JPWO2022176686A1 - - Google Patents
Info
- Publication number
- JPWO2022176686A1 JPWO2022176686A1 JP2023500747A JP2023500747A JPWO2022176686A1 JP WO2022176686 A1 JPWO2022176686 A1 JP WO2022176686A1 JP 2023500747 A JP2023500747 A JP 2023500747A JP 2023500747 A JP2023500747 A JP 2023500747A JP WO2022176686 A1 JPWO2022176686 A1 JP WO2022176686A1
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
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- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
- G06V10/00—Arrangements for image or video recognition or understanding
- G06V10/20—Image preprocessing
- G06V10/25—Determination of region of interest [ROI] or a volume of interest [VOI]
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/28—Investigating the spectrum
- G01J3/2823—Imaging spectrometer
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/94—Investigating contamination, e.g. dust
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T5/00—Image enhancement or restoration
- G06T5/20—Image enhancement or restoration using local operators
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/0002—Inspection of images, e.g. flaw detection
- G06T7/0004—Industrial image inspection
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T9/00—Image coding
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
- G06V10/00—Arrangements for image or video recognition or understanding
- G06V10/10—Image acquisition
- G06V10/12—Details of acquisition arrangements; Constructional details thereof
- G06V10/14—Optical characteristics of the device performing the acquisition or on the illumination arrangements
- G06V10/143—Sensing or illuminating at different wavelengths
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
- G06V10/00—Arrangements for image or video recognition or understanding
- G06V10/40—Extraction of image or video features
- G06V10/58—Extraction of image or video features relating to hyperspectral data
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
- G06V10/00—Arrangements for image or video recognition or understanding
- G06V10/70—Arrangements for image or video recognition or understanding using pattern recognition or machine learning
- G06V10/764—Arrangements for image or video recognition or understanding using pattern recognition or machine learning using classification, e.g. of video objects
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
- G06V20/00—Scenes; Scene-specific elements
- G06V20/50—Context or environment of the image
- G06V20/52—Surveillance or monitoring of activities, e.g. for recognising suspicious objects
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
- G06V20/00—Scenes; Scene-specific elements
- G06V20/60—Type of objects
- G06V20/68—Food, e.g. fruit or vegetables
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/28—Investigating the spectrum
- G01J3/2823—Imaging spectrometer
- G01J2003/2826—Multispectral imaging, e.g. filter imaging
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/28—Investigating the spectrum
- G01J2003/283—Investigating the spectrum computer-interfaced
- G01J2003/2833—Investigating the spectrum computer-interfaced and memorised spectra collection
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
- G01N2021/8854—Grading and classifying of flaws
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
- G01N2021/8887—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges based on image processing techniques
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/10—Image acquisition modality
- G06T2207/10032—Satellite or aerial image; Remote sensing
- G06T2207/10036—Multispectral image; Hyperspectral image
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/30—Subject of image; Context of image processing
- G06T2207/30108—Industrial image inspection
- G06T2207/30128—Food products
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
- G06V2201/00—Indexing scheme relating to image or video recognition or understanding
- G06V2201/07—Target detection
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Theoretical Computer Science (AREA)
- Multimedia (AREA)
