JPWO2020175576A1 - - Google Patents

Info

Publication number
JPWO2020175576A1
JPWO2020175576A1 JP2021502334A JP2021502334A JPWO2020175576A1 JP WO2020175576 A1 JPWO2020175576 A1 JP WO2020175576A1 JP 2021502334 A JP2021502334 A JP 2021502334A JP 2021502334 A JP2021502334 A JP 2021502334A JP WO2020175576 A1 JPWO2020175576 A1 JP WO2020175576A1
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2021502334A
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of JPWO2020175576A1 publication Critical patent/JPWO2020175576A1/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8803—Visual inspection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/9501—Semiconductor wafers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features
    • G01N2021/8829—Shadow projection or structured background, e.g. for deflectometry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/06—Illumination; Optics
    • G01N2201/062—LED's
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/06—Illumination; Optics
    • G01N2201/068—Optics, miscellaneous
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L25/00—Assemblies consisting of a plurality of semiconductor or other solid state devices
    • H01L25/03—Assemblies consisting of a plurality of semiconductor or other solid state devices all the devices being of a type provided for in a single subclass of subclasses H10B, H10D, H10F, H10H, H10K or H10N, e.g. assemblies of rectifier diodes
    • H01L25/04—Assemblies consisting of a plurality of semiconductor or other solid state devices all the devices being of a type provided for in a single subclass of subclasses H10B, H10D, H10F, H10H, H10K or H10N, e.g. assemblies of rectifier diodes the devices not having separate containers
    • H01L25/075—Assemblies consisting of a plurality of semiconductor or other solid state devices all the devices being of a type provided for in a single subclass of subclasses H10B, H10D, H10F, H10H, H10K or H10N, e.g. assemblies of rectifier diodes the devices not having separate containers the devices being of a type provided for in group H10H20/00
    • H01L25/0753—Assemblies consisting of a plurality of semiconductor or other solid state devices all the devices being of a type provided for in a single subclass of subclasses H10B, H10D, H10F, H10H, H10K or H10N, e.g. assemblies of rectifier diodes the devices not having separate containers the devices being of a type provided for in group H10H20/00 the devices being arranged next to each other
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10H—INORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
    • H10H20/00—Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
    • H10H20/80—Constructional details
    • H10H20/85—Packages
    • H10H20/851—Wavelength conversion means
    • H10H20/8511—Wavelength conversion means characterised by their material, e.g. binder
    • H10H20/8512—Wavelength conversion materials
    • H10H20/8513—Wavelength conversion materials having two or more wavelength conversion materials
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10H—INORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
    • H10H20/00—Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
    • H10H20/80—Constructional details
    • H10H20/85—Packages
    • H10H20/855—Optical field-shaping means, e.g. lenses

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Circuit Arrangement For Electric Light Sources In General (AREA)
  • Non-Portable Lighting Devices Or Systems Thereof (AREA)
JP2021502334A 2019-02-27 2020-02-26 Pending JPWO2020175576A1 (enExample)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2019034774 2019-02-27
PCT/JP2020/007854 WO2020175576A1 (ja) 2019-02-27 2020-02-26 照明システム、照明装置及び照明制御方法

Publications (1)

Publication Number Publication Date
JPWO2020175576A1 true JPWO2020175576A1 (enExample) 2020-09-03

Family

ID=72240082

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2021502334A Pending JPWO2020175576A1 (enExample) 2019-02-27 2020-02-26

Country Status (5)

Country Link
US (1) US20220136978A1 (enExample)
EP (1) EP3933385A4 (enExample)
JP (1) JPWO2020175576A1 (enExample)
CN (1) CN113474639A (enExample)
WO (1) WO2020175576A1 (enExample)

Citations (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH08184567A (ja) * 1994-10-05 1996-07-16 Musco Corp 鏡面反射性又は半鏡面反射性表面を点検するための装置及び方法
JP2002236100A (ja) * 2001-02-09 2002-08-23 Hitachi Ltd 非破壊検査方法およびその装置
JP2004014924A (ja) * 2002-06-10 2004-01-15 Olympus Corp 光モニタ
JP2010249993A (ja) * 2009-04-14 2010-11-04 Sumitomo Bakelite Co Ltd 導光板の製造方法および導光板
JP2012014853A (ja) * 2010-06-29 2012-01-19 Nakakyu:Kk Ｌｅｄ照明装置
JP2012512401A (ja) * 2008-12-17 2012-05-31 フォッケ・ウント・コンパニー（ゲゼルシャフト・ミト・べシュレンクテル・ハフツング・ウント・コンパニー・コマンデイトゲゼルシャフト） たばこの製造及び／又は包装の最に検査すべき対象の検査を行う方法および装置
JP2013101003A (ja) * 2011-11-07 2013-05-23 Adc Technology Inc 物体検知装置
JP2014066657A (ja) * 2012-09-27 2014-04-17 Nissan Motor Co Ltd 自動車車体の表面検査装置および表面検査方法
JP2016142525A (ja) * 2015-01-29 2016-08-08 京セラ株式会社 塗装面検査用光源および塗装面検査用照明装置
JP6209650B1 (ja) * 2016-06-13 2017-10-04 Ｎｔｔエレクトロニクス株式会社 光モジュール
US20180195972A1 (en) * 2015-07-02 2018-07-12 Eisenmann Se Installation for the optical inspection of surface regions of objects

