JPWO2023079803A1 - - Google Patents
Info
- Publication number
- JPWO2023079803A1 JPWO2023079803A1 JP2023557628A JP2023557628A JPWO2023079803A1 JP WO2023079803 A1 JPWO2023079803 A1 JP WO2023079803A1 JP 2023557628 A JP2023557628 A JP 2023557628A JP 2023557628 A JP2023557628 A JP 2023557628A JP WO2023079803 A1 JPWO2023079803 A1 JP WO2023079803A1
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
- G01Q60/00—Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
- G01Q60/24—AFM [Atomic Force Microscopy] or apparatus therefor, e.g. AFM probes
- G01Q60/30—Scanning potential microscopy
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Radiology & Medical Imaging (AREA)
- Length Measuring Devices With Unspecified Measuring Means (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2021181933 | 2021-11-08 | ||
| PCT/JP2022/028894 WO2023079803A1 (ja) | 2021-11-08 | 2022-07-27 | 走査型プローブ顕微鏡 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPWO2023079803A1 true JPWO2023079803A1 (ja) | 2023-05-11 |
| JPWO2023079803A5 JPWO2023079803A5 (ja) | 2024-06-07 |
Family
ID=86241158
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2023557628A Pending JPWO2023079803A1 (ja) | 2021-11-08 | 2022-07-27 |
Country Status (3)
| Country | Link |
|---|---|
| JP (1) | JPWO2023079803A1 (ja) |
| CN (1) | CN118202251A (ja) |
| WO (1) | WO2023079803A1 (ja) |
Family Cites Families (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0758164B2 (ja) * | 1988-04-22 | 1995-06-21 | 三菱電機株式会社 | 走査型トンネル顕微鏡の微動機構 |
| JP3014872B2 (ja) * | 1992-10-28 | 2000-02-28 | キヤノン株式会社 | 探針−試料間距離制御機構およびその使用装置 |
| JPH0943258A (ja) * | 1995-08-02 | 1997-02-14 | Olympus Optical Co Ltd | 走査型プローブ顕微鏡を用いた吸着力測定方法 |
| JP4098921B2 (ja) * | 1999-05-19 | 2008-06-11 | 日立建機株式会社 | 走査型プローブ顕微鏡の探針押付け力設定方法 |
| US7770231B2 (en) * | 2007-08-02 | 2010-08-03 | Veeco Instruments, Inc. | Fast-scanning SPM and method of operating same |
| WO2009136490A1 (ja) * | 2008-05-09 | 2009-11-12 | 国立大学法人京都大学 | 表面物性計測方法、および表面物性計測装置 |
| EP2219035A1 (en) * | 2009-02-16 | 2010-08-18 | Institut Curie | Method for automatic adjustment of the applied force and control of the force drift in an Atomic Force Microscope during contact mode imaging. |
| JP2018173310A (ja) * | 2017-03-31 | 2018-11-08 | 国立大学法人京都工芸繊維大学 | 測定精度の評価方法、弾性率の測定方法、プログラム、および走査型プローブ顕微鏡システム |
| JP6848640B2 (ja) * | 2017-04-17 | 2021-03-24 | 株式会社島津製作所 | 走査型プローブ顕微鏡 |
-
2022
- 2022-07-27 JP JP2023557628A patent/JPWO2023079803A1/ja active Pending
- 2022-07-27 WO PCT/JP2022/028894 patent/WO2023079803A1/ja active Application Filing
- 2022-07-27 CN CN202280074170.7A patent/CN118202251A/zh active Pending
Also Published As
| Publication number | Publication date |
|---|---|
| CN118202251A (zh) | 2024-06-14 |
| WO2023079803A1 (ja) | 2023-05-11 |
Similar Documents
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20240315 |
|
| A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20240315 |
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| A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20240410 |