JPWO2020196317A5 - - Google Patents

Description

EXAMPLES The present invention will be described below with reference to Examples, but the present invention is not necessarily limited to these. Incidentally, Examples 13 and 14 are Reference Examples 1 and 2 at present.

Claims (19)

An authentication device having a light source, a polarizer, a film, and a photosensitivity sensor, wherein the film is disposed between the polarizer and an authentication object, and the following (1) , (2), (3) and ( 4) An authentication device characterized by satisfying 4) .
(1) The transmittance of light emitted from the light source is 70% or more and 100% or less at the wavelength of the light with the highest intensity.
(2) There exists an integer n that satisfies the following formula (I).
(I) A×n−150≦Re≦A×n+150
Here, A is the wavelength (nm) at which the light emitted from the light source exhibits the strongest intensity,
Re is the in-plane retardation (nm) when the film is measured at a wavelength of 587.8 nm at an incident angle of 0° using the parallel Nicols rotation method.
(3) The in-plane retardation of the film is 400 nm or more.
(4) The elongation at break at 25°C in both the direction of the main orientation axis and the direction perpendicular to the main orientation axis of the film is 30% or more and 300% or less. 2. The authentication device according to claim 1, wherein there is an integer m that satisfies the formula (I) and the formula (II) below.
(II) B×m−150≦Re≦B×m+150
Here, B is the wavelength (nm) showing the second strongest intensity in the light emitted from the light source,
Re is the in-plane retardation (nm) when the film is measured at a wavelength of 587.8 nm at an incident angle of 0° using the parallel Nicols rotation method. 3. The authentication device according to claim 1, wherein the film satisfies the following formulas (III) and (IV).
(III) PT(45) ≥ 0.65
(IV) 1≧PT(45)/PT(0)≧0.6
Here, PT(45) and PT(0) are obtained as follows.
(1) Cut the polarizer into two pieces so that the surfaces of the two polarizers are perpendicular to the optical axis of a spectrophotometer using a 50 W tungsten lamp as a light source, and the transmission axes of the two polarizers are aligned. are arranged parallel to each other, and the background measurement is performed with the light source turned off and the light source turned on. Let PT(D) be the amount of transmitted light measured with the light source off, and PT(L) be the amount of transmitted light measured with the light source on.
(2) The film is placed between two polarizers so that the plane of the film is perpendicular to the optical axis of the spectrophotometer.
(3) While rotating only the film in a plane perpendicular to the optical axis of the spectrophotometer, measure the amount of transmitted light at the wavelength with the highest intensity of light emitted from the light source. Let PT'(0) be the amount of transmitted light when the angle formed by the transmission axes of the two polarizers and the main orientation axis of the film is 0°, and let PT'(45) be the amount of transmitted light when the angle is 45°.
(4) PT(0) and PT(45) are obtained from the following equations.
PT(0)=(PT'(0)-PT(D))/(PT(L)-PT(D))
PT(45)=(PT'(45)-PT(D))/(PT(L)-PT(D)). 4. The authentication device according to any one of claims 1 to 3, wherein the light beam emitted from the light source has a peak width at half maximum of 5 nm or more and 70 nm or less. 5. The authentication device according to any one of claims 1 to 4, wherein there is an integer n that satisfies the following formula (V).
(V) A×n−120≦Re≦A×n+120, and 415≦A≦495. 5. The authentication device according to any one of claims 1 to 4, wherein there is an integer n that satisfies the following formula (VI).
(VI) A×n−100≦Re≦A×n+100 and 495≦A≦570. 5. The authentication device according to any one of claims 1 to 4, wherein there is an integer n that satisfies the following formula (VII).
(VII) A×n−120≦Re≦A×n+120 and 570≦A≦800. 5. The authentication device according to any one of claims 1 to 4, wherein there is an integer n that satisfies the following formula (VIII).
