JPWO2021215334A1 - - Google Patents
Info
- Publication number
- JPWO2021215334A1 JPWO2021215334A1 JP2022517001A JP2022517001A JPWO2021215334A1 JP WO2021215334 A1 JPWO2021215334 A1 JP WO2021215334A1 JP 2022517001 A JP2022517001 A JP 2022517001A JP 2022517001 A JP2022517001 A JP 2022517001A JP WO2021215334 A1 JPWO2021215334 A1 JP WO2021215334A1
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measuring Leads Or Probes (AREA)
- Coupling Device And Connection With Printed Circuit (AREA)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2020075912 | 2020-04-22 | ||
JP2020075912 | 2020-04-22 | ||
PCT/JP2021/015483 WO2021215334A1 (ja) | 2020-04-22 | 2021-04-14 | 検査用コネクタ及び検査用ユニット |
Publications (3)
Publication Number | Publication Date |
---|---|
JPWO2021215334A1 true JPWO2021215334A1 (zh) | 2021-10-28 |
JPWO2021215334A5 JPWO2021215334A5 (zh) | 2022-08-31 |
JP7327659B2 JP7327659B2 (ja) | 2023-08-16 |
Family
ID=78269296
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2022517001A Active JP7327659B2 (ja) | 2020-04-22 | 2021-04-14 | 検査用コネクタ及び検査用ユニット |
Country Status (4)
Country | Link |
---|---|
JP (1) | JP7327659B2 (zh) |
CN (1) | CN218938344U (zh) |
TW (1) | TWI778588B (zh) |
WO (1) | WO2021215334A1 (zh) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE102022106991A1 (de) | 2022-03-24 | 2023-09-28 | Ingun Prüfmittelbau Gmbh | Hochfrequenz-Prüfstiftvorrichtung |
Family Cites Families (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2001042002A (ja) * | 1999-07-30 | 2001-02-16 | Advantest Corp | 半導体デバイス試験装置のタイミング校正用コンタクトボード・このコンタクトボードに接触するプローブ |
US6515499B1 (en) * | 2000-09-28 | 2003-02-04 | Teradyne, Inc. | Modular semiconductor tester interface assembly for high performance coaxial connections |
US6447328B1 (en) * | 2001-03-13 | 2002-09-10 | 3M Innovative Properties Company | Method and apparatus for retaining a spring probe |
US20030062914A1 (en) | 2001-09-28 | 2003-04-03 | Cosmin Iorga | Surface mating compliant contact assembly with fixed signal path length |
JP2008070146A (ja) * | 2006-09-12 | 2008-03-27 | Yokowo Co Ltd | 検査用ソケット |
KR101138197B1 (ko) | 2008-02-07 | 2012-05-10 | 가부시키가이샤 어드밴티스트 | 품종 교환 유닛 및 제조 방법 |
JP2010133763A (ja) | 2008-12-03 | 2010-06-17 | Yokogawa Electric Corp | 同軸プローブ構造 |
JP2014123482A (ja) * | 2012-12-21 | 2014-07-03 | Murata Mfg Co Ltd | 検査用同軸コネクタ |
US9645172B2 (en) * | 2014-10-10 | 2017-05-09 | Samtec, Inc. | Cable assembly |
KR101897996B1 (ko) | 2014-11-07 | 2018-09-12 | 가부시키가이샤 무라타 세이사쿠쇼 | 프로브 |
KR101882209B1 (ko) | 2016-03-23 | 2018-07-27 | 리노공업주식회사 | 동축 테스트소켓 조립체 |
WO2019069576A1 (ja) | 2017-10-06 | 2019-04-11 | 株式会社村田製作所 | プローブ |
-
2021
- 2021-04-14 CN CN202190000326.8U patent/CN218938344U/zh active Active
- 2021-04-14 JP JP2022517001A patent/JP7327659B2/ja active Active
- 2021-04-14 WO PCT/JP2021/015483 patent/WO2021215334A1/ja active Application Filing
- 2021-04-20 TW TW110114119A patent/TWI778588B/zh active
Also Published As
Publication number | Publication date |
---|---|
WO2021215334A1 (ja) | 2021-10-28 |
TW202210841A (zh) | 2022-03-16 |
CN218938344U (zh) | 2023-04-28 |
JP7327659B2 (ja) | 2023-08-16 |
TWI778588B (zh) | 2022-09-21 |
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