JPWO2021124421A1 - - Google Patents

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Publication number
JPWO2021124421A1
JPWO2021124421A1 JP2021565182A JP2021565182A JPWO2021124421A1 JP WO2021124421 A1 JPWO2021124421 A1 JP WO2021124421A1 JP 2021565182 A JP2021565182 A JP 2021565182A JP 2021565182 A JP2021565182 A JP 2021565182A JP WO2021124421 A1 JPWO2021124421 A1 JP WO2021124421A1
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JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2021565182A
Other versions
JP7329880B2 (ja
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Publication of JPWO2021124421A1 publication Critical patent/JPWO2021124421A1/ja
Application granted granted Critical
Publication of JP7329880B2 publication Critical patent/JP7329880B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/16—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the material being a moving sheet or film
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/18—Investigating the presence of flaws defects or foreign matter

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
JP2021565182A 2019-12-16 2019-12-16 エスカレータの手摺ベルト用ｘ線検査装置 Active JP7329880B2 (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2019/049254 WO2021124421A1 (ja) 2019-12-16 2019-12-16 ベルト用ｘ線検査装置

Publications (2)

Publication Number Publication Date
JPWO2021124421A1 true JPWO2021124421A1 (ja) 2021-06-24
JP7329880B2 JP7329880B2 (ja) 2023-08-21

Family

ID=76477330

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2021565182A Active JP7329880B2 (ja) 2019-12-16 2019-12-16 エスカレータの手摺ベルト用ｘ線検査装置

Country Status (3)

Country Link
JP (1) JP7329880B2 (ja)
CN (1) CN115104024A (ja)
WO (1) WO2021124421A1 (ja)

Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH06203656A (ja) * 1992-12-25 1994-07-22 Mitsubishi Cable Ind Ltd 電力ケーブルのｘ線検査方法
JPH0949808A (ja) * 1995-05-26 1997-02-18 Hitachi Building Syst Co Ltd Ｘ線検査装置
JPH1010055A (ja) * 1996-06-21 1998-01-16 Hitachi Cable Ltd 電線の圧縮接続部を検査する非破壊検査方法及び検査装置
JPH1164249A (ja) * 1997-08-15 1999-03-05 Mitsubishi Cable Ind Ltd Ｘ線撮影装置
JP2000318949A (ja) * 1999-05-13 2000-11-21 Hitachi Building Systems Co Ltd 斜行エレベータの移動ケーブルの診断装置
JP2012154627A (ja) * 2011-01-06 2012-08-16 Tsukuba Technology Co Ltd Ｘ線非破壊検査装置
JP2016055980A (ja) * 2014-09-09 2016-04-21 株式会社日立ビルシステム 乗客コンベア用移動手摺劣化診断装置
JP2017015412A (ja) * 2015-06-26 2017-01-19 つくばテクノロジー株式会社 ポータブル電線端部ｘ線検査装置

Patent Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH06203656A (ja) * 1992-12-25 1994-07-22 Mitsubishi Cable Ind Ltd 電力ケーブルのｘ線検査方法
JPH0949808A (ja) * 1995-05-26 1997-02-18 Hitachi Building Syst Co Ltd Ｘ線検査装置
JPH1010055A (ja) * 1996-06-21 1998-01-16 Hitachi Cable Ltd 電線の圧縮接続部を検査する非破壊検査方法及び検査装置
JPH1164249A (ja) * 1997-08-15 1999-03-05 Mitsubishi Cable Ind Ltd Ｘ線撮影装置
JP2000318949A (ja) * 1999-05-13 2000-11-21 Hitachi Building Systems Co Ltd 斜行エレベータの移動ケーブルの診断装置
JP2012154627A (ja) * 2011-01-06 2012-08-16 Tsukuba Technology Co Ltd Ｘ線非破壊検査装置
JP2016055980A (ja) * 2014-09-09 2016-04-21 株式会社日立ビルシステム 乗客コンベア用移動手摺劣化診断装置
JP2017015412A (ja) * 2015-06-26 2017-01-19 つくばテクノロジー株式会社 ポータブル電線端部ｘ線検査装置

Non-Patent Citations (2)

* Cited by examiner, † Cited by third party
Title
"Ｘ線ラインセンサを利用したコンベアベルト内部のスチールコード損傷の検出", 非破壊検査, vol. 第６２巻、第４号, JPN7020000618, April 2013 (2013-04-01), JP, pages 181 - 182, ISSN: 0005099441 *
"世界初非破壊検査装置開発へのチャレンジ", シンセシオロジー, vol. 第１０巻、第２号, JPN7020000617, September 2017 (2017-09-01), JP, pages 75 - 86, ISSN: 0004989662 *

Also Published As

Publication number Publication date
JP7329880B2 (ja) 2023-08-21
CN115104024A (zh) 2022-09-23
WO2021124421A1 (ja) 2021-06-24

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