JPWO2021125010A1 - - Google Patents

Info

Publication number
JPWO2021125010A1
JPWO2021125010A1 JP2021565514A JP2021565514A JPWO2021125010A1 JP WO2021125010 A1 JPWO2021125010 A1 JP WO2021125010A1 JP 2021565514 A JP2021565514 A JP 2021565514A JP 2021565514 A JP2021565514 A JP 2021565514A JP WO2021125010 A1 JPWO2021125010 A1 JP WO2021125010A1
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2021565514A
Other languages
Japanese (ja)
Other versions
JPWO2021125010A5 (de
JP7304098B2 (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of JPWO2021125010A1 publication Critical patent/JPWO2021125010A1/ja
Publication of JPWO2021125010A5 publication Critical patent/JPWO2021125010A5/ja
Application granted granted Critical
Publication of JP7304098B2 publication Critical patent/JP7304098B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02Details
    • H01J37/20Means for supporting or positioning the object or the material; Means for adjusting diaphragms or lenses associated with the support
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02Details
    • H01J37/22Optical, image processing or photographic arrangements associated with the tube

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
JP2021565514A 2019-12-16 2020-12-09 立体像観察方法及びこれに用いる試料グリッド Active JP7304098B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2019226381 2019-12-16
JP2019226381 2019-12-16
PCT/JP2020/045834 WO2021125010A1 (ja) 2019-12-16 2020-12-09 立体像観察方法及びこれに用いる試料グリッド

Publications (3)

Publication Number Publication Date
JPWO2021125010A1 true JPWO2021125010A1 (de) 2021-06-24
JPWO2021125010A5 JPWO2021125010A5 (de) 2022-07-14
JP7304098B2 JP7304098B2 (ja) 2023-07-06

Family

ID=76477509

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2021565514A Active JP7304098B2 (ja) 2019-12-16 2020-12-09 立体像観察方法及びこれに用いる試料グリッド

Country Status (2)

Country Link
JP (1) JP7304098B2 (de)
WO (1) WO2021125010A1 (de)

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006184202A (ja) * 2004-12-28 2006-07-13 Nissan Arc Ltd 立体観察装置及び立体観察方法
JP2006244742A (ja) * 2005-03-01 2006-09-14 Seiko Epson Corp 電子顕微鏡試料支持用マイクログリッド及び電子顕微鏡試料の作製方法
JP2011023349A (ja) * 2009-07-13 2011-02-03 Fei Co 試料の検査方法
JP2011129443A (ja) * 2009-12-21 2011-06-30 Jeol Ltd グリッドを用いた試料ホルダ
JP2011228283A (ja) * 2010-04-14 2011-11-10 Beijing Funate Innovation Technology Co Ltd 透過型電子顕微鏡グリッドの製造方法
WO2017179145A1 (ja) * 2016-04-13 2017-10-19 株式会社日立ハイテクノロジーズ 荷電粒子線装置および試料ホルダ

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006184202A (ja) * 2004-12-28 2006-07-13 Nissan Arc Ltd 立体観察装置及び立体観察方法
JP2006244742A (ja) * 2005-03-01 2006-09-14 Seiko Epson Corp 電子顕微鏡試料支持用マイクログリッド及び電子顕微鏡試料の作製方法
JP2011023349A (ja) * 2009-07-13 2011-02-03 Fei Co 試料の検査方法
JP2011129443A (ja) * 2009-12-21 2011-06-30 Jeol Ltd グリッドを用いた試料ホルダ
JP2011228283A (ja) * 2010-04-14 2011-11-10 Beijing Funate Innovation Technology Co Ltd 透過型電子顕微鏡グリッドの製造方法
WO2017179145A1 (ja) * 2016-04-13 2017-10-19 株式会社日立ハイテクノロジーズ 荷電粒子線装置および試料ホルダ

Also Published As

Publication number Publication date
JP7304098B2 (ja) 2023-07-06
WO2021125010A1 (ja) 2021-06-24

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