JPWO2023286164A1 - - Google Patents

Info

Publication number
JPWO2023286164A1
JPWO2023286164A1 JP2021560867A JP2021560867A JPWO2023286164A1 JP WO2023286164 A1 JPWO2023286164 A1 JP WO2023286164A1 JP 2021560867 A JP2021560867 A JP 2021560867A JP 2021560867 A JP2021560867 A JP 2021560867A JP WO2023286164 A1 JPWO2023286164 A1 JP WO2023286164A1
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2021560867A
Other versions
JP6989205B1 (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Application granted granted Critical
Publication of JP6989205B1 publication Critical patent/JP6989205B1/ja
Publication of JPWO2023286164A1 publication Critical patent/JPWO2023286164A1/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/02—Details
    • H01L31/0232—Optical elements or arrangements associated with the device
    • H01L31/02325—Optical elements or arrangements associated with the device the optical elements not being integrated nor being directly associated with the device
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/02—Details
    • G01J1/04—Optical or mechanical part supplementary adjustable parts
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B19/00—Condensers, e.g. light collectors or similar non-imaging optics
    • G02B19/0004—Condensers, e.g. light collectors or similar non-imaging optics characterised by the optical means employed
    • G02B19/0009—Condensers, e.g. light collectors or similar non-imaging optics characterised by the optical means employed having refractive surfaces only
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B19/00—Condensers, e.g. light collectors or similar non-imaging optics
    • G02B19/0033—Condensers, e.g. light collectors or similar non-imaging optics characterised by the use
    • G02B19/0076—Condensers, e.g. light collectors or similar non-imaging optics characterised by the use for use with a detector
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B3/00—Simple or compound lenses
    • G02B3/0006—Arrays
    • G02B3/0037—Arrays characterized by the distribution or form of lenses
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/02—Details
    • H01L31/0203—Containers; Encapsulations, e.g. encapsulation of photodiodes

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Electromagnetism (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Light Receiving Elements (AREA)
JP2021560867A 2021-07-13 2021-07-13 受光装置 Active JP6989205B1 (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2021/026313 WO2023286164A1 (ja) 2021-07-13 2021-07-13 受光装置

Publications (2)

Publication Number Publication Date
JP6989205B1 JP6989205B1 (ja) 2022-01-05
JPWO2023286164A1 true JPWO2023286164A1 (ja) 2023-01-19

Family

ID=79239839

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2021560867A Active JP6989205B1 (ja) 2021-07-13 2021-07-13 受光装置

Country Status (3)

Country Link
US (1) US20240128385A1 (ja)
JP (1) JP6989205B1 (ja)
WO (1) WO2023286164A1 (ja)

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001272274A (ja) * 2000-03-28 2001-10-05 Miyota Kk 焦電型赤外線センサ
JP4270265B2 (ja) * 2005-11-25 2009-05-27 パナソニック電工株式会社 半導体レンズの製造方法
JP2011163980A (ja) * 2010-02-10 2011-08-25 Toshiba Lighting & Technology Corp センサ装置
JP5761557B2 (ja) * 2011-03-23 2015-08-12 カシオ計算機株式会社 焦電型赤外線センサ装置、検出方法及びプログラム
JP2015232506A (ja) * 2014-06-10 2015-12-24 コニカミノルタ株式会社 アレイミラー系及び赤外線検知装置
JP2016080556A (ja) * 2014-10-20 2016-05-16 岡谷電機産業株式会社 赤外線センサ
US9977235B2 (en) * 2016-06-21 2018-05-22 Abl Ip Holding Llc Variable total internal reflection electrowetting lens assembly for a detector
TWI639022B (zh) * 2017-05-18 2018-10-21 吳志彥 光學元件的製作方法及光學感應裝置

Also Published As

Publication number Publication date
US20240128385A1 (en) 2024-04-18
WO2023286164A1 (ja) 2023-01-19
JP6989205B1 (ja) 2022-01-05

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