JPWO2021131014A1 - - Google Patents

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Publication number
JPWO2021131014A1
JPWO2021131014A1 JP2021566720A JP2021566720A JPWO2021131014A1 JP WO2021131014 A1 JPWO2021131014 A1 JP WO2021131014A1 JP 2021566720 A JP2021566720 A JP 2021566720A JP 2021566720 A JP2021566720 A JP 2021566720A JP WO2021131014 A1 JPWO2021131014 A1 JP WO2021131014A1
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2021566720A
Other languages
Japanese (ja)
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JP7240528B2 (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Publication date
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Publication of JPWO2021131014A1 publication Critical patent/JPWO2021131014A1/ja
Application granted granted Critical
Publication of JP7240528B2 publication Critical patent/JP7240528B2/ja
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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N21/3581—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using far infrared light; using Terahertz radiation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/10—Arrangements of light sources specially adapted for spectrometry or colorimetry
    • G01J3/108—Arrangements of light sources specially adapted for spectrometry or colorimetry for measurement in the infrared range
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/12—Generating the spectrum; Monochromators
    • G01J3/14—Generating the spectrum; Monochromators using refracting elements, e.g. prisms
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J3/2803—Investigating the spectrum using photoelectric array detector
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/35—Non-linear optics
    • G02F1/355—Non-linear optics characterised by the materials used
    • G02F1/3551—Crystals
JP2021566720A 2019-12-27 2019-12-27 遠赤外分光装置、遠赤外分光方法 Active JP7240528B2 (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2019/051387 WO2021131014A1 (fr) 2019-12-27 2019-12-27 Dispositif et procédé de spectroscopie dans l'infrarouge lointain

Publications (2)

Publication Number Publication Date
JPWO2021131014A1 true JPWO2021131014A1 (fr) 2021-07-01
JP7240528B2 JP7240528B2 (ja) 2023-03-15

Family

ID=76572947

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2021566720A Active JP7240528B2 (ja) 2019-12-27 2019-12-27 遠赤外分光装置、遠赤外分光方法

Country Status (4)

Country Link
US (1) US11977026B2 (fr)
JP (1) JP7240528B2 (fr)
DE (1) DE112019007849T5 (fr)
WO (1) WO2021131014A1 (fr)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2023002585A1 (fr) * 2021-07-20 2023-01-26 株式会社日立ハイテク Dispositif de spectroscopie infrarouge lointain et adaptateur d'échantillons

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011075583A (ja) * 2009-09-03 2011-04-14 Institute Of Physical & Chemical Research 単色波長可変型テラヘルツ波発生／検出システム及び方法
WO2016147253A1 (fr) * 2015-03-13 2016-09-22 株式会社日立ハイテクノロジーズ Dispositif de mesure d'ondes térahertz
JP2017138461A (ja) * 2016-02-03 2017-08-10 澁谷工業株式会社 テラヘルツ光発生装置
WO2019116461A1 (fr) * 2017-12-13 2019-06-20 株式会社日立ハイテクノロジーズ Source de lumière dans l'infrarouge lointain et spectromètre pour l'infrarouge lointain
JP2019135499A (ja) * 2019-04-25 2019-08-15 株式会社日立ハイテクノロジーズ 遠赤外分光装置
JP2019168701A (ja) * 2019-04-25 2019-10-03 株式会社日立ハイテクノロジーズ 遠赤外分光装置

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3747319B2 (ja) * 2002-04-09 2006-02-22 独立行政法人理化学研究所 テラヘルツ波発生装置とその同調方法

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011075583A (ja) * 2009-09-03 2011-04-14 Institute Of Physical & Chemical Research 単色波長可変型テラヘルツ波発生／検出システム及び方法
WO2016147253A1 (fr) * 2015-03-13 2016-09-22 株式会社日立ハイテクノロジーズ Dispositif de mesure d'ondes térahertz
JP2017138461A (ja) * 2016-02-03 2017-08-10 澁谷工業株式会社 テラヘルツ光発生装置
WO2019116461A1 (fr) * 2017-12-13 2019-06-20 株式会社日立ハイテクノロジーズ Source de lumière dans l'infrarouge lointain et spectromètre pour l'infrarouge lointain
JP2019135499A (ja) * 2019-04-25 2019-08-15 株式会社日立ハイテクノロジーズ 遠赤外分光装置
JP2019168701A (ja) * 2019-04-25 2019-10-03 株式会社日立ハイテクノロジーズ 遠赤外分光装置

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
K. MURATE AND K. KAWASE: "Perspective: Terahertz wave parametric generator and its applications", JOURNAL OF APPLIED PHYSICS, vol. 124, JPN7023000613, 17 October 2018 (2018-10-17), pages 160901 - 1, ISSN: 0004989665 *

Also Published As

Publication number Publication date
US20220412885A1 (en) 2022-12-29
DE112019007849T5 (de) 2022-07-28
WO2021131014A1 (fr) 2021-07-01
JP7240528B2 (ja) 2023-03-15
US11977026B2 (en) 2024-05-07

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