22 | 株式会社サキコーポレーション | 検査装置 |
-
2023
- 2023-11-28 JP JP2024561486A patent/JPWO2024117099A1/ja active Pending
- 2023-11-28 WO PCT/JP2023/042440 patent/WO2024117099A1/ja not_active Ceased
Also Published As
| Publication number | Publication date |
|---|---|
| WO2024117099A1 (ja) | 2024-06-06 |