JPWO2023248860A1 - - Google Patents
Info
- Publication number
- JPWO2023248860A1 JPWO2023248860A1 JP2024528869A JP2024528869A JPWO2023248860A1 JP WO2023248860 A1 JPWO2023248860 A1 JP WO2023248860A1 JP 2024528869 A JP2024528869 A JP 2024528869A JP 2024528869 A JP2024528869 A JP 2024528869A JP WO2023248860 A1 JPWO2023248860 A1 JP WO2023248860A1
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B41/00—Component parts such as frames, beds, carriages, headstocks
- B24B41/06—Work supports, e.g. adjustable steadies
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B55/00—Safety devices for grinding or polishing machines; Accessories fitted to grinding or polishing machines for keeping tools or parts of the machine in good working condition
- B24B55/02—Equipment for cooling the grinding surfaces, e.g. devices for feeding coolant
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P50/00—Etching of wafers, substrates or parts of devices
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P52/00—Grinding, lapping or polishing of wafers, substrates or parts of devices
Landscapes
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Weting (AREA)
- Cleaning Or Drying Semiconductors (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2022101701 | 2022-06-24 | ||
| PCT/JP2023/021837 WO2023248860A1 (ja) | 2022-06-24 | 2023-06-13 | 基板処理装置および基板処理方法 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPWO2023248860A1 true JPWO2023248860A1 (https=) | 2023-12-28 |
| JPWO2023248860A5 JPWO2023248860A5 (https=) | 2025-02-28 |
Family
ID=89379764
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2024528869A Pending JPWO2023248860A1 (https=) | 2022-06-24 | 2023-06-13 |
Country Status (3)
| Country | Link |
|---|---|
| JP (1) | JPWO2023248860A1 (https=) |
| TW (1) | TW202419208A (https=) |
| WO (1) | WO2023248860A1 (https=) |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2004503081A (ja) * | 2000-06-30 | 2004-01-29 | エムイーエムシー・エレクトロニック・マテリアルズ・インコーポレイテッド | シリコンウェーハのエッチング方法 |
| JP2006151779A (ja) * | 2004-12-01 | 2006-06-15 | Sharp Corp | シリコン結晶基板の製造方法と製造装置 |
| JP2008066706A (ja) * | 2006-09-08 | 2008-03-21 | Samsung Electronics Co Ltd | エッチング液供給装置、エッチング装置及びエッチング方法 |
| JP2009218617A (ja) * | 2009-06-22 | 2009-09-24 | Tokyo Electron Ltd | 基板処理装置および基板処理方法 |
| JP2013065614A (ja) * | 2011-09-15 | 2013-04-11 | Pre-Tech At:Kk | シリコンウェーハのウェットエッチング方法及びウェットエッチング装置 |
| JP2018147908A (ja) * | 2015-07-27 | 2018-09-20 | 東京エレクトロン株式会社 | 基板処理方法および基板処理装置 |
-
2023
- 2023-06-13 JP JP2024528869A patent/JPWO2023248860A1/ja active Pending
- 2023-06-13 WO PCT/JP2023/021837 patent/WO2023248860A1/ja not_active Ceased
- 2023-06-14 TW TW112122094A patent/TW202419208A/zh unknown
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2004503081A (ja) * | 2000-06-30 | 2004-01-29 | エムイーエムシー・エレクトロニック・マテリアルズ・インコーポレイテッド | シリコンウェーハのエッチング方法 |
| JP2006151779A (ja) * | 2004-12-01 | 2006-06-15 | Sharp Corp | シリコン結晶基板の製造方法と製造装置 |
| JP2008066706A (ja) * | 2006-09-08 | 2008-03-21 | Samsung Electronics Co Ltd | エッチング液供給装置、エッチング装置及びエッチング方法 |
| JP2009218617A (ja) * | 2009-06-22 | 2009-09-24 | Tokyo Electron Ltd | 基板処理装置および基板処理方法 |
| JP2013065614A (ja) * | 2011-09-15 | 2013-04-11 | Pre-Tech At:Kk | シリコンウェーハのウェットエッチング方法及びウェットエッチング装置 |
| JP2018147908A (ja) * | 2015-07-27 | 2018-09-20 | 東京エレクトロン株式会社 | 基板処理方法および基板処理装置 |
Also Published As
| Publication number | Publication date |
|---|---|
| WO2023248860A1 (ja) | 2023-12-28 |
| TW202419208A (zh) | 2024-05-16 |
Similar Documents
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| A521 | Request for written amendment filed |
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| A621 | Written request for application examination |
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| A131 | Notification of reasons for refusal |
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| A521 | Request for written amendment filed |
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