JPWO2021108281A5 - Surface acoustic wave device, its fabrication method, and radio frequency filter - Google Patents
Surface acoustic wave device, its fabrication method, and radio frequency filter Download PDFInfo
- Publication number
- JPWO2021108281A5 JPWO2021108281A5 JP2022530731A JP2022530731A JPWO2021108281A5 JP WO2021108281 A5 JPWO2021108281 A5 JP WO2021108281A5 JP 2022530731 A JP2022530731 A JP 2022530731A JP 2022530731 A JP2022530731 A JP 2022530731A JP WO2021108281 A5 JPWO2021108281 A5 JP WO2021108281A5
- Authority
- JP
- Japan
- Prior art keywords
- acoustic wave
- wave device
- surface acoustic
- layer
- bonding layer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000010897 surface acoustic wave method Methods 0.000 title claims 17
- 238000000034 method Methods 0.000 title claims 9
- 238000004519 manufacturing process Methods 0.000 title 1
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 claims 5
- 239000000758 substrate Substances 0.000 claims 5
- 235000012239 silicon dioxide Nutrition 0.000 claims 4
- 229910013641 LiNbO 3 Inorganic materials 0.000 claims 3
- 239000013078 crystal Substances 0.000 claims 3
- 230000001902 propagating effect Effects 0.000 claims 3
- 239000010453 quartz Substances 0.000 claims 3
- 229910052681 coesite Inorganic materials 0.000 claims 1
- 229910052906 cristobalite Inorganic materials 0.000 claims 1
- 230000000149 penetrating effect Effects 0.000 claims 1
- 230000002093 peripheral effect Effects 0.000 claims 1
- 238000007789 sealing Methods 0.000 claims 1
- 239000000377 silicon dioxide Substances 0.000 claims 1
- 229910052682 stishovite Inorganic materials 0.000 claims 1
- 229910052905 tridymite Inorganic materials 0.000 claims 1
Claims (20)
水晶基板と、
LiTaO3又はLiNbO3から形成されて前記水晶基板の上に配置される圧電膜と、
前記圧電膜の上に形成されるインターディジタルトランスデューサ電極と、
前記圧電膜の上に実装される接合層と、
キャップ層と
を含み、
前記キャップ層は、前記接合層の上に形成されることにより、伝搬波のエネルギーを実質的に前記キャップ層の下方に閉じ込める、弾性表面波デバイス。 A surface acoustic wave device,
a crystal substrate,
a piezoelectric film formed from LiTaO 3 or LiNbO 3 and disposed on the crystal substrate;
an interdigital transducer electrode formed on the piezoelectric film;
a bonding layer mounted on the piezoelectric film;
a cap layer;
The cap layer is formed on the bonding layer to substantially confine propagating wave energy below the cap layer.
前記キャップ層の下面が前記接合層の上面に直接接触する、請求項1の弾性表面波デバイス。 the interdigital transducer electrode is formed directly on the top surface of the piezoelectric film;
The surface acoustic wave device according to claim 1, wherein the lower surface of the cap layer is in direct contact with the upper surface of the bonding layer.
前記インターディジタルトランスデューサ電極は前記キャビティに露出される、請求項4の弾性表面波デバイス。 a volume above the interdigital transducer electrode i includes a cavity defined by a top surface of the piezoelectric film and a bottom surface of the cap layer;
5. The surface acoustic wave device of claim 4, wherein the interdigital transducer electrode is exposed in the cavity .
前記一以上のトレンチは前記キャビティを部分的に又は完全に取り囲む、請求項9の弾性表面波デバイス。 the wall structure includes one or more trenches filled with SiN;
10. The surface acoustic wave device of claim 9, wherein the one or more trenches partially or completely surround the cavity.
