JPWO2023008069A1 - - Google Patents

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Publication number
JPWO2023008069A1
JPWO2023008069A1 JP2023538359A JP2023538359A JPWO2023008069A1 JP WO2023008069 A1 JPWO2023008069 A1 JP WO2023008069A1 JP 2023538359 A JP2023538359 A JP 2023538359A JP 2023538359 A JP2023538359 A JP 2023538359A JP WO2023008069 A1 JPWO2023008069 A1 JP WO2023008069A1
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2023538359A
Other languages
Japanese (ja)
Other versions
JP7614360B2 (ja
JPWO2023008069A5 (https=
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of JPWO2023008069A1 publication Critical patent/JPWO2023008069A1/ja
Publication of JPWO2023008069A5 publication Critical patent/JPWO2023008069A5/ja
Application granted granted Critical
Publication of JP7614360B2 publication Critical patent/JP7614360B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00584Control arrangements for automatic analysers
    • G01N35/00722Communications; Identification
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N2035/00178Special arrangements of analysers
    • G01N2035/00306Housings, cabinets, control panels (details)
    • G01N2035/00316Detecting door closure
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00584Control arrangements for automatic analysers
    • G01N35/00722Communications; Identification
    • G01N2035/00891Displaying information to the operator
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00584Control arrangements for automatic analysers
    • G01N35/00722Communications; Identification
    • G01N2035/00891Displaying information to the operator
    • G01N2035/009Displaying information to the operator alarms, e.g. audible
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00584Control arrangements for automatic analysers
    • G01N35/00722Communications; Identification
    • G01N2035/00891Displaying information to the operator
    • G01N2035/0091GUI [graphical user interfaces]
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/02Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations
    • G01N35/04Details of the conveyor system
    • G01N2035/0439Rotary sample carriers, i.e. carousels
    • G01N2035/0443Rotary sample carriers, i.e. carousels for reagents
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/10Devices for transferring samples or any liquids to, in, or from, the analysis apparatus, e.g. suction devices, injection devices
    • G01N35/1002Reagent dispensers

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Automatic Analysis And Handling Materials Therefor (AREA)
JP2023538359A 2021-07-29 2022-06-29 自動分析装置、および自動分析装置でのガイダンス方法 Active JP7614360B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2021123894 2021-07-29
JP2021123894 2021-07-29
PCT/JP2022/026088 WO2023008069A1 (ja) 2021-07-29 2022-06-29 自動分析装置、および自動分析装置でのガイダンス方法

Publications (3)

Publication Number Publication Date
JPWO2023008069A1 true JPWO2023008069A1 (https=) 2023-02-02
JPWO2023008069A5 JPWO2023008069A5 (https=) 2024-05-24
JP7614360B2 JP7614360B2 (ja) 2025-01-15

Family

ID=85087940

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2023538359A Active JP7614360B2 (ja) 2021-07-29 2022-06-29 自動分析装置、および自動分析装置でのガイダンス方法

Country Status (4)

Country Link
EP (1) EP4379390A4 (https=)
JP (1) JP7614360B2 (https=)
CN (1) CN117616285A (https=)
WO (1) WO2023008069A1 (https=)

Citations (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010139485A (ja) * 2008-12-15 2010-06-24 Toshiba Corp 自動分析装置
JP2010256345A (ja) * 2009-03-30 2010-11-11 Hitachi High-Technologies Corp 自動分析装置
JP2010276375A (ja) * 2009-05-26 2010-12-09 Toshiba Corp 自動分析装置
JP2013072799A (ja) * 2011-09-28 2013-04-22 Hitachi High-Technologies Corp 自動分析装置
JP2014163855A (ja) * 2013-02-26 2014-09-08 Sysmex Corp 検体処理装置および検体処理システム
JP2017146251A (ja) * 2016-02-19 2017-08-24 株式会社日立ハイテクノロジーズ 自動分析装置
WO2019053991A1 (ja) * 2017-09-13 2019-03-21 株式会社日立ハイテクノロジーズ 自動分析装置
JP2020101465A (ja) * 2018-12-21 2020-07-02 シスメックス株式会社 検体測定装置および検体測定方法
WO2020217720A1 (ja) * 2019-04-24 2020-10-29 株式会社日立ハイテク 自動分析装置および自動分析装置におけるメンテナンスガイド方法
WO2021140741A1 (ja) * 2020-01-07 2021-07-15 株式会社日立ハイテク 自動分析装置、自動分析装置の表示システム、および自動分析装置における表示方法

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5009684B2 (ja) * 2006-06-30 2012-08-22 シスメックス株式会社 試料分析装置
JP5894334B1 (ja) 2015-11-27 2016-03-30 シスメックス株式会社 検体測定装置および表示方法

Patent Citations (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010139485A (ja) * 2008-12-15 2010-06-24 Toshiba Corp 自動分析装置
JP2010256345A (ja) * 2009-03-30 2010-11-11 Hitachi High-Technologies Corp 自動分析装置
JP2010276375A (ja) * 2009-05-26 2010-12-09 Toshiba Corp 自動分析装置
JP2013072799A (ja) * 2011-09-28 2013-04-22 Hitachi High-Technologies Corp 自動分析装置
JP2014163855A (ja) * 2013-02-26 2014-09-08 Sysmex Corp 検体処理装置および検体処理システム
JP2017146251A (ja) * 2016-02-19 2017-08-24 株式会社日立ハイテクノロジーズ 自動分析装置
WO2019053991A1 (ja) * 2017-09-13 2019-03-21 株式会社日立ハイテクノロジーズ 自動分析装置
JP2020101465A (ja) * 2018-12-21 2020-07-02 シスメックス株式会社 検体測定装置および検体測定方法
WO2020217720A1 (ja) * 2019-04-24 2020-10-29 株式会社日立ハイテク 自動分析装置および自動分析装置におけるメンテナンスガイド方法
WO2021140741A1 (ja) * 2020-01-07 2021-07-15 株式会社日立ハイテク 自動分析装置、自動分析装置の表示システム、および自動分析装置における表示方法

Also Published As

Publication number Publication date
EP4379390A1 (en) 2024-06-05
JP7614360B2 (ja) 2025-01-15
EP4379390A4 (en) 2025-07-09
CN117616285A (zh) 2024-02-27
WO2023008069A1 (ja) 2023-02-02

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