JPWO2022030156A5 - - Google Patents

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Publication number
JPWO2022030156A5
JPWO2022030156A5 JP2022541164A JP2022541164A JPWO2022030156A5 JP WO2022030156 A5 JPWO2022030156 A5 JP WO2022030156A5 JP 2022541164 A JP2022541164 A JP 2022541164A JP 2022541164 A JP2022541164 A JP 2022541164A JP WO2022030156 A5 JPWO2022030156 A5 JP WO2022030156A5
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JP
Japan
Prior art keywords
ionizing radiation
radiation conversion
substrate
conversion layer
perovskite compound
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
JP2022541164A
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English (en)
Japanese (ja)
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JPWO2022030156A1 (https=
Filing date
Publication date
Application filed filed Critical
Priority claimed from PCT/JP2021/025295 external-priority patent/WO2022030156A1/ja
Publication of JPWO2022030156A1 publication Critical patent/JPWO2022030156A1/ja
Publication of JPWO2022030156A5 publication Critical patent/JPWO2022030156A5/ja
Ceased legal-status Critical Current

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JP2022541164A 2020-08-06 2021-07-05 Ceased JPWO2022030156A1 (https=)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2020134153 2020-08-06
PCT/JP2021/025295 WO2022030156A1 (ja) 2020-08-06 2021-07-05 電離放射線変換デバイス、電離放射線の検出方法、及び電離放射線変換デバイスの製造方法

Publications (2)

Publication Number Publication Date
JPWO2022030156A1 JPWO2022030156A1 (https=) 2022-02-10
JPWO2022030156A5 true JPWO2022030156A5 (https=) 2023-04-19

Family

ID=80119739

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2022541164A Ceased JPWO2022030156A1 (https=) 2020-08-06 2021-07-05

Country Status (2)

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JP (1) JPWO2022030156A1 (https=)
WO (1) WO2022030156A1 (https=)

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN109313278A (zh) * 2016-06-07 2019-02-05 皇家飞利浦有限公司 直接光子转换探测器
WO2017212000A1 (en) * 2016-06-08 2017-12-14 Koninklijke Philips N.V. Analyzing grid for phase contrast imaging and/or dark-field imaging
CN112313543B (zh) * 2018-06-26 2024-12-31 国立大学法人京都大学 放射线检测器、及放射线检测器的制造方法

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