JPWO2022230538A1 - - Google Patents

Info

Publication number
JPWO2022230538A1
JPWO2022230538A1 JP2022567175A JP2022567175A JPWO2022230538A1 JP WO2022230538 A1 JPWO2022230538 A1 JP WO2022230538A1 JP 2022567175 A JP2022567175 A JP 2022567175A JP 2022567175 A JP2022567175 A JP 2022567175A JP WO2022230538 A1 JPWO2022230538 A1 JP WO2022230538A1
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2022567175A
Other versions
JPWO2022230538A5 (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of JPWO2022230538A1 publication Critical patent/JPWO2022230538A1/ja
Publication of JPWO2022230538A5 publication Critical patent/JPWO2022230538A5/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T7/00—Details of radiation-measuring instruments
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/24—Measuring radiation intensity with semiconductor detectors
    • G01T1/244—Auxiliary details, e.g. casings, cooling, damping or insulation against damage by, e.g. heat, pressure or the like
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/07—Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076—X-ray fluorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/07—Investigating materials by wave or particle radiation secondary emission
    • G01N2223/079—Investigating materials by wave or particle radiation secondary emission incident electron beam and measuring excited X-rays
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/50—Detectors
    • G01N2223/507—Detectors secondary-emission detector
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/225—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material using electron or ion
    • G01N23/2251—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material using electron or ion using incident electron beams, e.g. scanning electron microscopy [SEM]
    • G01N23/2252—Measuring emitted X-rays, e.g. electron probe microanalysis [EPMA]

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Measurement Of Radiation (AREA)
JP2022567175A 2021-04-30 2022-03-28 Pending JPWO2022230538A1 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2021078085 2021-04-30
PCT/JP2022/015111 WO2022230538A1 (ja) 2021-04-30 2022-03-28 放射線検出器及び放射線検出装置

Publications (2)

Publication Number Publication Date
JPWO2022230538A1 true JPWO2022230538A1 (ja) 2022-11-03
JPWO2022230538A5 JPWO2022230538A5 (ja) 2024-02-02

Family

ID=83848049

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2022567175A Pending JPWO2022230538A1 (ja) 2021-04-30 2022-03-28

Country Status (5)

Country Link
US (1) US12044816B2 (ja)
EP (1) EP4145183A4 (ja)
JP (1) JPWO2022230538A1 (ja)
CN (1) CN115702367A (ja)
WO (1) WO2022230538A1 (ja)

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60192285A (ja) * 1984-03-13 1985-09-30 Hitachi Medical Corp 電離箱形放射線検出器
WO2006018767A2 (en) * 2004-08-13 2006-02-23 Koninklijke Philips Electronics, N.V. Solid state radiation detector packaging technique
JP4384006B2 (ja) 2004-10-28 2009-12-16 株式会社リガク Ｘ線検出装置
JP2010237138A (ja) * 2009-03-31 2010-10-21 Fujifilm Corp 放射線検出装置
JP5247751B2 (ja) 2010-03-19 2013-07-24 中国電力株式会社 放射性物質管理施設用電気装置及びその電子機器監視方法
DE102010044289A1 (de) * 2010-09-03 2012-03-08 Pndetector Gmbh Detektormodul zur Strahlungsdetektion
JP6063160B2 (ja) 2012-07-20 2017-01-18 株式会社堀場製作所 放射線検出器
JP5600722B2 (ja) 2012-11-02 2014-10-01 株式会社堀場製作所 放射線検出器、放射線検出装置、及びｘ線分析装置
DE112018006397T5 (de) 2017-12-15 2020-08-20 Horiba Ltd. Silizium-drift-detektionselement, silizium-drift-detektor und strahlungsdetektionsvorrichtung
JP6899344B2 (ja) 2018-02-22 2021-07-07 株式会社東芝 放射線検出器

Also Published As

Publication number Publication date
US12044816B2 (en) 2024-07-23
CN115702367A (zh) 2023-02-14
EP4145183A1 (en) 2023-03-08
US20230228891A1 (en) 2023-07-20
EP4145183A4 (en) 2024-05-01
WO2022230538A1 (ja) 2022-11-03

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Legal Events

Date Code Title Description
A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20221102