JPWO2023119519A1 - - Google Patents
Info
- Publication number
- JPWO2023119519A1 JPWO2023119519A1 JP2022529932A JP2022529932A JPWO2023119519A1 JP WO2023119519 A1 JPWO2023119519 A1 JP WO2023119519A1 JP 2022529932 A JP2022529932 A JP 2022529932A JP 2022529932 A JP2022529932 A JP 2022529932A JP WO2023119519 A1 JPWO2023119519 A1 JP WO2023119519A1
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B19/00—Programme-control systems
- G05B19/02—Programme-control systems electric
- G05B19/04—Programme control other than numerical control, i.e. in sequence controllers or logic controllers
- G05B19/05—Programmable logic controllers, e.g. simulating logic interconnections of signals according to ladder diagrams or function charts
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B23/00—Testing or monitoring of control systems or parts thereof
- G05B23/02—Electric testing or monitoring
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/36—Preventing errors by testing or debugging software
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Theoretical Computer Science (AREA)
- Automation & Control Theory (AREA)
- Computer Hardware Design (AREA)
- Quality & Reliability (AREA)
- General Engineering & Computer Science (AREA)
- Debugging And Monitoring (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
PCT/JP2021/047688 WO2023119519A1 (ja) | 2021-12-22 | 2021-12-22 | Fa制御テスト支援プログラム、fa制御テスト支援装置、fa制御テスト支援方法及びfa制御テスト支援システム |
Publications (3)
Publication Number | Publication Date |
---|---|
JP7208441B1 JP7208441B1 (ja) | 2023-01-18 |
JPWO2023119519A1 true JPWO2023119519A1 (de) | 2023-06-29 |
JPWO2023119519A5 JPWO2023119519A5 (de) | 2023-11-21 |
Family
ID=84939288
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2022529932A Active JP7208441B1 (ja) | 2021-12-22 | 2021-12-22 | Fa制御テスト支援プログラム、fa制御テスト支援装置、fa制御テスト支援方法及びfa制御テスト支援システム |
Country Status (3)
Country | Link |
---|---|
JP (1) | JP7208441B1 (de) |
CN (1) | CN117642727A (de) |
WO (1) | WO2023119519A1 (de) |
Family Cites Families (17)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH05165677A (ja) * | 1991-12-16 | 1993-07-02 | Mitsubishi Electric Corp | テストプログラム作成装置 |
JP2939571B2 (ja) * | 1992-08-24 | 1999-08-25 | 三菱電機株式会社 | 機能テストプログラム生成システム |
JP2660163B2 (ja) * | 1994-10-11 | 1997-10-08 | 有限会社アレフロジック | アルゴリズム教育支援システム |
JP3819639B2 (ja) * | 1999-07-09 | 2006-09-13 | 株式会社東芝 | プログラミング装置 |
JP2002148317A (ja) * | 2000-11-07 | 2002-05-22 | Yokogawa Electric Corp | テストプログラム作成装置及びテストプログラム作成方法 |
JP2003140714A (ja) * | 2001-11-05 | 2003-05-16 | Mitsubishi Heavy Ind Ltd | 図形言語プログラム作成プログラム、及び図形言語プログラム作成装置 |
JP2005043931A (ja) * | 2003-07-22 | 2005-02-17 | Hitachi Ltd | プログラム自動生成システム及びプログラム自動生成方法 |
JP4379687B2 (ja) * | 2003-07-25 | 2009-12-09 | オムロン株式会社 | シミュレーション支援ツールおよびラダープログラムの検証システムならびにプログラム製品 |
WO2005026962A2 (en) * | 2003-09-15 | 2005-03-24 | Selex Sensors And Airborne Systems Limited | Improvements in or relating to test systems or programs |
JP2005310056A (ja) * | 2004-04-26 | 2005-11-04 | Mitsubishi Electric Corp | プログラム実行制御方式 |
JP2007249785A (ja) * | 2006-03-17 | 2007-09-27 | Fujitsu Ltd | コンパイルプログラム、仮想データベースリモートアクセス用プログラムの製造方法、及び仮想データベースのリモートアクセス方法 |
JP5230587B2 (ja) * | 2009-11-26 | 2013-07-10 | 三菱電機株式会社 | ラダープログラムのプログラム試験装置、ラダープログラムのプログラム試験方法およびラダープログラムのプログラム試験用プログラム |
JP2012103791A (ja) * | 2010-11-08 | 2012-05-31 | Mitsubishi Electric Corp | プログラム試験装置、プログラム試験方法およびプログラム試験用プログラム |
JP6037976B2 (ja) * | 2013-08-26 | 2016-12-07 | 三菱電機株式会社 | ソースコード生成装置 |
CN105408823B (zh) * | 2014-05-08 | 2017-07-18 | 三菱电机株式会社 | 工程设计工具、程序编辑装置以及程序编辑系统 |
JP2017166967A (ja) * | 2016-03-16 | 2017-09-21 | 株式会社ジェイテクト | 検査システム |
JP6946953B2 (ja) * | 2017-11-10 | 2021-10-13 | オムロン株式会社 | 制御プログラム開発支援装置、制御プログラム開発支援システム、制御プログラム開発支援方法、および、制御プログラム開発支援プログラム |
-
2021
- 2021-12-22 CN CN202180100104.8A patent/CN117642727A/zh active Pending
- 2021-12-22 JP JP2022529932A patent/JP7208441B1/ja active Active
- 2021-12-22 WO PCT/JP2021/047688 patent/WO2023119519A1/ja active Application Filing
Also Published As
Publication number | Publication date |
---|---|
JP7208441B1 (ja) | 2023-01-18 |
WO2023119519A1 (ja) | 2023-06-29 |
CN117642727A (zh) | 2024-03-01 |
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