JPWO2021039486A1 - - Google Patents
Info
- Publication number
- JPWO2021039486A1 JPWO2021039486A1 JP2021542768A JP2021542768A JPWO2021039486A1 JP WO2021039486 A1 JPWO2021039486 A1 JP WO2021039486A1 JP 2021542768 A JP2021542768 A JP 2021542768A JP 2021542768 A JP2021542768 A JP 2021542768A JP WO2021039486 A1 JPWO2021039486 A1 JP WO2021039486A1
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
- G01R29/12—Measuring electrostatic fields or voltage-potential
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T11/00—2D [Two Dimensional] image generation
- G06T11/60—Editing figures and text; Combining figures or text
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
- G01R29/08—Measuring electromagnetic field characteristics
- G01R29/0807—Measuring electromagnetic field characteristics characterised by the application
- G01R29/0814—Field measurements related to measuring influence on or from apparatus, components or humans, e.g. in ESD, EMI, EMC, EMP testing, measuring radiation leakage; detecting presence of micro- or radiowave emitters; dosimetry; testing shielding; measurements related to lightning
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/001—Measuring interference from external sources to, or emission from, the device under test, e.g. EMC, EMI, EMP or ESD testing
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T11/00—2D [Two Dimensional] image generation
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Electromagnetism (AREA)
- Image Analysis (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2019159101 | 2019-08-30 | ||
PCT/JP2020/031063 WO2021039486A1 (ja) | 2019-08-30 | 2020-08-18 | 漏洩電界測定装置 |
Publications (1)
Publication Number | Publication Date |
---|---|
JPWO2021039486A1 true JPWO2021039486A1 (ja) | 2021-03-04 |
Family
ID=74684143
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2021542768A Pending JPWO2021039486A1 (ja) | 2019-08-30 | 2020-08-18 |
Country Status (3)
Country | Link |
---|---|
US (1) | US20220276295A1 (ja) |
JP (1) | JPWO2021039486A1 (ja) |
WO (1) | WO2021039486A1 (ja) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US11777557B2 (en) * | 2021-05-07 | 2023-10-03 | Viavi Solutions Inc. | Personal mobile signal egress logging and augmented reality leak locator |
Family Cites Families (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2010019795A (ja) * | 2008-07-14 | 2010-01-28 | Tamagawa Seiki Co Ltd | 画像認識型放射電磁ノイズ分布測定装置及び方法 |
JP5075147B2 (ja) * | 2009-03-04 | 2012-11-14 | 三菱電機プラントエンジニアリング株式会社 | 警報表示方法 |
TWI447403B (zh) * | 2010-12-14 | 2014-08-01 | Ind Tech Res Inst | 即時視覺化輻射場形之顯示器及其顯示方法 |
JPWO2014002466A1 (ja) * | 2012-06-25 | 2016-05-30 | 国立大学法人金沢大学 | 電磁界測定表示装置、電磁界測定表示方法、プログラム、及び記録媒体 |
US9291695B2 (en) * | 2012-08-06 | 2016-03-22 | Fluke Corporation | Real-time RF signal visualization device |
WO2014024468A1 (ja) * | 2012-08-09 | 2014-02-13 | パナソニック株式会社 | ノイズ源可視化システム、ノイズ源可視化装置、ノイズ源可視化のためのプログラム、およびノイズ源可視化方法 |
JP5993754B2 (ja) * | 2013-02-05 | 2016-09-14 | 株式会社日立製作所 | 電磁波計測装置及び電磁波計測方法 |
JP2016057117A (ja) * | 2014-09-08 | 2016-04-21 | 株式会社東芝 | 電波発射源検知装置 |
US11029352B2 (en) * | 2016-05-18 | 2021-06-08 | Skydio, Inc. | Unmanned aerial vehicle electromagnetic avoidance and utilization system |
JP2018105804A (ja) * | 2016-12-28 | 2018-07-05 | 首都高Etcメンテナンス株式会社 | 計測情報取得方法および電界強度測定用作業車 |
-
2020
- 2020-08-18 US US17/637,316 patent/US20220276295A1/en not_active Abandoned
- 2020-08-18 WO PCT/JP2020/031063 patent/WO2021039486A1/ja active Application Filing
- 2020-08-18 JP JP2021542768A patent/JPWO2021039486A1/ja active Pending
Also Published As
Publication number | Publication date |
---|---|
US20220276295A1 (en) | 2022-09-01 |
WO2021039486A1 (ja) | 2021-03-04 |
Similar Documents
Legal Events
Date | Code | Title | Description |
---|---|---|---|
RD01 | Notification of change of attorney |
Free format text: JAPANESE INTERMEDIATE CODE: A7421 Effective date: 20221024 |