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005091049A (ja) * 2003-09-12 2005-04-07 Ccs Inc 画像処理用光照射装置及び画像処理用光照射方法
JP5323320B2 (ja) * 2006-07-19 2013-10-23 有限会社シマテック 表面検査装置
RU2009127780A (ru) * 2006-12-20 2011-01-27 Конинклейке Филипс Электроникс Н.В. (Nl) Осветительное устройство
JP4719284B2 (ja) * 2008-10-10 2011-07-06 トヨタ自動車株式会社 表面検査装置
JP6271544B2 (ja) * 2012-07-27 2018-01-31 フィリップス ライティング ホールディング ビー ヴィ 反射スペクトルを用いた物体の色強調及び保存
US9838612B2 (en) * 2015-07-13 2017-12-05 Test Research, Inc. Inspecting device and method for inspecting inspection target
JP2017198612A (ja) * 2016-04-28 2017-11-02 キヤノン株式会社 検査装置、検査システム、および物品製造方法
JP2019203691A (ja) * 2016-11-11 2019-11-28 オムロン株式会社 照明装置
JP6864549B2 (ja) * 2017-05-09 2021-04-28 株式会社キーエンス 画像検査装置
JP6857079B2 (ja) * 2017-05-09 2021-04-14 株式会社キーエンス 画像検査装置
WO2019004119A1 (ja) * 2017-06-28 2019-01-03 京セラ株式会社 発光装置および照明装置
JP6969439B2 (ja) * 2018-02-23 2021-11-24 オムロン株式会社 外観検査装置、及び外観検査装置の照明条件設定方法
US11680909B2 (en) * 2020-05-14 2023-06-20 The Boeing Company Automated inspection of foreign materials, cracks and other surface anomalies

Patent Citations (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH08184567A (ja) * 1994-10-05 1996-07-16 Musco Corp 鏡面反射性又は半鏡面反射性表面を点検するための装置及び方法
JP2002236100A (ja) * 2001-02-09 2002-08-23 Hitachi Ltd 非破壊検査方法およびその装置
JP2004014924A (ja) * 2002-06-10 2004-01-15 Olympus Corp 光モニタ
JP2012512401A (ja) * 2008-12-17 2012-05-31 フォッケ・ウント・コンパニー（ゲゼルシャフト・ミト・べシュレンクテル・ハフツング・ウント・コンパニー・コマンデイトゲゼルシャフト） たばこの製造及び／又は包装の最に検査すべき対象の検査を行う方法および装置
JP2010249993A (ja) * 2009-04-14 2010-11-04 Sumitomo Bakelite Co Ltd 導光板の製造方法および導光板
JP2012014853A (ja) * 2010-06-29 2012-01-19 Nakakyu:Kk Ｌｅｄ照明装置
JP2013101003A (ja) * 2011-11-07 2013-05-23 Adc Technology Inc 物体検知装置
JP2014066657A (ja) * 2012-09-27 2014-04-17 Nissan Motor Co Ltd 自動車車体の表面検査装置および表面検査方法
JP2016142525A (ja) * 2015-01-29 2016-08-08 京セラ株式会社 塗装面検査用光源および塗装面検査用照明装置
US20180195972A1 (en) * 2015-07-02 2018-07-12 Eisenmann Se Installation for the optical inspection of surface regions of objects
JP6209650B1 (ja) * 2016-06-13 2017-10-04 Ｎｔｔエレクトロニクス株式会社 光モジュール

Also Published As

Publication number Publication date
EP3933385A1 (en) 2022-01-05
US20220136978A1 (en) 2022-05-05
EP3933385A4 (en) 2023-02-08
CN113474639A (zh) 2021-10-01
WO2020175576A1 (ja) 2020-09-03

Similar Documents

Publication Publication Date Title
BR112019017762A2 (enExample)
BR112021017339A2 (enExample)
BR112021018450A2 (enExample)
BR112021017637A2 (enExample)
BR112021017892A2 (enExample)
BR112021017782A2 (enExample)
BR112021017939A2 (enExample)
BR112019016141A2 (enExample)
BR112021017738A2 (enExample)
BR112021016996A2 (enExample)
BR112021008711A2 (enExample)
BR112021016821A2 (enExample)
BR112021018452A2 (enExample)
BR112021017703A2 (enExample)
BR112021017728A2 (enExample)
BR112021013944A2 (enExample)
BR112019016138A2 (enExample)
BR112019016142A2 (enExample)
BR112021018250A2 (enExample)
BR112021017234A2 (enExample)
BR112021018168A2 (enExample)
BR112021017083A2 (enExample)
BR112021017732A2 (enExample)
BR112021015080A2 (enExample)
BR112021012348A2 (enExample)

Legal Events

Date Code Title Description
A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20210823

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20220531

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20220728

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20220809

A601 Written request for extension of time

Free format text: JAPANESE INTERMEDIATE CODE: A601

Effective date: 20221004

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20221206

A02 Decision of refusal

Free format text: JAPANESE INTERMEDIATE CODE: A02

Effective date: 20221227