(VIII) A×n−150≦Re≦A×n+150 and 800≦A≦1600. The authentication device according to any one of claims 1 to 8, wherein the film has an in-plane retardation of 3000 nm or less. 10. The authentication device according to any one of claims 1 to 9, wherein the film is a laminated film obtained by alternately laminating five or more layers made of resin A and layers made of resin C different from resin A. The resin C constituting the film contains at least one of cyclohexanedimethanol, spiroglycol, neopentylglycol, isophthalic acid, cyclohexanedicarboxylic acid, and isosorbide, and is mainly composed of polyester. Item 11. The authentication device according to Item 10. The ratio of the maximum value to the minimum value (maximum value/minimum value) of the thermal shrinkage rate when the film is treated at 100 ° C. for 30 minutes in the direction of the main orientation axis and in the direction perpendicular to the main orientation axis is 1.7 or more. Authentication device according to any one of claims 1 to 11 . 13. An authentication device according to any one of claims 1 to 12 , wherein the angle between the principal orientation axis of the film and the transmission axis of the polarizer is less than 10[deg.]. Both ends (A, B) of the film exhibiting the maximum length in the film plane, and both ends (C, D) of a straight line perpendicular to a straight line AB connecting points A and B and passing through the midpoint of the straight line AB. 14. The authentication device according to any one of claims 1 to 13 , wherein the difference between the maximum value and the minimum value is 200 nm or less in the in-plane retardation at a total of four points of . 15. The authentication device according to any one of claims 1 to 14 , wherein the area of the area that can be authenticated is 10 cm ^<2> or more. 16. The light source according to any one of claims 1 to 15 , wherein the light source includes either an organic EL (organic electroluminescence element) or a light emitting diode (LED), and the film has a light transmittance of 5% or less at a wavelength of 380 nm. authentication device. 17. The authentication device according to any one of claims 1 to 16 , wherein the light sensitive sensor is a CMOS (Complementary metal-oxide-semiconductor) sensor. A film used in an authentication device having a light source, a polarizer, a film, and a photosensitivity sensor, which satisfies the following (1) , (2), (3) and (4) .
(1) The film has a transmittance of light emitted from the light source of 70% or more and 100% or less at the wavelength with the highest intensity of the light.
(2) There exists an integer n that satisfies the following formula (I).
(I) A×n−150≦Re≦A×n+150
Here, A is the wavelength (nm) at which the light emitted from the light source exhibits the strongest intensity,
Re is the in-plane retardation (nm) when the film is measured at a wavelength of 587.8 nm at an incident angle of 0° using the parallel Nicols rotation method.
(3) The in-plane retardation of the film is 400 nm or more.
(4) The elongation at break at 25°C in both the direction of the main orientation axis and the direction perpendicular to the main orientation axis of the film is 30% or more and 300% or less. 19. The film according to claim 18 , wherein said film satisfies formulas (III) and (IV) below.
(III) PT(45) ≥ 0.65
(IV) 1≧PT(45)/PT(0)≧0.6
Here, PT(45) and PT(0) are obtained as follows.
(1) Cut the polarizer into two pieces so that the surfaces of the two polarizers are perpendicular to the optical axis of a spectrophotometer using a 50 W tungsten lamp as a light source, and the transmission axes of the two polarizers are aligned. background measurement. Let PT(D) be the amount of transmitted light measured with the light source off, and PT(L) be the amount of transmitted light measured with the light source on.
(2) The film is placed between two polarizers so that the plane of the film is perpendicular to the optical axis of the spectrophotometer.
(3) While rotating only the film in a plane perpendicular to the optical axis of the spectrophotometer, measure the amount of transmitted light at the wavelength at which the light emitted from the light source exhibits the highest intensity. Let PT'(0) be the amount of transmitted light when the angle formed by the transmission axes of the two polarizers and the main orientation axis of the film is 0°, and let PT'(45) be the amount of transmitted light when the angle is 45°.
(4) PT(0) and PT(45) are obtained from the following equations.
PT(0)=(PT'(0)-PT(D))/(PT(L)-PT(D))
PT(45)=(PT'(45)-PT(D))/(PT(L)-PT(D)).