LiTaO3又はLiNbO3から形成される圧電層を形成すること又は与えることと、
前記圧電層の上にインターディジタルトランスデューサ電極を形成することと、
前記圧電層の上に接合層を実装することと、
前記接合層にキャップ層を接合することと、
前記圧電層を薄化して圧電膜を与えることと
を含み、
前記接合層は前記キャップ層と前記圧電層との間に存在し、
前記キャップ層は、前記キャップ層の下方の容積に伝搬波のエネルギー閉じ込めを許容するように構成される、方法。 A method of producing an acoustic wave device, the method comprising:
forming or providing a piezoelectric layer formed from LiTaO 3 or LiNbO 3 ;
forming an interdigital transducer electrode on the piezoelectric layer;
mounting a bonding layer on the piezoelectric layer;
bonding a cap layer to the bonding layer;
thinning the piezoelectric layer to provide a piezoelectric film;
the bonding layer is between the cap layer and the piezoelectric layer,
The method, wherein the cap layer is configured to allow energy confinement of propagating waves in a volume below the cap layer.
前記キャビティは前記圧電膜の第1面と前記キャップ層の下面とによって画定され、
前記インターディジタルトランスデューサ電極は前記キャビティに露出される、請求項14の方法。 implementing the bonding layer results in a cavity above the interdigital transducer electrode;
the cavity is defined by a first surface of the piezoelectric film and a lower surface of the cap layer;
15. The method of claim 14 , wherein the interdigital transducer electrodes are exposed in the cavity.
信号を受信する入力ノードと、
フィルタリングされた信号を与える出力ノードと、
前記フィルタリングされた信号を生成するべく電気的に前記入力ノードと前記出力ノードとの間に実装される弾性表面波デバイスと
を含み、
前記弾性表面波デバイスは、水晶基板と、LiTaO3又はLiNbO3から形成されて前記水晶基板の上に配置される圧電膜と、前記圧電膜の上に形成されるインターディジタルトランスデューサ電極とを含み、
前記弾性表面波デバイスはさらに、前記圧電膜の上に実装される接合層と、キャップ層とを含み、
前記キャップ層は、前記接合層の上に形成されることにより、伝搬波のエネルギーを実質的に前記キャップ層の下方に閉じ込める、弾性表面波デバイス。 A radio frequency filter,
an input node that receives the signal;
an output node that provides a filtered signal;
a surface acoustic wave device electrically implemented between the input node and the output node to generate the filtered signal;
The surface acoustic wave device includes a quartz crystal substrate, a piezoelectric film formed from LiTaO 3 or LiNbO 3 and disposed on the quartz substrate, and an interdigital transducer electrode formed on the piezoelectric film,
The surface acoustic wave device further includes a bonding layer and a cap layer mounted on the piezoelectric film,
The cap layer is formed on the bonding layer to substantially confine propagating wave energy below the cap layer.
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US201962941683P | 2019-11-27 | 2019-11-27 | |
US62/941,683 | 2019-11-27 | ||
PCT/US2020/061710 WO2021108281A2 (en) | 2019-11-27 | 2020-11-22 | Energy confinement in acoustic wave devices |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2023503980A JP2023503980A (en) | 2023-02-01 |
JPWO2021108281A5 true JPWO2021108281A5 (en) | 2023-11-22 |
Family
ID=75975500
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2022530731A Pending JP2023503980A (en) | 2019-11-27 | 2020-11-22 | Energy Confinement in Acoustic Wave Devices |
Country Status (8)
Country | Link |
---|---|
US (1) | US20210159883A1 (en) |
JP (1) | JP2023503980A (en) |
KR (1) | KR20220158679A (en) |
CN (1) | CN115336173A (en) |
DE (1) | DE112020005340T5 (en) |
GB (1) | GB2605531A (en) |
TW (1) | TW202127694A (en) |
WO (1) | WO2021108281A2 (en) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
SG10201905013VA (en) | 2018-06-11 | 2020-01-30 | Skyworks Solutions Inc | Acoustic wave device with spinel layer |
US11876501B2 (en) | 2019-02-26 | 2024-01-16 | Skyworks Solutions, Inc. | Acoustic wave device with multi-layer substrate including ceramic |
Family Cites Families (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4006438A (en) * | 1975-08-18 | 1977-02-01 | Amp Incorporated | Electro-acoustic surface-wave filter device |
JPH08265087A (en) * | 1995-03-22 | 1996-10-11 | Mitsubishi Electric Corp | Surface acoustic wave filter |
JP3864850B2 (en) * | 2001-08-09 | 2007-01-10 | 株式会社村田製作所 | Surface acoustic wave filter, communication device |
