JPWO2021009892A5 - - Google Patents

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Publication number
JPWO2021009892A5
JPWO2021009892A5 JP2021532634A JP2021532634A JPWO2021009892A5 JP WO2021009892 A5 JPWO2021009892 A5 JP WO2021009892A5 JP 2021532634 A JP2021532634 A JP 2021532634A JP 2021532634 A JP2021532634 A JP 2021532634A JP WO2021009892 A5 JPWO2021009892 A5 JP WO2021009892A5
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JP
Japan
Prior art keywords
heat
sample
temperature control
support member
control unit
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JP2021532634A
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English (en)
Japanese (ja)
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JPWO2021009892A1 (https=
JP7161622B2 (ja
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Priority claimed from PCT/JP2019/028208 external-priority patent/WO2021009892A1/ja
Publication of JPWO2021009892A1 publication Critical patent/JPWO2021009892A1/ja
Publication of JPWO2021009892A5 publication Critical patent/JPWO2021009892A5/ja
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Publication of JP7161622B2 publication Critical patent/JP7161622B2/ja
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JP2021532634A 2019-07-18 2019-07-18 撮像機構並びに撮像機構を備えた試料分析装置 Active JP7161622B2 (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2019/028208 WO2021009892A1 (ja) 2019-07-18 2019-07-18 撮像機構並びに撮像機構を備えた試料分析装置

Publications (3)

Publication Number Publication Date
JPWO2021009892A1 JPWO2021009892A1 (https=) 2021-01-21
JPWO2021009892A5 true JPWO2021009892A5 (https=) 2022-03-01
JP7161622B2 JP7161622B2 (ja) 2022-10-26

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JP2021532634A Active JP7161622B2 (ja) 2019-07-18 2019-07-18 撮像機構並びに撮像機構を備えた試料分析装置

Country Status (5)

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US (1) US12174360B2 (https=)
EP (1) EP4001990A4 (https=)
JP (1) JP7161622B2 (https=)
CN (1) CN114026482B (https=)
WO (1) WO2021009892A1 (https=)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN115373878B (zh) * 2022-10-27 2023-03-28 麒麟软件有限公司 基于x框架的防截屏扩展协议实现系统
JP2024104564A (ja) * 2023-01-24 2024-08-05 キヤノン株式会社 振れ補正機構及び撮像装置
EP4613840A1 (en) 2024-03-05 2025-09-10 Max-Planck-Gesellschaft zur Förderung der Wissenschaften e.V. Microscope temperature stage

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2628215A1 (fr) * 1988-03-02 1989-09-08 Helena Lab Corp Procede et appareil automatique d'electrophorese
CN2444231Y (zh) * 2000-11-20 2001-08-22 中国科学院物理研究所 一种显微镜样品观测台
US6730883B2 (en) 2002-10-02 2004-05-04 Stratagene Flexible heating cover assembly for thermal cycling of samples of biological material
JP4547176B2 (ja) * 2004-03-29 2010-09-22 大学共同利用機関法人情報・システム研究機構 試料温度調節装置
JP2006090749A (ja) 2004-09-21 2006-04-06 Olympus Corp 温度調整装置
JP4868203B2 (ja) * 2004-10-27 2012-02-01 オリンパス株式会社 培養標本観察装置
JP5290235B2 (ja) * 2010-05-12 2013-09-18 株式会社日立ハイテクノロジーズ 核酸配列解析装置に用いられる温度制御装置
DE102011052738A1 (de) * 2011-08-16 2013-02-21 Leica Microsystems Cms Gmbh Detektorvorrichtung
EP2925450B1 (en) * 2012-12-03 2017-09-13 Leica Biosystems Melbourne Pty Ltd Thermal module for a sample processing assembly
JP6286183B2 (ja) * 2013-11-07 2018-02-28 株式会社日立ハイテクノロジーズ 分析装置
JP2017183533A (ja) * 2016-03-30 2017-10-05 株式会社Uacj 回路基板付きヒートシンク及びその製造方法
JP6508140B2 (ja) * 2016-06-30 2019-05-08 東亜ディーケーケー株式会社 光電子増倍管、測定装置、製造用治具

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