JPWO2022208690A1 - - Google Patents

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Publication number
JPWO2022208690A1
JPWO2022208690A1 JP2021560891A JP2021560891A JPWO2022208690A1 JP WO2022208690 A1 JPWO2022208690 A1 JP WO2022208690A1 JP 2021560891 A JP2021560891 A JP 2021560891A JP 2021560891 A JP2021560891 A JP 2021560891A JP WO2022208690 A1 JPWO2022208690 A1 JP WO2022208690A1
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2021560891A
Other languages
Japanese (ja)
Other versions
JP7101905B1 (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Application granted granted Critical
Publication of JP7101905B1 publication Critical patent/JP7101905B1/ja
Publication of JPWO2022208690A1 publication Critical patent/JPWO2022208690A1/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F30/00Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors
    • H10F30/20Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors
    • H10F30/21Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors the devices being sensitive to infrared, visible or ultraviolet radiation
    • H10F30/22Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors the devices being sensitive to infrared, visible or ultraviolet radiation the devices having only one potential barrier, e.g. photodiodes
    • H10F30/221Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors the devices being sensitive to infrared, visible or ultraviolet radiation the devices having only one potential barrier, e.g. photodiodes the potential barrier being a PN homojunction
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F77/00Constructional details of devices covered by this subclass
    • H10F77/93Interconnections
    • H10F77/933Interconnections for devices having potential barriers
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00Photometry, e.g. photographic exposure meter
    • G01J1/02Details
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F77/00Constructional details of devices covered by this subclass
    • H10F77/10Semiconductor bodies
    • H10F77/14Shape of semiconductor bodies; Shapes, relative sizes or dispositions of semiconductor regions within semiconductor bodies
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F77/00Constructional details of devices covered by this subclass
    • H10F77/20Electrodes
    • H10F77/206Electrodes for devices having potential barriers
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F77/00Constructional details of devices covered by this subclass
    • H10F77/20Electrodes
    • H10F77/206Electrodes for devices having potential barriers
    • H10F77/241Electrodes for devices having potential barriers comprising ring electrodes
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F77/00Constructional details of devices covered by this subclass
    • H10F77/20Electrodes
    • H10F77/244Electrodes made of transparent conductive layers, e.g. transparent conductive oxide [TCO] layers

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Light Receiving Elements (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
JP2021560891A 2021-03-30 2021-03-30 電磁波検出器、及び電磁波検出器アレイ Active JP7101905B1 (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2021/013671 WO2022208690A1 (ja) 2021-03-30 2021-03-30 電磁波検出器、電磁波検出器アレイ、および電磁波検出器の製造方法

Publications (2)

Publication Number Publication Date
JP7101905B1 JP7101905B1 (ja) 2022-07-15
JPWO2022208690A1 true JPWO2022208690A1 (https=) 2022-10-06

Family

ID=82446220

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2021560891A Active JP7101905B1 (ja) 2021-03-30 2021-03-30 電磁波検出器、及び電磁波検出器アレイ

Country Status (4)

Country Link
US (1) US20240154046A1 (https=)
JP (1) JP7101905B1 (https=)
CN (1) CN117063298A (https=)
WO (1) WO2022208690A1 (https=)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2022235423A2 (en) * 2021-04-19 2022-11-10 Board Of Regents, The University Of Texas System Photoelectrodes and methods of making and use thereof
CN119092590B (zh) * 2024-08-27 2026-01-09 中国电子科技集团公司第十一研究所 n p n中中双色碲镉汞红外光电探测器半导体器件及制备方法
CN119379669B (zh) * 2024-12-24 2025-04-04 杭州睿影科技有限公司 图像检测方法及计算机程序产品

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8878157B2 (en) * 2011-10-20 2014-11-04 University Of Kansas Semiconductor-graphene hybrids formed using solution growth
JP5969843B2 (ja) * 2012-07-17 2016-08-17 日本放送協会 有機光電変換素子、及び、これを含む受光素子
US20150243826A1 (en) * 2012-08-28 2015-08-27 Northeastern University Tunable heterojunction for multifunctional electronics and photovoltaics
US10354935B2 (en) * 2014-06-10 2019-07-16 Iucf-Hyu (Industry-University Cooperation Foundation Hanyang University) Graphene structure and method for manufacturing the same
US9882153B2 (en) * 2015-06-25 2018-01-30 International Business Machines Corporation Organic monolayer passivation and silicon heterojunction photovoltaic devices using the same
KR102313052B1 (ko) * 2016-02-02 2021-10-15 버세리엔 피엘씨 그래핀 기반 박막 적층체의 제조방법 및 상기 그래핀 기반 박막 적층체
KR20190113820A (ko) * 2017-02-08 2019-10-08 트리나미엑스 게엠베하 적어도 하나의 대상체의 광학적 검출을 위한 검출기
US10777662B2 (en) * 2017-11-22 2020-09-15 Shenzhen China Star Optoelectronics Semiconductor Display Technology Co., Ltd. Thin film transistor and manufacturing method thereof
WO2020184015A1 (ja) * 2019-03-12 2020-09-17 パナソニックIpマネジメント株式会社 撮像素子、撮像素子の製造方法及び撮像装置
CN120358826A (zh) * 2019-06-03 2025-07-22 蒂梅尔罗德科技有限责任公司 高效率石墨烯/宽带隙半导体异质结太阳能电池
CN114041210B (zh) * 2019-07-04 2024-07-12 三菱电机株式会社 电磁波检测器

Also Published As

Publication number Publication date
US20240154046A1 (en) 2024-05-09
CN117063298A (zh) 2023-11-14
JP7101905B1 (ja) 2022-07-15
WO2022208690A1 (ja) 2022-10-06

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