JPWO2021106580A1 - - Google Patents
Info
- Publication number
- JPWO2021106580A1 JPWO2021106580A1 JP2021561284A JP2021561284A JPWO2021106580A1 JP WO2021106580 A1 JPWO2021106580 A1 JP WO2021106580A1 JP 2021561284 A JP2021561284 A JP 2021561284A JP 2021561284 A JP2021561284 A JP 2021561284A JP WO2021106580 A1 JPWO2021106580 A1 JP WO2021106580A1
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
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- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09K—MATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
- C09K3/00—Materials not provided for elsewhere
- C09K3/18—Materials not provided for elsewhere for application to surfaces to minimize adherence of ice, mist or water thereto; Thawing or antifreeze materials for application to surfaces
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02041—Cleaning
- H01L21/02057—Cleaning during device manufacture
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
- H01L21/304—Mechanical treatment, e.g. grinding, polishing, cutting
Landscapes
- Engineering & Computer Science (AREA)
- Chemical & Material Sciences (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Physics & Mathematics (AREA)
- Power Engineering (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Combustion & Propulsion (AREA)
- Materials Engineering (AREA)
- Organic Chemistry (AREA)
- Cleaning Or Drying Semiconductors (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2019217605 | 2019-11-29 | ||
PCT/JP2020/042146 WO2021106580A1 (ja) | 2019-11-29 | 2020-11-11 | 保護膜形成用薬液及びウェハの洗浄方法 |
Publications (1)
Publication Number | Publication Date |
---|---|
JPWO2021106580A1 true JPWO2021106580A1 (zh) | 2021-06-03 |
Family
ID=76130202
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2021561284A Pending JPWO2021106580A1 (zh) | 2019-11-29 | 2020-11-11 |
Country Status (5)
Country | Link |
---|---|
JP (1) | JPWO2021106580A1 (zh) |
KR (1) | KR20220106131A (zh) |
CN (1) | CN114762087A (zh) |
TW (1) | TW202130756A (zh) |
WO (1) | WO2021106580A1 (zh) |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5821844B2 (ja) | 1975-04-03 | 1983-05-04 | 日本電気株式会社 | マイクロハタダンフイルタ |
CN1742063A (zh) * | 2003-01-29 | 2006-03-01 | 旭硝子株式会社 | 涂料组合物、抗反射膜、光刻胶及采用该光刻胶的图形形成方法 |
KR101363441B1 (ko) * | 2010-06-07 | 2014-02-21 | 샌트랄 글래스 컴퍼니 리미티드 | 보호막 형성용 약액, 이의 조제 방법 및 이를 사용하는 세정 방법 |
JP6533576B2 (ja) | 2015-07-13 | 2019-06-19 | 富士フイルム株式会社 | パターン構造の処理方法、電子デバイスの製造方法およびパターン構造の倒壊抑制用処理液 |
JP2019080009A (ja) * | 2017-10-27 | 2019-05-23 | セントラル硝子株式会社 | ウェハの洗浄方法 |
SG11202009171XA (en) * | 2018-04-05 | 2020-10-29 | Central Glass Co Ltd | Surface treatment method of wafer and composition used for said method |
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2020
- 2020-11-11 CN CN202080082684.8A patent/CN114762087A/zh active Pending
- 2020-11-11 WO PCT/JP2020/042146 patent/WO2021106580A1/ja active Application Filing
- 2020-11-11 KR KR1020227017768A patent/KR20220106131A/ko unknown
- 2020-11-11 JP JP2021561284A patent/JPWO2021106580A1/ja active Pending
- 2020-11-27 TW TW109141854A patent/TW202130756A/zh unknown
Also Published As
Publication number | Publication date |
---|---|
CN114762087A (zh) | 2022-07-15 |
WO2021106580A1 (ja) | 2021-06-03 |
KR20220106131A (ko) | 2022-07-28 |
TW202130756A (zh) | 2021-08-16 |