JPWO2023119519A1 - - Google Patents

Info

Publication number
JPWO2023119519A1
JPWO2023119519A1 JP2022529932A JP2022529932A JPWO2023119519A1 JP WO2023119519 A1 JPWO2023119519 A1 JP WO2023119519A1 JP 2022529932 A JP2022529932 A JP 2022529932A JP 2022529932 A JP2022529932 A JP 2022529932A JP WO2023119519 A1 JPWO2023119519 A1 JP WO2023119519A1
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2022529932A
Other languages
Japanese (ja)
Other versions
JPWO2023119519A5 (de
JP7208441B1 (ja
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Publication date
Application filed filed Critical
Application granted granted Critical
Publication of JP7208441B1 publication Critical patent/JP7208441B1/ja
Publication of JPWO2023119519A1 publication Critical patent/JPWO2023119519A1/ja
Publication of JPWO2023119519A5 publication Critical patent/JPWO2023119519A5/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • GPHYSICS
    • G05CONTROLLING; REGULATING
    • G05BCONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B19/00Programme-control systems
    • G05B19/02Programme-control systems electric
    • G05B19/04Programme control other than numerical control, i.e. in sequence controllers or logic controllers
    • G05B19/05Programmable logic controllers, e.g. simulating logic interconnections of signals according to ladder diagrams or function charts
    • GPHYSICS
    • G05CONTROLLING; REGULATING
    • G05BCONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00Testing or monitoring of control systems or parts thereof
    • G05B23/02Electric testing or monitoring
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00Error detection; Error correction; Monitoring
    • G06F11/36Preventing errors by testing or debugging software

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Automation & Control Theory (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • General Engineering & Computer Science (AREA)
  • Debugging And Monitoring (AREA)
JP2022529932A 2021-12-22 2021-12-22 Fa制御テスト支援プログラム、fa制御テスト支援装置、fa制御テスト支援方法及びfa制御テスト支援システム Active JP7208441B1 (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2021/047688 WO2023119519A1 (ja) 2021-12-22 2021-12-22 Fa制御テスト支援プログラム、fa制御テスト支援装置、fa制御テスト支援方法及びfa制御テスト支援システム

Publications (3)

Publication Number Publication Date
JP7208441B1 JP7208441B1 (ja) 2023-01-18
JPWO2023119519A1 true JPWO2023119519A1 (de) 2023-06-29
JPWO2023119519A5 JPWO2023119519A5 (de) 2023-11-21

Family

ID=84939288

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2022529932A Active JP7208441B1 (ja) 2021-12-22 2021-12-22 Fa制御テスト支援プログラム、fa制御テスト支援装置、fa制御テスト支援方法及びfa制御テスト支援システム

Country Status (3)

Country Link
JP (1) JP7208441B1 (de)
CN (1) CN117642727A (de)
WO (1) WO2023119519A1 (de)

Family Cites Families (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH05165677A (ja) * 1991-12-16 1993-07-02 Mitsubishi Electric Corp テストプログラム作成装置
JP2939571B2 (ja) * 1992-08-24 1999-08-25 三菱電機株式会社 機能テストプログラム生成システム
JP2660163B2 (ja) * 1994-10-11 1997-10-08 有限会社アレフロジック アルゴリズム教育支援システム
JP3819639B2 (ja) * 1999-07-09 2006-09-13 株式会社東芝 プログラミング装置
JP2002148317A (ja) * 2000-11-07 2002-05-22 Yokogawa Electric Corp テストプログラム作成装置及びテストプログラム作成方法
JP2003140714A (ja) * 2001-11-05 2003-05-16 Mitsubishi Heavy Ind Ltd 図形言語プログラム作成プログラム、及び図形言語プログラム作成装置
JP2005043931A (ja) * 2003-07-22 2005-02-17 Hitachi Ltd プログラム自動生成システム及びプログラム自動生成方法
JP4379687B2 (ja) * 2003-07-25 2009-12-09 オムロン株式会社 シミュレーション支援ツールおよびラダープログラムの検証システムならびにプログラム製品
WO2005026962A2 (en) * 2003-09-15 2005-03-24 Selex Sensors And Airborne Systems Limited Improvements in or relating to test systems or programs
JP2005310056A (ja) * 2004-04-26 2005-11-04 Mitsubishi Electric Corp プログラム実行制御方式
JP2007249785A (ja) * 2006-03-17 2007-09-27 Fujitsu Ltd コンパイルプログラム、仮想データベースリモートアクセス用プログラムの製造方法、及び仮想データベースのリモートアクセス方法
JP5230587B2 (ja) * 2009-11-26 2013-07-10 三菱電機株式会社 ラダープログラムのプログラム試験装置、ラダープログラムのプログラム試験方法およびラダープログラムのプログラム試験用プログラム
JP2012103791A (ja) * 2010-11-08 2012-05-31 Mitsubishi Electric Corp プログラム試験装置、プログラム試験方法およびプログラム試験用プログラム
JP6037976B2 (ja) * 2013-08-26 2016-12-07 三菱電機株式会社 ソースコード生成装置
CN105408823B (zh) * 2014-05-08 2017-07-18 三菱电机株式会社 工程设计工具、程序编辑装置以及程序编辑系统
JP2017166967A (ja) * 2016-03-16 2017-09-21 株式会社ジェイテクト 検査システム
JP6946953B2 (ja) * 2017-11-10 2021-10-13 オムロン株式会社 制御プログラム開発支援装置、制御プログラム開発支援システム、制御プログラム開発支援方法、および、制御プログラム開発支援プログラム

Also Published As

Publication number Publication date
JP7208441B1 (ja) 2023-01-18
WO2023119519A1 (ja) 2023-06-29
CN117642727A (zh) 2024-03-01

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