JPWO2021019659A1 - - Google Patents
Info
- Publication number
- JPWO2021019659A1 JPWO2021019659A1 JP2021536496A JP2021536496A JPWO2021019659A1 JP WO2021019659 A1 JPWO2021019659 A1 JP WO2021019659A1 JP 2021536496 A JP2021536496 A JP 2021536496A JP 2021536496 A JP2021536496 A JP 2021536496A JP WO2021019659 A1 JPWO2021019659 A1 JP WO2021019659A1
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/10—Ion sources; Ion guns
- H01J49/16—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission
- H01J49/161—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission using photoionisation, e.g. by laser
- H01J49/164—Laser desorption/ionisation, e.g. matrix-assisted laser desorption/ionisation [MALDI]
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B26/00—Optical devices or arrangements for the control of light using movable or deformable optical elements
- G02B26/02—Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the intensity of light
Landscapes
- Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Engineering & Computer Science (AREA)
- Plasma & Fusion (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- General Physics & Mathematics (AREA)
- Electron Tubes For Measurement (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| PCT/JP2019/029713 WO2021019659A1 (ja) | 2019-07-29 | 2019-07-29 | イオン化装置 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JPWO2021019659A1 true JPWO2021019659A1 (ja) | 2021-02-04 |
| JPWO2021019659A5 JPWO2021019659A5 (ja) | 2022-03-09 |
| JP7147990B2 JP7147990B2 (ja) | 2022-10-05 |
Family
ID=74229056
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2021536496A Active JP7147990B2 (ja) | 2019-07-29 | 2019-07-29 | イオン化装置 |
Country Status (3)
| Country | Link |
|---|---|
| US (1) | US11885956B2 (ja) |
| JP (1) | JP7147990B2 (ja) |
| WO (1) | WO2021019659A1 (ja) |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH10153579A (ja) * | 1996-11-21 | 1998-06-09 | Hitachi Ltd | 試料分析方法および装置 |
| JP2007257851A (ja) * | 2006-03-20 | 2007-10-04 | Shimadzu Corp | 質量分析装置 |
| JP2008525956A (ja) * | 2004-12-23 | 2008-07-17 | マイクロマス ユーケー リミテッド | 質量分析計 |
| KR20170120924A (ko) * | 2016-04-22 | 2017-11-01 | 주식회사 아스타 | 레이저의 빔 크기 및 강도 조절이 가능한 질량 분석 장치 및 질량 분석용 시료에 레이저를 조사하는 방법 |
Family Cites Families (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5461235A (en) * | 1991-06-21 | 1995-10-24 | Cottrell; John S. | Mass spectrometry apparatus and method relating thereto |
| JPH10199475A (ja) * | 1997-01-14 | 1998-07-31 | Hitachi Ltd | 質量分析方法及びその装置並びに半導体装置の製造方法 |
| JP2001041931A (ja) * | 1999-07-28 | 2001-02-16 | Hitachi Ltd | レーザ質量分析計 |
| US20030057106A1 (en) * | 2001-09-12 | 2003-03-27 | Zhouxin Shen | High throughput chemical analysis by improved desorption/ionization on silicon mass spectrometry |
| JP3217378U (ja) * | 2018-05-24 | 2018-08-02 | 株式会社島津製作所 | Ｍａｌｄｉイオン源及び質量分析装置 |
| JP7215591B2 (ja) * | 2019-10-16 | 2023-01-31 | 株式会社島津製作所 | イメージング質量分析装置 |
-
2019
- 2019-07-29 US US17/625,542 patent/US11885956B2/en active Active
- 2019-07-29 WO PCT/JP2019/029713 patent/WO2021019659A1/ja active Application Filing
- 2019-07-29 JP JP2021536496A patent/JP7147990B2/ja active Active
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH10153579A (ja) * | 1996-11-21 | 1998-06-09 | Hitachi Ltd | 試料分析方法および装置 |
| JP2008525956A (ja) * | 2004-12-23 | 2008-07-17 | マイクロマス ユーケー リミテッド | 質量分析計 |
| JP2007257851A (ja) * | 2006-03-20 | 2007-10-04 | Shimadzu Corp | 質量分析装置 |
| KR20170120924A (ko) * | 2016-04-22 | 2017-11-01 | 주식회사 아스타 | 레이저의 빔 크기 및 강도 조절이 가능한 질량 분석 장치 및 질량 분석용 시료에 레이저를 조사하는 방법 |
Also Published As
| Publication number | Publication date |
|---|---|
| WO2021019659A1 (ja) | 2021-02-04 |
| US20220277947A1 (en) | 2022-09-01 |
| JP7147990B2 (ja) | 2022-10-05 |
| US11885956B2 (en) | 2024-01-30 |
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