DE102005055871A1 (en) * | 2005-11-23 | 2007-05-24 | Epcos Ag | Guided bulk acoustic wave operated component for e.g. ladder filter, has dielectric layer with low acoustic impedance, and metal layer including partial layer with high impedance, where ratio between impedances lies in certain range |
US8960004B2 (en) * | 2010-09-29 | 2015-02-24 | The George Washington University | Synchronous one-pole surface acoustic wave resonator |
US9209380B2 (en) * | 2013-03-08 | 2015-12-08 | Triquint Semiconductor, Inc. | Acoustic wave device |
JP6385648B2 (en) * | 2013-05-14 | 2018-09-05 | 太陽誘電株式会社 | Acoustic wave device and method of manufacturing acoustic wave device |
US9876483B2 (en) * | 2014-03-28 | 2018-01-23 | Avago Technologies General Ip (Singapore) Pte. Ltd. | Acoustic resonator device including trench for providing stress relief |
US9331667B2 (en) * | 2014-07-21 | 2016-05-03 | Triquint Semiconductor, Inc. | Methods, systems, and apparatuses for temperature compensated surface acoustic wave device |
US10084427B2 (en) * | 2016-01-28 | 2018-09-25 | Qorvo Us, Inc. | Surface acoustic wave device having a piezoelectric layer on a quartz substrate and methods of manufacturing thereof |
-
2020
- 2020-11-22 KR KR1020227021397A patent/KR20220158679A/en unknown
- 2020-11-22 US US17/100,928 patent/US20210159883A1/en active Pending
- 2020-11-22 WO PCT/US2020/061710 patent/WO2021108281A2/en active Application Filing
- 2020-11-22 DE DE112020005340.7T patent/DE112020005340T5/en active Pending
- 2020-11-22 JP JP2022530731A patent/JP2023503980A/en active Pending
- 2020-11-22 GB GB2208790.2A patent/GB2605531A/en active Pending
- 2020-11-22 CN CN202080092585.8A patent/CN115336173A/en active Pending
- 2020-11-27 TW TW109141858A patent/TW202127694A/en unknown
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JP4517992B2 (en) | Conducting hole forming method, piezoelectric device manufacturing method, and piezoelectric device | |
CN102340291B (en) | Flexural resonator element, resonator, oscillator, and electronic device | |
US20190165758A1 (en) | Elastic wave device | |
JP6200001B2 (en) | Micro acoustic parts and manufacturing method | |
JP2021534613A (en) | BAW resonator packaging module and packaging method | |
JPH02170611A (en) | Surface acoustic wave device | |
GB2605531A (en) | Energy confinement in acoustic wave devices | |
JP2020108145A5 (en) | Acoustic Wave Device, Acoustic Wave Filter, and Method of Manufacturing Acoustic Wave Device | |
JPWO2021108281A5 (en) | Surface acoustic wave device, its fabrication method, and radio frequency filter | |
JP2022072241A (en) | Acoustic wave device and communication module | |
JP6950658B2 (en) | Elastic wave device | |
JP2002204498A (en) | Ultrasonic wave sensor | |
JPH10173479A (en) | Surface acoustic wave filter | |
JP5428735B2 (en) | Piezoelectric device | |
JPS61236208A (en) | Piezoelectric resonator for over-tone oscillation | |
JP2013066042A (en) | Electronic device, method of manufacturing the same, and acoustic wave device | |
JP5406108B2 (en) | Elastic wave device and manufacturing method thereof | |
JP2001257560A (en) | Electrode structure for ultra-thin board piezoelectric vibration element | |
CN110868190B (en) | Acoustic resonator packaging structure and preparation method thereof | |
JP2000124767A (en) | Substrate mounting method for saw filter chip and saw filter chip | |
CN110380703A (en) | A kind of the full wafer wafer level packaging structure and technique of microelectronic device | |
WO2023167101A1 (en) | Electronic module | |
JPH0946164A (en) | Surface acoustic wave device | |
JP4518255B2 (en) | Surface acoustic wave device and electronic device | |
JP2008124786A (en) | Surface acoustic wave device |