JPWO2021210442A1 - - Google Patents

Info

Publication number
JPWO2021210442A1
JPWO2021210442A1 JP2022515316A JP2022515316A JPWO2021210442A1 JP WO2021210442 A1 JPWO2021210442 A1 JP WO2021210442A1 JP 2022515316 A JP2022515316 A JP 2022515316A JP 2022515316 A JP2022515316 A JP 2022515316A JP WO2021210442 A1 JPWO2021210442 A1 JP WO2021210442A1
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2022515316A
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of JPWO2021210442A1 publication Critical patent/JPWO2021210442A1/ja
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/083Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/10Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the material being confined in a container, e.g. in a luggage X-ray scanners
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T11/002D [Two Dimensional] image generation
    • G06T11/003Reconstruction from projections, e.g. tomography
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06VIMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V10/00Arrangements for image or video recognition or understanding
    • G06V10/20Image preprocessing
    • G06V10/25Determination of region of interest [ROI] or a volume of interest [VOI]
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06VIMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V10/00Arrangements for image or video recognition or understanding
    • G06V10/70Arrangements for image or video recognition or understanding using pattern recognition or machine learning
    • G06V10/74Image or video pattern matching; Proximity measures in feature spaces
    • G06V10/75Organisation of the matching processes, e.g. simultaneous or sequential comparisons of image or video features; Coarse-fine approaches, e.g. multi-scale approaches; using context analysis; Selection of dictionaries
    • G06V10/751Comparing pixel values or logical combinations thereof, or feature values having positional relevance, e.g. template matching
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00Investigating materials by wave or particle radiation
    • G01N2223/10Different kinds of radiation or particles
    • G01N2223/101Different kinds of radiation or particles electromagnetic radiation
    • G01N2223/1016X-ray
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00Investigating materials by wave or particle radiation
    • G01N2223/30Accessories, mechanical or electrical features
    • G01N2223/303Accessories, mechanical or electrical features calibrating, standardising
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00Investigating materials by wave or particle radiation
    • G01N2223/40Imaging
    • G01N2223/401Imaging image processing
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00Investigating materials by wave or particle radiation
    • G01N2223/40Imaging
    • G01N2223/423Imaging multispectral imaging-multiple energy imaging
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00Investigating materials by wave or particle radiation
    • G01N2223/60Specific applications or type of materials
    • G01N2223/643Specific applications or type of materials object on conveyor
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00Indexing scheme for image analysis or image enhancement
    • G06T2207/20Special algorithmic details
    • G06T2207/20092Interactive image processing based on input by user
    • G06T2207/20104Interactive definition of region of interest [ROI]

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • General Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Biochemistry (AREA)
  • Analytical Chemistry (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Multimedia (AREA)
  • Toxicology (AREA)
  • Artificial Intelligence (AREA)
  • Computing Systems (AREA)
  • Databases & Information Systems (AREA)
  • Evolutionary Computation (AREA)
  • Medical Informatics (AREA)
  • Software Systems (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
JP2022515316A 2020-04-16 2021-04-05 Pending JPWO2021210442A1 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2020073550 2020-04-16
PCT/JP2021/014554 WO2021210442A1 (ja) 2020-04-16 2021-04-05 放射線検査方法、放射線検査装置、放射線検査システム、及び放射線検査プログラム

Publications (1)

Publication Number Publication Date
JPWO2021210442A1 true JPWO2021210442A1 (ja) 2021-10-21

Family

ID=78083744

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2022515316A Pending JPWO2021210442A1 (ja) 2020-04-16 2021-04-05

Country Status (6)

Country Link
US (1) US20230128795A1 (ja)
EP (1) EP4123298A4 (ja)
JP (1) JPWO2021210442A1 (ja)
KR (1) KR20230002303A (ja)
CN (1) CN115380205A (ja)
WO (1) WO2021210442A1 (ja)

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6340533A (ja) * 1986-08-05 1988-02-20 株式会社東芝 X線診断装置
JPH03133278A (ja) * 1989-10-19 1991-06-06 Fuji Photo Film Co Ltd エネルギーサブトラクション画像の形成方法および装置
JPH06261894A (ja) * 1993-01-18 1994-09-20 Hitachi Ltd 骨塩定量方法
JP2000121579A (ja) 1998-10-13 2000-04-28 Nagoya Denki Kogyo Kk X線撮像方法、x線撮像装置およびx線撮像制御プログラムを記録した媒体
US8351672B2 (en) * 2007-09-26 2013-01-08 Industry Vision Automation Corp. Machine imaging apparatus and method for detecting foreign materials
JP5319984B2 (ja) * 2008-08-21 2013-10-16 株式会社東芝 X線診断装置及びx線画像処理装置
JP5616182B2 (ja) * 2010-09-28 2014-10-29 株式会社イシダ X線検査装置
JP5912427B2 (ja) * 2011-11-08 2016-04-27 浜松ホトニクス株式会社 非破壊検査装置及び当該装置での位置ずれ検出方法
US8750561B2 (en) * 2012-02-29 2014-06-10 United Technologies Corporation Method of detecting material in a part
EP3702812A4 (en) * 2017-10-26 2021-07-21 Job Corporation METHOD AND DEVICE FOR PROCESSING PHOTONCOUNTING X-RAY DETECTION DATA AND X-RAY DEVICE
JP7093233B2 (ja) * 2018-06-07 2022-06-29 キヤノン株式会社 放射線撮影装置、放射線撮影方法およびプログラム

Also Published As

Publication number Publication date
WO2021210442A1 (ja) 2021-10-21
EP4123298A4 (en) 2024-04-17
CN115380205A (zh) 2022-11-22
KR20230002303A (ko) 2023-01-05
EP4123298A1 (en) 2023-01-25
US20230128795A1 (en) 2023-04-27

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Legal Events

Date Code Title Description
A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20231115