JPWO2024052774A1 - - Google Patents

Info

Publication number
JPWO2024052774A1
JPWO2024052774A1 JP2024545077A JP2024545077A JPWO2024052774A1 JP WO2024052774 A1 JPWO2024052774 A1 JP WO2024052774A1 JP 2024545077 A JP2024545077 A JP 2024545077A JP 2024545077 A JP2024545077 A JP 2024545077A JP WO2024052774 A1 JPWO2024052774 A1 JP WO2024052774A1
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2024545077A
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of JPWO2024052774A1 publication Critical patent/JPWO2024052774A1/ja
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10BELECTRONIC MEMORY DEVICES
    • H10B53/00Ferroelectric RAM [FeRAM] devices comprising ferroelectric memory capacitors
    • H10B53/20Ferroelectric RAM [FeRAM] devices comprising ferroelectric memory capacitors characterised by the three-dimensional [3D] arrangements, e.g. with cells on different height levels
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D30/00Field-effect transistors [FET]
    • H10D30/01Manufacture or treatment
    • H10D30/021Manufacture or treatment of FETs having insulated gates [IGFET]
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D30/00Field-effect transistors [FET]
    • H10D30/60Insulated-gate field-effect transistors [IGFET]
    • H10D30/67Thin-film transistors [TFT]
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D84/00Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D84/00Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
    • H10D84/01Manufacture or treatment
    • H10D84/0123Integrating together multiple components covered by H10D12/00 or H10D30/00, e.g. integrating multiple IGBTs
    • H10D84/0126Integrating together multiple components covered by H10D12/00 or H10D30/00, e.g. integrating multiple IGBTs the components including insulated gates, e.g. IGFETs
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D84/00Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
    • H10D84/01Manufacture or treatment
    • H10D84/02Manufacture or treatment characterised by using material-based technologies
    • H10D84/03Manufacture or treatment characterised by using material-based technologies using Group IV technology, e.g. silicon technology or silicon-carbide [SiC] technology
    • H10D84/038Manufacture or treatment characterised by using material-based technologies using Group IV technology, e.g. silicon technology or silicon-carbide [SiC] technology using silicon technology, e.g. SiGe
JP2024545077A 2022-09-08 2023-09-01 Pending JPWO2024052774A1 (https=)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2022142989 2022-09-08
PCT/IB2023/058644 WO2024052774A1 (ja) 2022-09-08 2023-09-01 半導体装置の作製方法

Publications (1)

Publication Number Publication Date
JPWO2024052774A1 true JPWO2024052774A1 (https=) 2024-03-14

Family

ID=90192115

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2024545077A Pending JPWO2024052774A1 (https=) 2022-09-08 2023-09-01

Country Status (2)

Country Link
JP (1) JPWO2024052774A1 (https=)
WO (1) WO2024052774A1 (https=)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW202604247A (zh) * 2024-04-19 2026-01-16 日商半導體能源研究所股份有限公司 半導體裝置
WO2025233772A1 (ja) * 2024-05-10 2025-11-13 株式会社半導体エネルギー研究所 半導体装置
WO2025243155A1 (ja) * 2024-05-23 2025-11-27 株式会社半導体エネルギー研究所 半導体装置

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000349301A (ja) * 1999-04-01 2000-12-15 Semiconductor Energy Lab Co Ltd 半導体装置およびその作製方法
JP2005150494A (ja) * 2003-11-18 2005-06-09 Sony Corp 半導体装置の製造方法
JP5180121B2 (ja) * 2009-02-20 2013-04-10 東京エレクトロン株式会社 基板処理方法
JP2017168764A (ja) * 2016-03-18 2017-09-21 株式会社ジャパンディスプレイ 半導体装置
JP7015509B2 (ja) * 2017-03-10 2022-02-03 株式会社ナノマテックス はんだ接合工法

Also Published As

Publication number Publication date
WO2024052774A1 (ja) 2024-03-14

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