JPWO2023068309A1 - - Google Patents
Info
- Publication number
- JPWO2023068309A1 JPWO2023068309A1 JP2023514848A JP2023514848A JPWO2023068309A1 JP WO2023068309 A1 JPWO2023068309 A1 JP WO2023068309A1 JP 2023514848 A JP2023514848 A JP 2023514848A JP 2023514848 A JP2023514848 A JP 2023514848A JP WO2023068309 A1 JPWO2023068309 A1 JP WO2023068309A1
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
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- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B29/00—Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
- C30B29/10—Inorganic compounds or compositions
- C30B29/36—Carbides
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/20—Deposition of semiconductor materials on a substrate, e.g. epitaxial growth solid phase epitaxy
- H01L21/2003—Deposition of semiconductor materials on a substrate, e.g. epitaxial growth solid phase epitaxy characterised by the substrate
- H01L21/2015—Deposition of semiconductor materials on a substrate, e.g. epitaxial growth solid phase epitaxy characterised by the substrate the substrate being of crystalline semiconductor material, e.g. lattice adaptation, heteroepitaxy
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Crystallography & Structural Chemistry (AREA)
- Organic Chemistry (AREA)
- Materials Engineering (AREA)
- Metallurgy (AREA)
- Inorganic Chemistry (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Crystals, And After-Treatments Of Crystals (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2021039155 | 2021-10-22 | ||
PCT/JP2022/039004 WO2023068309A1 (ja) | 2021-10-22 | 2022-10-19 | SiC基板及びSiC複合基板 |
Publications (1)
Publication Number | Publication Date |
---|---|
JPWO2023068309A1 true JPWO2023068309A1 (ja) | 2023-04-27 |
Family
ID=86058268
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2023514848A Pending JPWO2023068309A1 (ja) | 2021-10-22 | 2022-10-19 |
Country Status (3)
Country | Link |
---|---|
JP (1) | JPWO2023068309A1 (ja) |
CN (1) | CN117529584A (ja) |
WO (1) | WO2023068309A1 (ja) |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2939615B2 (ja) * | 1998-02-04 | 1999-08-25 | 日本ピラー工業株式会社 | 単結晶SiC及びその製造方法 |
US6507046B2 (en) * | 2001-05-11 | 2003-01-14 | Cree, Inc. | High-resistivity silicon carbide substrate for semiconductor devices with high break down voltage |
JP6069758B2 (ja) | 2012-08-26 | 2017-02-01 | 国立大学法人名古屋大学 | SiC単結晶の製造方法 |
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2022
- 2022-10-19 CN CN202280043244.0A patent/CN117529584A/zh active Pending
- 2022-10-19 WO PCT/JP2022/039004 patent/WO2023068309A1/ja active Application Filing
- 2022-10-19 JP JP2023514848A patent/JPWO2023068309A1/ja active Pending
Also Published As
Publication number | Publication date |
---|---|
WO2023068309A1 (ja) | 2023-04-27 |
CN117529584A (zh) | 2024-02-06 |
Similar Documents
Legal Events
Date | Code | Title | Description |
---|---|---|---|
A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20230302 |
|
A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20240527 |