JPWO2021014672A1 - - Google Patents

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Publication number
JPWO2021014672A1
JPWO2021014672A1 JP2021534528A JP2021534528A JPWO2021014672A1 JP WO2021014672 A1 JPWO2021014672 A1 JP WO2021014672A1 JP 2021534528 A JP2021534528 A JP 2021534528A JP 2021534528 A JP2021534528 A JP 2021534528A JP WO2021014672 A1 JPWO2021014672 A1 JP WO2021014672A1
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2021534528A
Other versions
JP7274580B2 (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of JPWO2021014672A1 publication Critical patent/JPWO2021014672A1/ja
Application granted granted Critical
Publication of JP7274580B2 publication Critical patent/JP7274580B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00584—Control arrangements for automatic analysers
    • G01N35/0092—Scheduling
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00584—Control arrangements for automatic analysers
    • G01N35/0092—Scheduling
    • G01N35/0095—Scheduling introducing urgent samples with priority, e.g. Short Turn Around Time Samples [STATS]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N2035/00465—Separating and mixing arrangements
    • G01N2035/00495—Centrifuges
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00584—Control arrangements for automatic analysers
    • G01N35/00722—Communications; Identification
    • G01N35/00871—Communications between instruments or with remote terminals
    • G01N2035/00881—Communications between instruments or with remote terminals network configurations
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00584—Control arrangements for automatic analysers
    • G01N35/00722—Communications; Identification
    • G01N2035/00891—Displaying information to the operator
    • G01N2035/0091—GUI [graphical user interfaces]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00584—Control arrangements for automatic analysers
    • G01N35/0092—Scheduling
    • G01N2035/0096—Scheduling post analysis management of samples, e.g. marking, removing, storing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/02—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations
    • G01N35/04—Details of the conveyor system
    • G01N2035/046—General conveyor features
    • G01N2035/0462—Buffers [FIFO] or stacks [LIFO] for holding carriers between operations
JP2021534528A 2019-07-22 2020-03-11 検体検査自動化システム、及び検体検査方法 Active JP7274580B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2019134331 2019-07-22
JP2019134331 2019-07-22
PCT/JP2020/010492 WO2021014672A1 (ja) 2019-07-22 2020-03-11 検体検査自動化システム、及び検体検査方法

Publications (2)

Publication Number Publication Date
JPWO2021014672A1 true JPWO2021014672A1 (ja) 2021-01-28
JP7274580B2 JP7274580B2 (ja) 2023-05-16

Family

ID=74194068

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2021534528A Active JP7274580B2 (ja) 2019-07-22 2020-03-11 検体検査自動化システム、及び検体検査方法

Country Status (5)

Country Link
US (1) US20220244280A1 (ja)
EP (1) EP4006556A4 (ja)
JP (1) JP7274580B2 (ja)
CN (1) CN114144680A (ja)
WO (1) WO2021014672A1 (ja)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20220159029A1 (en) * 2020-11-13 2022-05-19 Cyberark Software Ltd. Detection of security risks based on secretless connection data

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH1090276A (ja) * 1996-09-12 1998-04-10 Hitachi Ltd 検体検査自動化システム
JPH1164342A (ja) * 1997-08-26 1999-03-05 Hitachi Ltd 検体処理システム
JP2009201368A (ja) * 2008-02-26 2009-09-10 Nikon Corp インキュベータ、スケジュール管理方法およびプログラム

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002014109A (ja) * 2000-06-29 2002-01-18 Teruaki Ito 検体検査前処理装置
JP5286134B2 (ja) * 2009-03-31 2013-09-11 株式会社日立ハイテクノロジーズ 検体検査システムとその装置管理サーバの運用方法
JP5432816B2 (ja) * 2010-05-14 2014-03-05 株式会社日立ハイテクノロジーズ 自動分析システムおよび装置管理サーバ
JP6535486B2 (ja) * 2015-03-18 2019-06-26 シスメックス株式会社 検体測定システム及びトレイ特定情報の検索方法
JP6602383B2 (ja) * 2015-08-25 2019-11-13 株式会社日立ハイテクノロジーズ 自動分析装置および検体検査自動化システム
US20190041412A1 (en) * 2016-02-26 2019-02-07 Hitachi High-Technologies Corporation Specimen-container loading/storing unit
US11209450B2 (en) * 2016-03-29 2021-12-28 Hitachi High-Tech Corporation Specimen inspection automation system
US11360110B2 (en) * 2016-09-23 2022-06-14 Hitachi High-Tech Corporation Sample test automation system
JP6165958B2 (ja) * 2016-12-26 2017-07-19 株式会社日立ハイテクノロジーズ 検体処理システム

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH1090276A (ja) * 1996-09-12 1998-04-10 Hitachi Ltd 検体検査自動化システム
JPH1164342A (ja) * 1997-08-26 1999-03-05 Hitachi Ltd 検体処理システム
JP2009201368A (ja) * 2008-02-26 2009-09-10 Nikon Corp インキュベータ、スケジュール管理方法およびプログラム

Also Published As

Publication number Publication date
EP4006556A1 (en) 2022-06-01
EP4006556A4 (en) 2023-08-16
US20220244280A1 (en) 2022-08-04
JP7274580B2 (ja) 2023-05-16
WO2021014672A1 (ja) 2021-01-28
CN114144680A (zh) 2022-03-04

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