JPWO2021229968A1 - - Google Patents
Info
- Publication number
- JPWO2021229968A1 JPWO2021229968A1 JP2022522564A JP2022522564A JPWO2021229968A1 JP WO2021229968 A1 JPWO2021229968 A1 JP WO2021229968A1 JP 2022522564 A JP2022522564 A JP 2022522564A JP 2022522564 A JP2022522564 A JP 2022522564A JP WO2021229968 A1 JPWO2021229968 A1 JP WO2021229968A1
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C03—GLASS; MINERAL OR SLAG WOOL
- C03C—CHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
- C03C17/00—Surface treatment of glass, not in the form of fibres or filaments, by coating
- C03C17/34—Surface treatment of glass, not in the form of fibres or filaments, by coating with at least two coatings having different compositions
- C03C17/36—Surface treatment of glass, not in the form of fibres or filaments, by coating with at least two coatings having different compositions at least one coating being a metal
-
- C—CHEMISTRY; METALLURGY
- C03—GLASS; MINERAL OR SLAG WOOL
- C03C—CHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
- C03C23/00—Other surface treatment of glass not in the form of fibres or filaments
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F1/00—Originals for photomechanical production of textured or patterned surfaces, e.g., masks, photo-masks, reticles; Mask blanks or pellicles therefor; Containers specially adapted therefor; Preparation thereof
- G03F1/22—Masks or mask blanks for imaging by radiation of 100nm or shorter wavelength, e.g. X-ray masks, extreme ultraviolet [EUV] masks; Preparation thereof
- G03F1/24—Reflection masks; Preparation thereof
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F1/00—Originals for photomechanical production of textured or patterned surfaces, e.g., masks, photo-masks, reticles; Mask blanks or pellicles therefor; Containers specially adapted therefor; Preparation thereof
- G03F1/60—Substrates
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/20—Exposure; Apparatus therefor
Landscapes
- Chemical & Material Sciences (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Life Sciences & Earth Sciences (AREA)
- Engineering & Computer Science (AREA)
- Chemical Kinetics & Catalysis (AREA)
- General Chemical & Material Sciences (AREA)
- Geochemistry & Mineralogy (AREA)
- Materials Engineering (AREA)
- Organic Chemistry (AREA)
- Preparing Plates And Mask In Photomechanical Process (AREA)
- Surface Treatment Of Glass (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2020084728 | 2020-05-13 | ||
| JP2020084728 | 2020-05-13 | ||
| PCT/JP2021/015071 WO2021229968A1 (ja) | 2020-05-13 | 2021-04-09 | ガラス板の加工方法、及び加工装置、並びにeuvl用マスクブランクの製造方法 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPWO2021229968A1 true JPWO2021229968A1 (https=) | 2021-11-18 |
| JP7722363B2 JP7722363B2 (ja) | 2025-08-13 |
Family
ID=78525778
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2022522564A Active JP7722363B2 (ja) | 2020-05-13 | 2021-04-09 | ガラス板の加工方法、及び加工装置、並びにeuvl用マスクブランクの製造方法 |
Country Status (2)
| Country | Link |
|---|---|
| JP (1) | JP7722363B2 (https=) |
| WO (1) | WO2021229968A1 (https=) |
Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS55147629A (en) * | 1979-05-09 | 1980-11-17 | Ulvac Corp | Photomask substrate working method |
| JP2007330992A (ja) * | 2006-06-14 | 2007-12-27 | Olympus Corp | 被加工物の加工方法及び装置 |
| JP2008156215A (ja) * | 2006-12-01 | 2008-07-10 | Asahi Glass Co Ltd | 予備研磨されたガラス基板表面を仕上げ加工する方法 |
| WO2011115131A1 (ja) * | 2010-03-16 | 2011-09-22 | 旭硝子株式会社 | Euvリソグラフィ光学部材用基材およびその製造方法 |
| JP2016038573A (ja) * | 2014-08-07 | 2016-03-22 | 旭硝子株式会社 | マスクブランク用ガラス基板、および、その製造方法 |
| JP2016191952A (ja) * | 2012-12-27 | 2016-11-10 | Hoya株式会社 | マスクブランク用基板の製造方法、多層反射膜付き基板の製造方法、マスクブランクの製造方法、及び転写用マスクの製造方法 |
| JP2018052804A (ja) * | 2016-09-21 | 2018-04-05 | 旭硝子株式会社 | ガラス板およびガラス基板の製造方法 |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP6048817B2 (ja) * | 2012-12-27 | 2016-12-21 | 日本電気硝子株式会社 | 板状ガラスの表面処理装置及び表面処理方法 |
-
2021
- 2021-04-09 JP JP2022522564A patent/JP7722363B2/ja active Active
- 2021-04-09 WO PCT/JP2021/015071 patent/WO2021229968A1/ja not_active Ceased
Patent Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS55147629A (en) * | 1979-05-09 | 1980-11-17 | Ulvac Corp | Photomask substrate working method |
| JP2007330992A (ja) * | 2006-06-14 | 2007-12-27 | Olympus Corp | 被加工物の加工方法及び装置 |
| JP2008156215A (ja) * | 2006-12-01 | 2008-07-10 | Asahi Glass Co Ltd | 予備研磨されたガラス基板表面を仕上げ加工する方法 |
| WO2011115131A1 (ja) * | 2010-03-16 | 2011-09-22 | 旭硝子株式会社 | Euvリソグラフィ光学部材用基材およびその製造方法 |
| JP2016191952A (ja) * | 2012-12-27 | 2016-11-10 | Hoya株式会社 | マスクブランク用基板の製造方法、多層反射膜付き基板の製造方法、マスクブランクの製造方法、及び転写用マスクの製造方法 |
| JP2016038573A (ja) * | 2014-08-07 | 2016-03-22 | 旭硝子株式会社 | マスクブランク用ガラス基板、および、その製造方法 |
| JP2018052804A (ja) * | 2016-09-21 | 2018-04-05 | 旭硝子株式会社 | ガラス板およびガラス基板の製造方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| WO2021229968A1 (ja) | 2021-11-18 |
| JP7722363B2 (ja) | 2025-08-13 |
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