JPWO2023017636A1 - - Google Patents

Info

Publication number
JPWO2023017636A1
JPWO2023017636A1 JP2023541212A JP2023541212A JPWO2023017636A1 JP WO2023017636 A1 JPWO2023017636 A1 JP WO2023017636A1 JP 2023541212 A JP2023541212 A JP 2023541212A JP 2023541212 A JP2023541212 A JP 2023541212A JP WO2023017636 A1 JPWO2023017636 A1 JP WO2023017636A1
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2023541212A
Other versions
JPWO2023017636A5 (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of JPWO2023017636A1 publication Critical patent/JPWO2023017636A1/ja
Publication of JPWO2023017636A5 publication Critical patent/JPWO2023017636A5/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/2209—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material using wavelength dispersive spectroscopy [WDS]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
JP2023541212A 2021-08-10 2022-03-15 Pending JPWO2023017636A1 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2021130571 2021-08-10
PCT/JP2022/011513 WO2023017636A1 (ja) 2021-08-10 2022-03-15 Ｘ線分析装置

Publications (2)

Publication Number Publication Date
JPWO2023017636A1 true JPWO2023017636A1 (ja) 2023-02-16
JPWO2023017636A5 JPWO2023017636A5 (ja) 2024-04-09

Family

ID=85200136

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2023541212A Pending JPWO2023017636A1 (ja) 2021-08-10 2022-03-15

Country Status (3)

Country Link
JP (1) JPWO2023017636A1 (ja)
CN (1) CN117836615A (ja)
WO (1) WO2023017636A1 (ja)

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0795045B2 (ja) * 1988-01-12 1995-10-11 株式会社島津製作所 Ｘ線分光装置
JP3078168B2 (ja) * 1994-02-28 2000-08-21 三菱電機株式会社 電磁波検出装置及び基板加工装置
JPH10503027A (ja) * 1995-05-04 1998-03-17 フィリップス エレクトロニクス ネムローゼ フェンノートシャップ 検出器の移動が簡単化されたｘ線分析装置
WO1997005474A1 (en) * 1995-07-25 1997-02-13 Philips Electronics N.V. X-ray spectrometer comprising a plurality of fixed measuring channels
JP2010286346A (ja) * 2009-06-11 2010-12-24 Shimadzu Corp 分光器
WO2018175570A1 (en) * 2017-03-22 2018-09-27 Sigray, Inc. Method of performing x-ray spectroscopy and x-ray absorption spectrometer system
WO2018211664A1 (ja) * 2017-05-18 2018-11-22 株式会社島津製作所 Ｘ線分光分析装置
JP7380421B2 (ja) * 2020-05-27 2023-11-15 株式会社島津製作所 Ｘ線分析装置およびｘ線分析方法
JP2021189088A (ja) * 2020-06-02 2021-12-13 株式会社島津製作所 分析装置および分析方法

Also Published As

Publication number Publication date
CN117836615A (zh) 2024-04-05
WO2023017636A1 (ja) 2023-02-16

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Legal Events

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A521 Request for written amendment filed

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Effective date: 20240110

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Effective date: 20240110