- General Health & Medical Sciences (AREA)
- Health & Medical Sciences (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Medical Informatics (AREA)
- Artificial Intelligence (AREA)
- Databases & Information Systems (AREA)
- Computing Systems (AREA)
- Software Systems (AREA)
- Evolutionary Computation (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Quality & Reliability (AREA)
- Signal Processing (AREA)
- Image Processing (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2021026525 | 2021-02-22 | ||
| PCT/JP2022/004780 WO2022176686A1 (ja) | 2021-02-22 | 2022-02-08 | 異物を検出する方法および装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPWO2022176686A1 true JPWO2022176686A1 (https=) | 2022-08-25 |
| JPWO2022176686A5 JPWO2022176686A5 (https=) | 2023-11-14 |
Family
ID=82930870
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2023500747A Pending JPWO2022176686A1 (https=) | 2021-02-22 | 2022-02-08 |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US20230368487A1 (https=) |
| JP (1) | JPWO2022176686A1 (https=) |
| CN (1) | CN116848399A (https=) |
| WO (1) | WO2022176686A1 (https=) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2023141906A (ja) * | 2022-03-24 | 2023-10-05 | ソニーセミコンダクタソリューションズ株式会社 | 撮像装置、撮像方法および撮像プログラム |
| US20250086782A1 (en) * | 2023-09-07 | 2025-03-13 | Altria Client Services Llc | Methods of tobacco classification via hyperspectral imaging |
| EP4667908A1 (en) * | 2024-06-21 | 2025-12-24 | Nulab Analitica Alimentaria, S.L.U. | Methods and systems for detecting solids in food products based on hyperspectral images |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS63251865A (ja) * | 1987-04-08 | 1988-10-19 | Alps Electric Co Ltd | 濃淡画像データの圧縮化方法 |
| JP2008298680A (ja) * | 2007-06-01 | 2008-12-11 | Oki Electric Ind Co Ltd | 基板外観検査装置、基板外観検査方法及びそのプログラム |
| JP2009128345A (ja) * | 2007-11-28 | 2009-06-11 | Omron Corp | 物体認識方法およびこの方法を用いた基板外観検査装置 |
| JP2020053910A (ja) * | 2018-09-28 | 2020-04-02 | パナソニックIpマネジメント株式会社 | 光学デバイス、および撮像装置 |
| JP2020524328A (ja) * | 2017-06-19 | 2020-08-13 | インパクトビジョン インコーポレイテッド | 異物を識別するためのハイパースペクトル画像処理用のシステム及び方法 |
Family Cites Families (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2003014580A (ja) * | 2001-06-11 | 2003-01-15 | Internatl Business Mach Corp <Ibm> | 検査装置、検査方法 |
| JP5298684B2 (ja) * | 2008-07-25 | 2013-09-25 | 住友電気工業株式会社 | 異物の検出装置及び検出方法 |
| JP2011141809A (ja) * | 2010-01-08 | 2011-07-21 | Sumitomo Electric Ind Ltd | 画像データ分析装置及び画像データ分析方法 |
| CN105611117B (zh) * | 2014-11-19 | 2018-12-07 | 松下知识产权经营株式会社 | 摄像装置以及分光系统 |
| JP6235684B1 (ja) * | 2016-11-29 | 2017-11-22 | Ckd株式会社 | 検査装置及びptp包装機 |
| CN110441264B (zh) * | 2019-07-22 | 2022-04-01 | 上海集成电路研发中心有限公司 | 一种基于压缩感知的频域谱成像装置及方法 |
| EP4018180A4 (en) * | 2019-08-20 | 2023-05-31 | P&P Optica Inc. | DEVICES, SYSTEMS AND METHODS FOR SORTING AND LABELING FOOD |
| JP7720532B2 (ja) * | 2020-03-26 | 2025-08-08 | パナソニックIpマネジメント株式会社 | 信号処理方法、信号処理装置、および撮像システム |
-
2022
- 2022-02-08 JP JP2023500747A patent/JPWO2022176686A1/ja active Pending
- 2022-02-08 CN CN202280012995.6A patent/CN116848399A/zh active Pending
- 2022-02-08 WO PCT/JP2022/004780 patent/WO2022176686A1/ja not_active Ceased
-
2023
- 2023-07-28 US US18/360,958 patent/US20230368487A1/en active Pending
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS63251865A (ja) * | 1987-04-08 | 1988-10-19 | Alps Electric Co Ltd | 濃淡画像データの圧縮化方法 |
| JP2008298680A (ja) * | 2007-06-01 | 2008-12-11 | Oki Electric Ind Co Ltd | 基板外観検査装置、基板外観検査方法及びそのプログラム |
| JP2009128345A (ja) * | 2007-11-28 | 2009-06-11 | Omron Corp | 物体認識方法およびこの方法を用いた基板外観検査装置 |
| JP2020524328A (ja) * | 2017-06-19 | 2020-08-13 | インパクトビジョン インコーポレイテッド | 異物を識別するためのハイパースペクトル画像処理用のシステム及び方法 |
| JP2020053910A (ja) * | 2018-09-28 | 2020-04-02 | パナソニックIpマネジメント株式会社 | 光学デバイス、および撮像装置 |
Also Published As
| Publication number | Publication date |
|---|---|
| CN116848399A (zh) | 2023-10-03 |
| WO2022176686A1 (ja) | 2022-08-25 |
| US20230368487A1 (en) | 2023-11-16 |
Similar Documents
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| A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20230804 |
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