JPWO2021059428A5 - - Google Patents

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JPWO2021059428A5
JPWO2021059428A5 JP2021548074A JP2021548074A JPWO2021059428A5 JP WO2021059428 A5 JPWO2021059428 A5 JP WO2021059428A5 JP 2021548074 A JP2021548074 A JP 2021548074A JP 2021548074 A JP2021548074 A JP 2021548074A JP WO2021059428 A5 JPWO2021059428 A5 JP WO2021059428A5
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Japan
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measurement result
spectrum measuring
measured
measuring device
spatial resolution
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JP2021548074A
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Japanese (ja)
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JP7276475B2 (ja
JPWO2021059428A1 (https=
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Priority claimed from PCT/JP2019/037813 external-priority patent/WO2021059428A1/ja
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JP2021548074A 2019-09-26 2019-09-26 スペクトル測定装置、およびスペクトル測定方法 Active JP7276475B2 (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2019/037813 WO2021059428A1 (ja) 2019-09-26 2019-09-26 スペクトル測定装置

Publications (3)

Publication Number Publication Date
JPWO2021059428A1 JPWO2021059428A1 (https=) 2021-04-01
JPWO2021059428A5 true JPWO2021059428A5 (https=) 2022-05-09
JP7276475B2 JP7276475B2 (ja) 2023-05-18

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JP2021548074A Active JP7276475B2 (ja) 2019-09-26 2019-09-26 スペクトル測定装置、およびスペクトル測定方法

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US (1) US20220341785A1 (https=)
JP (1) JP7276475B2 (https=)
WO (1) WO2021059428A1 (https=)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US12455189B2 (en) * 2021-12-27 2025-10-28 Electronics And Telecommunications Research Institute Spectral device with enhanced stability of optical sensor and operating method thereof

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2004021050A2 (en) 2002-08-29 2004-03-11 Kestrel Corporation Hyperspectral imaging of the human retina
US7593112B2 (en) 2006-10-02 2009-09-22 Eoir Technologies, Inc. Systems and methods for comparative interferogram spectrometry
US7619725B1 (en) * 2008-05-12 2009-11-17 Sealite Engineering, Inc. Optically amplified critical wavelength refractometer
EP2905591B1 (en) 2012-10-01 2018-01-03 National University Corporation Kagawa University Spectral characteristic measurement device
JP2015064228A (ja) 2013-09-24 2015-04-09 三菱電機株式会社 フーリエ干渉型分光器及び分光強度計測方法
JP6586683B2 (ja) 2015-11-02 2019-10-09 エバ・ジャパン 株式会社 情報処理装置、情報処理方法、及びプログラム

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