JPWO2023090111A5 - - Google Patents

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Publication number
JPWO2023090111A5
JPWO2023090111A5 JP2023561498A JP2023561498A JPWO2023090111A5 JP WO2023090111 A5 JPWO2023090111 A5 JP WO2023090111A5 JP 2023561498 A JP2023561498 A JP 2023561498A JP 2023561498 A JP2023561498 A JP 2023561498A JP WO2023090111 A5 JPWO2023090111 A5 JP WO2023090111A5
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Japan
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concentration
liquid sample
component
measures
spectrum
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JP2023561498A
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English (en)
Japanese (ja)
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JPWO2023090111A1 (https=
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Priority claimed from PCT/JP2022/040152 external-priority patent/WO2023090111A1/ja
Publication of JPWO2023090111A1 publication Critical patent/JPWO2023090111A1/ja
Publication of JPWO2023090111A5 publication Critical patent/JPWO2023090111A5/ja
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JP2023561498A 2021-11-22 2022-10-27 Pending JPWO2023090111A1 (https=)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2021189411 2021-11-22
JP2022102114 2022-06-24
PCT/JP2022/040152 WO2023090111A1 (ja) 2021-11-22 2022-10-27 成分濃度測定装置、成分濃度測定プログラム、及び、成分濃度測定方法

Publications (2)

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JPWO2023090111A1 JPWO2023090111A1 (https=) 2023-05-25
JPWO2023090111A5 true JPWO2023090111A5 (https=) 2024-08-05

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ID=86396814

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JP2023561498A Pending JPWO2023090111A1 (https=) 2021-11-22 2022-10-27

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US (1) US20250044209A1 (https=)
JP (1) JPWO2023090111A1 (https=)
KR (1) KR20240112258A (https=)
TW (1) TW202321675A (https=)
WO (1) WO2023090111A1 (https=)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR102722361B1 (ko) * 2024-06-17 2024-10-25 주식회사 동서라인텍 산 분석이 가능한 xrf 분석장치

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3780646B2 (ja) * 1997-07-18 2006-05-31 富士電機システムズ株式会社 下水中の複数成分定量方法とその装置
JP2000356635A (ja) * 1999-06-15 2000-12-26 Meidensha Corp クロロフィルa濃度測定方法及びその装置
JP4054854B2 (ja) * 2000-10-17 2008-03-05 独立行政法人農業・食品産業技術総合研究機構 近赤外分光法を用いた液状試料の分析法
JP5256451B2 (ja) * 2007-01-12 2013-08-07 国立大学法人 奈良先端科学技術大学院大学 カーボンナノチューブ分散液およびその製造方法、並びにその利用
JP2012154698A (ja) * 2011-01-24 2012-08-16 Mitsubishi Heavy Ind Ltd 酸濃度計測装置
JP5947709B2 (ja) 2012-12-27 2016-07-06 株式会社堀場製作所 分光分析方法及び分光分析装置
JP7232696B2 (ja) * 2019-04-15 2023-03-03 株式会社日立製作所 光分析方法および光分析システム

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