JPWO2021071854A5 - - Google Patents

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JPWO2021071854A5
JPWO2021071854A5 JP2022520973A JP2022520973A JPWO2021071854A5 JP WO2021071854 A5 JPWO2021071854 A5 JP WO2021071854A5 JP 2022520973 A JP2022520973 A JP 2022520973A JP 2022520973 A JP2022520973 A JP 2022520973A JP WO2021071854 A5 JPWO2021071854 A5 JP WO2021071854A5
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trace
traces
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processor
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JP2022520973A
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Japanese (ja)
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JP2023501062A (ja
JP7470784B2 (ja
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Priority claimed from PCT/US2020/054431 external-priority patent/WO2021071854A1/en
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JP2022520973A 2019-10-06 2020-10-06 異常機器トレース検出および分類 Active JP7470784B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US201962911346P 2019-10-06 2019-10-06
US62/911,346 2019-10-06
PCT/US2020/054431 WO2021071854A1 (en) 2019-10-06 2020-10-06 Anomalous equipment trace detection and classification

Publications (3)

Publication Number Publication Date
JP2023501062A JP2023501062A (ja) 2023-01-18
JPWO2021071854A5 true JPWO2021071854A5 (enrdf_load_stackoverflow) 2023-10-16
JP7470784B2 JP7470784B2 (ja) 2024-04-18

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JP2022520973A Active JP7470784B2 (ja) 2019-10-06 2020-10-06 異常機器トレース検出および分類

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US (1) US11609812B2 (enrdf_load_stackoverflow)
JP (1) JP7470784B2 (enrdf_load_stackoverflow)
KR (1) KR102627062B1 (enrdf_load_stackoverflow)
CN (1) CN114600087A (enrdf_load_stackoverflow)
TW (1) TWI841793B (enrdf_load_stackoverflow)
WO (1) WO2021071854A1 (enrdf_load_stackoverflow)

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CN113807441B (zh) * 2021-09-17 2023-10-27 长鑫存储技术有限公司 半导体结构制备中的异常传感器监测方法及其装置
CN114519225B (zh) * 2022-01-20 2024-08-30 南水北调中线干线工程建设管理局 一种鲁棒的暗渠结构应力异常识别方法及系统
US11961030B2 (en) 2022-01-27 2024-04-16 Applied Materials, Inc. Diagnostic tool to tool matching methods for manufacturing equipment
US12298748B2 (en) 2022-01-27 2025-05-13 Applied Materials, Inc. Diagnostic tool to tool matching and full-trace drill-down analysis methods for manufacturing equipment
US12189380B2 (en) 2022-01-27 2025-01-07 Applied Materials, Inc. Diagnostic tool to tool matching and comparative drill-down analysis methods for manufacturing equipment
KR102705022B1 (ko) * 2022-11-28 2024-09-09 (주)위세아이텍 빅데이터 플랫폼의 지속학습을 이용한 유지보수 장치 및 방법
KR102723094B1 (ko) * 2023-05-11 2024-10-31 (주)빅아이 제품 검사장치
US20250061557A1 (en) * 2023-08-16 2025-02-20 Applied Materials, Inc. Method for image-based sensor trace analysis

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US7395457B2 (en) * 2005-06-10 2008-07-01 Nec Laboratories America, Inc. System and method for detecting faults in a system
JP4723466B2 (ja) 2006-12-19 2011-07-13 三菱電機株式会社 データ処理装置及びデータ処理方法及びプログラム
JP5119022B2 (ja) 2008-03-26 2013-01-16 東京瓦斯株式会社 可変的予測モデル構築方法、及び、可変的予測モデル構築システム
US9880842B2 (en) * 2013-03-15 2018-01-30 Intel Corporation Using control flow data structures to direct and track instruction execution
US9652354B2 (en) * 2014-03-18 2017-05-16 Microsoft Technology Licensing, Llc. Unsupervised anomaly detection for arbitrary time series
US10430719B2 (en) 2014-11-25 2019-10-01 Stream Mosaic, Inc. Process control techniques for semiconductor manufacturing processes
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KR101970619B1 (ko) * 2017-06-28 2019-04-22 한국과학기술연구원 비정상 상황 검출 방법 및 이를 수행하기 위한 시스템
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